Failure
See Also: Destructive
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Failure and Technology Analysis
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Failure analyses in order to clarify the failure cause soonest possible.From single device to the whole system - and from highly complex IC up to printed circuit board (PCB), mounting & interconnection technology and printed board assembly (PBA).
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Product
Fatigue Failure Tester
EKT-2002FF
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EKT-2002FF Flexing Fatigue Tester is designed in accordance with ASTM D4482 to test the fatigue life under a tensile strain cycle on different kinds of vulcanized rubber compound to determine the fatigue life at various extension ratios.
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Failure Analysis Services
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BMP Testing and Calibration Services Inc.
Failure analysis plays a crucial role in product development that enables industries to prevent future product failures and improve them for the end-user. It’s a multi-faceted approach to finding how and why a product failed and involves an in-depth investigation of the circumstances surrounding the failure and discovery of relevant background information, including but not limited to the type of application, environmental factors, service life, and pertinent design information.
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Electronics Failure Analysis System
Sentris
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Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Failure Analysis
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Failure analysis on electronic components is a continuous challenging task. The smaller transistor dimensions, increasing functional complexity and changing device packaging styles requires new tools and skills for sample preparation, fault localization techniques, high resolution imaging and analysis.
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Failure Analysis
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A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Failure Analysis And Magnetic Imaging Services
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Micro Magnetics offers failure analysis services on a contractual basis. We maintain two current density metrology systems at our headquarters in Fall River and can produce maps of current flow in a wide variety of ICs and packages, usually with initial results delivered within 48 hours. Our engineers will work closely with you to understand and interpret the results in order to determine the root cause of the failure.
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Destructive Physical Analysis & Failure Analysis
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DPACI's component analysis laboratory performs major analytical functions, such as destructive physical analysis, failure analysis, counterfeit analysis, and material analysis on components & devices. Our destructive physical analysis techniques are performed in accordance with standards and methods used in most military and space program requirements. Solutions for difficult production problems are resolved through our failure analysis procedures.
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Equipment Failure Diagnosis System and Safety Management System
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A system for diagnosing failures of rotating machinery such as turbines, motors, pumps, fans, and compressors, which are major facilities in nuclear power, hydropower, thermal power plants, petrochemical plants, shipbuilding, and aviation, through displacement sensors.
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Failure Analysis
MicroINSPECT 300FA
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The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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Optical Fiber Cable Testing Equipment
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Optical fiber consists of a core and a cladding layer, selected for total internal reflection due to the difference in the refractive index between the two. In practical fibers, the cladding is usually coated with a layer of acrylate polymer or polyimide. This coating protects the fiber from damage but does not contribute to its optical waveguide properties. Individual coated fibers then have a tough resin buffer layer and/or core tube(s) extruded around them to form the cable core. Several layers of protective sheathing, depending on the application, are added to form the cable. Rigid fiber assemblies sometimes put light-absorbing ("dark") glass between the fibers, to prevent light that leaks out of one fiber from entering another. This reduces cross-talk between the fibers, or reduces flare in fiber bundle imaging applications Optical fibers are very strong, but the strength is drastically reduced by unavoidable microscopic surface flaws inherent in the manufacturing process. The initial fiber strength, as well as its change with time, must be considered relative to the stress imposed on the fiber during handling, cabling, and installation for a given set of environmental conditions. There are three basic scenarios that can lead to strength degradation and failure by inducing flaw growth: dynamic fatigue, static fatigues, and zero-stress aging.
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Leak Tester
AD-1690
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Are you sure your pipettes are all accurate? Most pipette failures happen due to soiled or damaged parts compromising the airtightness of the pipettes. With the AD-1690 leak tester, you can instantly spot the pipettes that need to be fixed.
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Robust Din-rail Fanless Embedded System With RISC-based (iMX-287) Processor 4 COM, 2 CAN Bus And DIO
rBOX610
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The rBOX610 din-rail fanless embedded system utilizes the low power RISC-based module (iMX-287) processor and is designed to withstand temperatures ranging from -40°C to +70°C for using in extreme operating environment and industrial automation applications. The rBOX610 box PC features 4 RS-232/422/485 serial ports, dual LANs, 4 digital input channels,4 digital output channels, 2 CAN bus and 1 eMMC onboard 4 GB & 1 x SDHC socket for storage expansion (easy to access) in a compact, IP40 protected, industrial-strength robust case. Two power paths input minimize the risk of data loss in the event of a single power failure. Its vertical din-rail form factor makes it easy to install the system in a small cabinet. Due to the RISC-based architecture, rBOX610 will not generate a lot of heat while being operated. The ready-to-run rBOX610 is specially designed for remote control/monitoring management applications like unmanned control room, industrial machine, automatic parking lot, traffic cabinet and more.
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Pinhole & Porosity
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Premature corrosion of a substrate is usually due to a coating failure. A major cause is the presence of flaws in the finished coating. Collectively referred to as porosity, the main types of flaws are:
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Structural Testing
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Structural testing is used to verify the static strength, or fatigue strength, of a component by applying measured loads. Testing can be done to failure, to contractual requirements, or to validate finite element model predictions.
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Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Mechanical Tester
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NANOVEA Mechanical Tester is the most versatile nanoindenter and scratch tester capable of precisely measuring the micro- to nanomechanical properties of wide ranges of materials from thin films, coatings, ceramics and composites to polymers and bio materials via Indentation, Scratch and Friction testing. All NANOVEA Mechanical Tester models come with true feedback load control from independent load and depth sensors that provide unmatched accuracy and the highest repeatability available on the market. This technology allows a user to perform Nanoindentation and Microindentation for Hardness and Elastic Modulus Testing, Stress vs Strain Analysis, Creep and Relaxation, Loss and Storage Modulus, Yield Strength and Fatigue, Fracture Toughness and Nano-scratch & Micro-scratch for Scratch Hardness Testing, Multi-pass Wear Test, Cohesive and Adhesive Failure Testing as well as Coefficient of Friction testing, all available on one system.
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Cable Test Box
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Cables are a critical part of any sensor measurement system and damaged cables cause frequent delays during test setup. PCB has developed a relatively simple device to test cables on a channel by channel basis for BNC, 10-32, and 5-44 coaxial connectors. Simply connect both ends of the cable and faults will be indicated for shield failure, conductor failure, or short circuit shield to conductor. Power is provided by a single, replaceable 9 volt battery.
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In-Circuit Tester
Omega MTS888
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With the continuous and fast pace of development in the electronic manufacturing the time from design to production is a critical factor for success or failure of a product. The time from design to test is a major part of this process. The high performance tester from Digitaltest, the MTS888 Omega, has been designed to speed up this process.
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NF-Series Standard Plus Models
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The E-DRIV® NF-Series standard plus models feature a selectable Double Hit Mode for soft joint applications and a selectable Soft Start mode. Engineered for high volume manufacturing applications the brushless motor design ensures durability and reduces the standard maintenance costs associated with brush type electric screwdrivers. The NF power tool is ESD certified, ensuring less than 1 Ohm at the bit tip. ESD management assures product quality, cost savings and a reduction in overall ESD failures.
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Cable Diagnostic Tools
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For non-destructive diagnostic testing to determine the quality of a cable’s insulation with minimal risk of failure, HVI recommends tan delta and partial discharge testing for valuable diagnostic data about cable insulation integrity. Both use a VLF source to perform elevated voltage, off-line testing. Tan delta testing measures insulation health, while PD identifies specific problem areas and assesses their severity.
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Assisted Maintenance Repair
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Designed to optimise the diagnostic and maintenance phases for complex systems, ARMS is a generic solution that aims to help operators in the diagnostic phases of complex system failures, then guide them in maintenance operations to restore the system to an operational condition.
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Nanoindenters
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Nanomechanical testers from KLA Instruments™ provide precise, reliable and repeatable measurements of hardness, Young’s modulus, and other mechanical properties to help you explore new materials, reduce product failures and accelerate your time-to-market. We offer nanoindentation tools that range from easy-to-use to a high performance nanoindenter to the industry’s highest performance and most versatile nano tensile tester.
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High Impedance Probes
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Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.
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Communication Data Logger
LE-270AR
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LE-270AR is an Analyzer and Communication Data Logger of CAN/LIN. It has logger mode with which you can records CAN/LIN communication logs in the SD/SDHC card for long hours and remote mode with which you can monitor data at real time by connecting the analyzer with PC. It also has simulation mode with which you can repeatedly transmit CAN/LIN data which is registered in advance and selected on the PC. You can measure 2 channels of CAN/LIN communication lines and can simultaneously register voltage data of 4 external signals.Its power failure protection, waterproof, and low power consumption widens the usage of analyzer such as in the automation factories and other production factories.
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Data Analytics Platform
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CISC provides software modules to collect and analyze data from IoT devices. They can easily be integrated into any existing infrastructure. User-friendly reports and visualizations of the data provide comprehensive insight into what is happening in your business. Furthermore, our platform is able to diagnose and even predict failures as well as discover usage patterns or analyze performance.
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Insulation Testing
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Weshine Electric Manufacturing Co., Ltd
Insulation is one of the most important constituents of a transformer. Any weakness in the insulation may cause failure of transformer. To ensure the effectiveness of the insulation system of a transformer, it must confirms the dielectric test. But the power frequency withstand test alone can not be adequate to demonstrate the dielectric strength of a transformer.
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Sensing Resistors
Resistive Voltage Dividers
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NGR Sensing Resistors are attached in parallel to the neutral grounding resistor. The sensing resistor allows a protective relay to detect a resistor failure in a continuous manner. Sensing Resistors are used in combination with neutral grounding resistor monitor relays. The relay measures neutral grounding resistance, neutral grounding resistor current and neutral to ground voltage. The relay continuously measures neutral grounding resistor ohmic value in an unfaulted system and it trips on if neutral grounding resistance varies from its calibrated value.
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Remote RF Monitoring
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Critical communication systems are expected to work, without warning and without failure. But most system managers only see what’s happening when they’re on site or after users report a problem. Remote RF monitoring helps close that visibility gap by providing insight into system performance between site visits, allowing issues to be identified earlier before coverage, reliability, or service is impacted.
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High Definition LWIR Science-Grade Camera
FLIR X8580 SLS™
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The FLIR X8580 SLS is a high-speed, high definition longwave IR camera designed for scientists and engineers who need to capture detailed imagery of fast events, perform custom radiometric measurements, or detect points of failure in composites, solar cells, and electronics. This thermal imaging camera combines 1280 × 1024 resolution from the SLS detector with high-speed frame rates to offer shorter snapshot speeds and wider temperature bands for crisp stop motion imagery of high-speed events. With a four-position motorized filter wheel and support for FLIR motorized focus lenses, the X8580 SLS will provide high quality recordings, save time, and mitigate frustration in dynamic acquisition environments.
