Wafer Level Reliability
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Product
Probe Card
VC20E Series
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The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
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Product
Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
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The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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Product
Probe Card
VC43™/VC43EAF™
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VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Product
Multisite Probe Card
T300 ButtonTile™
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The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
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Product
Probe Card
T90™ Series
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The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Product
MPI Automated Probe Systems
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MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Product
Production Wafer Level Burn-in
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TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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Product
Wafer Level Test Handler
Kronos
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Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Product
Lighting Reliability
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LED/OLED package lifetime is highly dependent on thermal management, and LED lamp performance can be dependent on the luminaire in which it is installed. Lighting reliability test system for LED/OLED Products are widely used for normal /accelerated aging, lumen maintenance measuring, lifetime evaluation and temperature characteristic testing for LED/OLED products including LED package, array, module, OLED module and luminaires.
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Product
Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Product
Reliability Testing
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ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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Product
MultiSite Test sockets and Wafer Level
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multi-site sockets include anything from strip test sockets to test sockets for wafer test to multi-position, singulated devices. The advantages of these sockets can be enormous as test time can be decreased by a factor of ten over conventional one up testing. In most cases, the throughput is only limited by tester capabilities and/or handling capacity.
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Product
Wafer Prober
Precio octo
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200mm wafer prober. The system adapts ultra-high speed indexing and high-speed wafer exchange functions to reduce test cost and improve overall equipment effectiveness (OEE) markedly enhancing productivity.
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Product
RELIABILITY BOARD (Reliability Test Board)
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The reliability test board is used for testing of HAST, THB, HTOL, BURN-IN, etc. It is a product that evaluates the environmental test and durability when applied to actual products such as lifetime test, high temperature, low temperature, high humidity and thermal shock
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Product
Wafer Sort
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TestEdge offers complete wafer sort solutions. Our range of wafer sort capabilities demonstrates our ability to handle a wide range of devices and device characteristics. State of the art Electroglas probers Sort experience with high probe count Less than 4 mil pitch on probes Experience with C4 Bump and Aluminum pad Experience on Bipolar, CMOS, GaAs, & SiGe Overhead sort or cable harness sort Microsite testing capability
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Product
WAFER MVM-SEM
E3300 Family
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The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Product
Wafer Chucks
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American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
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Product
System to Handle Wafer Levels
AMI AW Series
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Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Product
Level Measurement
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Omega provides contact and non-contact instruments for liquids, and non-contact instruments for solids. Choose from continious measurement or point level measurement with one of our level switches.
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Product
Level Quadrant
LIQUA
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F. W. Breithaupt & Sohn GmbH & Co.KG
*Clinometer with robust housing*Quick adjustment of circle with eccentric bush*Illumination of circle and level*Graduation 6400-*Scale interval 1-*Measuring range +1000- bis .600-*Accuracy ± 0,5-*Made in Germany
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Product
Level System
Universal II
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The Universal II level transmitter offers increased reliability, low maintenance and an intrinsically safe design for dependable level measurements in all kinds of process liquids, slurries, granulars and interfaces.Universal IIThe Universal II is a two wire level transmitter that eliminates the need for line power in the field and saves costs for additional hardware. It provides reliable level measurements in all kinds of process liquids, slurries, granulars and interfaces.When powered from an approved source this level transmitter can be made intrinsically safe. Its rugged contruction resists corrosion and abraision. The no moving parts design eliminates break downs.The Universal II level transmitter utilizes RF Admittance technology with manual calibration and a 4 – 20 mA output signal. The patented Cote-Shield circuitry ensures accuracy and reliability regardless of product build-up on the level transmitter.This level system is unaffected by changes in the process material density, pressure, or temperature variations.
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Product
Level Monitoring
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Magnetic level switches are used for the monitoring and control of liquid level in tanks. These level switches are specifically manufactured to customer specifications. The float switches are manufactured with a hermetically sealed contact which is located within the guide tube. The float sliding on the tube contains a ring magnet which activates the sealed contact in a non-contacting fashion. The sealed contacts are available as SPST (N/O or N/C) or SPDT (N/O + N/C). The float sliding up and down on the guide tube is the only moving part on the M-series magnetic float switches.
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Product
Sound Level Meters
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Precision Mastech Enterprises Co.
A portable, handheld instrument designed to measure sound pressure levels (SPL) in decibels (dB), simulating how the human ear hears.
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Product
Continuous Level Measurement
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Drexelbrook manufactures a full range of continuous level measurement instruments, providing the highest level of performance for liquids, slurries and bulk solids applications. With a wide variety of technology options, Drexelbrook is uniquely qualified to properly evaluate and recommend the very best solution for your application.
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Product
Sound Level Meters
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Is designed to respond to sound in the same way as the human ear and to give reproducible measurements of sound pressure levels.
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Product
Torpedo Digital Level
DL136
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Advance Plus Trading Co., Ltd.
Model Number: DL136 Key Specifications/Special Features: Torpedo Digital Level with level bubbles,LED technology for the brightest display, IP65 standards 1. 25.4cm 10 inch level with 2 bubbles, 254*28*58.8mm（L*W*H）;2. Resolution: 0.01° at 0° and 90°, 0.05° at the rest°;3. Horizontal level measuring range: 0 to 360°;4. Accuracy: ±0.1° at 0° and 90°: ±0.2° at the rest;5. Measures angle in degrees, IN/FT, % slope or pitch;6. Audible tone at level, plump and setting angle;7. Automatic shut-off after 3 minutes;8. Backlight LCD;9. Self checking accuracy;10. Self calibration;11. Hold-function to freeze the measurement;12. Memory recall (9 measurements);13. With magnets in the bottom;14. With scales at the front bottom alumimum side;15. Operated by DC 3V (2*LR03 AAA 1.5V batteries, not included); 16. IP65 waterproof & dusyproof industrial standard.
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Product
Water Levels Tools
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Zircon’s line of indoor and outdoor electronic leveling tools are ideal for everyone whether they are professionals or hobbyists. Learn more about our WL25 Water Level and WL25 Pro Water Level here.
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Product
Wafer Inspection System
AutoWafer Pro™
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AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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Product
Radiation Hardened Solutions and High Reliability Components
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Offering a complete portfolio of RadHard and HiRel components, CAES serves as the foundation on which many critical applications are built.
