Filter Results By:
Products
Applications
Manufacturers
-
product
Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
-
product
Count Outside Micrometer
Mechanical counter type with 1/100mm resolution Measuring range: up to 250mm
-
product
Outside Micrometer
Regular product of outside micrometers The frame is provided with a heat insulating cover.
-
product
Non Rotating Spindle Type Paper Micrometer
Micrometer dedicated to measuring paper thickness Anvil diameter: 14.3mm
-
product
Particle Sizers
For over four decades, TSI has been at the forefront of providing state-of-the-art aerosol sizing instruments. Our commitment to advancing research and driving innovation spans various industries. TSI is a trusted manufacturer of cutting-edge particle sizing instrumentation and systems, covering a wide range of particle sizes, from 1 nm to 20 micrometers.
-
product
Spline Gauging
XT Splines
Popular 2 point spline heads held in stock include:• 20–25mm over 2mm pins• 20–25mm over 2.032mm pins• 24–29mm over 2mm pins• 24–29mm over 2.032mm pins• 25–35mm over 2mm pins• 25–35mm over 2.032mm pinsEach of these application heads can be fitted directly to our Bluetooth XT range of internal micrometers in seconds for fast, efficient use with incredibly accurate results that can be digitally recorded.
-
product
Tabletop Front & Backside Mask Aligner
Model 200IR
The OAI Model 200IR Mask Aligner is a tabletop system that requires minimal clean room space. It is a cost-effective alternative for R&D or limited scale, pilot production. Utilizing an innovative, air bearing / vacuum chuck leveling system, the substrate is leveled quickly and gently, for parallel photo mask alignment and uniform contact across the wafer during contact exposure. The Model 200IR Mask Aligner is capable of one micron resolution and alignment precision. It has an alignment module which features mask insert sets and quick-change wafer chucks that enable the use of a variety of substrates and masks without requiring tools for reconfiguration. The alignment module incorporates micrometers for X, Y, and z-axis.
-
product
Micrometer - Vernier
Is a visual tool that allows you to obtain an accurate measurement between two graduation lines on a linear scale, eliminating human estimation error.
-
product
Precision mechanical switches
Precision mechanical switches
Often copied but never matched: With a repeat accuracy of 1 micrometer, My-Com has undisputedly been the world's most accurate and compact mechanical limit switch since 1967. Innovative developments have enabled it to be increasingly more reliable wherever it is used. To date, My-Com has proved its impressive reliability in over a million applications.
-
product
Electrostatic Classifiers And DMAs
These instruments work together to use the electrical mobility technique to determine particle size. This technique is the most appropriate way to measure the size of particles smaller than one micrometer. Indeed, ISO 15900 states that electrical mobility is the preferred mechanism, globally, for submicrometer particle measurement.
-
product
Surface Profile Gages
PosiTector® SPG
Surface Profile Gages for Blasted Steel, Textured Coatings and Concrete Profile. Digital depth micrometer measures and records peak to valley surface profile heights.
-
product
Long Range Straightness Optics
10775A
The Keysight 10775A combines a straightness interferometer and reflector to provide measurements over a range of 1 to 30 meters (3 ft to 100 ft). The optics form a highly-accurate optical straightedge that can measure the straightness of travel of machine-tool and measuring-machine coordinate motions with a resolution of 0.1 micrometer (10 microinch).
-
product
Room Temperature Sample Holders
12962A
The 12962A sample holder is designed to allow accurate impedance tests of solid materials to be performed at room temperature. The sample holder consists of two parallel electrodes, one of which is fixed in position and the other which can be moved into contact with the sample by adjustment of a micrometer. The sample holder makes use of guard ring and reference techniques in order to improve accuracy by reducing “fringing” effects at the edge of the sample. The standard electrode provided is 20mm diameter.
-
product
Laser Scan Micrometers
LaserLinc understands how critical your in-process and off-line laser measurements are, for outside diameter, ovality, wall thickness, concentricity, profile and more.
-
product
Exposed Linear Encoders
Exposed linear encoders consist of a scale or scale tape and a scanning head. Their photoelectric scanning method is touch-free and wear-free, detecting graduation lines just micrometers in width and producing output signals with very short signal periods.
-
product
Universal (ID/OD) Presetting Instruments
Pratt & Whitney Measurement Systems, Inc.
If gage setting and calibration is important to you, choose the Labmicrometer Model 900 or 1600 measuring system. Designed for gage calibration laboratories and shop floor environments requiring precise internal and external measurements over long lengths. Additionally, the Labmicrometer is ideal for use as a setting bench and adjusting instrument offering precision setting of inside and outside comparative measuring gages, micrometers, snap gauges, as well as other measuring tools.
-
product
Image Analysis & Stage Micrometers
The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
-
product
Slide Anvil Type Uutside Micrometer
Interchangeable anvils provide a wide measuring range with a single micrometer.
-
product
Nanomechanical Test System
Hysitron TS 77 Select
The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
-
product
Ultrasonic Thickness Gauges
A widely used nondestructive test technique for measuring the thickness of a material from one side. It is fast, reliable, and versatile, and unlike a micrometer or caliper it requires access to only one side of the test piece.
-
product
Sub-Micron Probe Positioner
QP150 Series
Quarter Research and Development
Quater’s new QP150 sub-micron probe positioners are designed to significantly reduce mechanical crosstalk between axes resulting in fast and accurately placed probe touchdowns with zero pad or trace damage from unwanted needle deflections. Overall ergonomic design places micrometers within a compact zone allowing users to precisely control needle direction and speed.
-
product
Fixed Anvil Type Screw Thread Micrometer
For measurement of the pitch diameter of thread Fixed anvil
-
product
Level measurement with radar sensors
Radar sensors have long been used in level control because they provide reliable measurements even in conditions of dust, steam, smoke, extreme temperatures and strong pressure fluctuations. With OndoSense's innovative radar technology, level measurement is now possible for the first time with a measurement accuracy in the micrometer range in harsh environments.
-
product
Air Micrometers
As the pioneer of air micrometers and electric micrometers in Japan, we respond to a variety of needs for high precision production line measurements.
-
product
Micrometers - Depth
Is used to find the distance between two parallel surfaces i.e. depth of holes, slots, shoulders and projections.
-
product
Micrometers Inside
Used to measure internal dimensions, such as the inside diameter of a wheel.
-
product
LED/CCD Optical Micrometer
LS-7000 Series
Breakthrough technology intelligent optical micrometer with 0.01-micron high resolution, 2400 samples/second high speed. Maintenance - free LED emitter and design (no laser diode or motor). High performance controller with statistical analysis. Controller with target viewer available for easy setup