Qualification
fulfills an absolute condition.
See Also: Performance Testing, Validation, Characterization
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Product
Infrared Interferometers
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Optical imaging applications are broad and varied. Testing at a system's design wavelength is critical for development, final alignment and qualification.
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Product
Burn-In Test Sockets
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The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
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Product
Low Temperature Operating Life (LTOL) Test
LTOL
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LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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EDX-FTIR Contaminant Finder/Material Inspector
EDXIR-Analysis Contaminant Finder/Material Inspector
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EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
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Parts Screening And Testing
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DPA Components International performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability Commercial, Industrial, Space, and U.S. Military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications.
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Product
Meter Engineering Board
MEB
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Perform qualification, disconnect, communication, and advanced functional tests with TESCO’s new Meter Engineering Board. With basic metrology (0.1% accuracy) TESCO’s new MEB can also be used as a demand board or a time-run board, as part of meter certification, or to meet regulatory testing requirements. A new socket design provides automated operation to make loading easier. All new TESCO boards include our new electronically actuated sockets.
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Electrical Probe Systems
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INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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Microelectronics Test & Engineering Services
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EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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Multi Channel Optical Fibre Verification
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The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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Product
Low Voltage Differential Signaling (LVDS)
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Available in QML-Q and QML-V processing flows, CAES LVDS solutions meet all of the stringent mechanical qualification requirements defined in MIL-PRF-38535.
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Cable Manufacturing
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For years, we’ve been at the forefront of optimizing and automating how cable manufacturers test their fibers. Whether it’s cable design qualification, in-process testing, or final quality control—PK instruments around the globe are running 24/7 measuring thousands of fibers.
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Product
Automatic Online Flatness and Surface Appearance System
UltraSort200
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The UltraSort continues our 25 year tradition of providing metrology solutions to semiconductor wafer manufacturers. Designed for volume wafer production, this automated system offers superior performance in rapid, repeatable, accurate, noncontact qualification of silicon and alternative substrate wafers.
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Cryogenics Testing Lab
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DPACI Cryogenics Test Laboratory has been operational for over a decade providing test data, temperature cycling, simulation, and analysis for our customer’s rigid deep space component qualification requirements. Our firm provides our customers with most accurate test data taken at temperatures ranging from 10°Kelvin to 400°Kelvin.
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Voltage Stabilizer
MS 7643
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VSTAB is a voltage stabilizer, regulates the incoming supply +28V voltage into the required +15V. The electrical specifications meets MIL704 standard. Over load and short circuit protections are provided. Voltage stabilizer Module is a part of shipborne unit and it is meant for ensuring the power supply of the devices of this unit when fed from DC mains with nominal voltage of 28 V and variations of voltages from minimum 16V to maximum 32 V. The power consumption is 45 watts. The module is subjected to Qualification Tests as per MIL-STD-810G.
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Desktop Meter Qualification Board
2199
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Providing complete capabilities for evaluating meters and communications performance, TESCO’s Desktop Meter Qualification Board (Catalog No. 2199) can generate any voltage and load conditions the meter may encounter in the field. Apply non-sinusoidal voltages with complex load waveforms. Perform disconnect tests and reconnect tests without having to worry about being able to drive the meter’s switches.
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Custom Assembly, Packaging and Qualification
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DPACI specializes in providing Turn-Key Solutions. We offer comprehensive manufacturing, assembly, qualification, testing, and certification of high reliability EEE components. We have a dedicated, self-contained Class 10,000 clean room with Class 100 laminar flows certified to QML Q (Military) and V (Space) levels to perform all assembly operations from wafer processing to final hermetic package seal
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Acoustic Testing
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Our acoustic testing experience includes acoustic qualification and evaluating sound pressure levels. We utilize microphones, pressure trans-ducers, and an acoustic intensity meter to record acoustic measurements.
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Laser Diode Life Test
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Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
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Device Modeling Products
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Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight's expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.
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Shock & Drop Testing
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Shock testing is often performed as part of a hardware qualification or design process. Information obtained during shock testing can improve the survivability of products as well as verify that they will perform properly in service. These types of tests require special transducers and measurement systems to record and process the high level, high frequency response.
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Product
Detective Logic Analyzer
LPDDR3
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Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 1G of captured States at 1600MT/sContinuous, real time analysis, not post-processingEye Detector guarantees valid data acquisitionExtensive Triggering and Storage Qualification allows precise insightProtocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specificationsMode Register Listing providedSupports Auto-Clock rate detect and clock stoppageConnects to the target under test with Flying Lead, BGA interposers or a midbus probeIntegrated Microsoft Charts gives quick insight into large trace capturesTrigger In & Out allows the Detective to integrate with other test tools
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Optical Switches
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This latest technology platform presents the best value in terms of size, form factor, durability, and cost. The design of our MEMS optical switch centers on DiCon's proprietary dual-axes tilting MEMS mirror and is expandable up to a 1x36 switch configuration. Large fan-out 1xN optical switches and non-blocking fan-out/fan-in NxM matrix optical switches are built by cascading multiple of these 1xN switches. The MEMS 1xN fiber optic switch passes the stringent Telcordia GR-1221 qualification and is vastly deployed in today’s optical communication networks. With a lifetime of over a billion cycles, the durability of this MEMS device makes it a perfect choice for optical network monitoring applications that require frequent switching.
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HDMI/DVI Transmitters
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HDMI® transmitters and DVI transmitters remain in high demand in many professional, consumer, and automotive video applications. Analog Devices’ diverse solutions offer competitive advantages such as automotive qualification, low power, and small packages (3.4 mm × 3.4 mm WLCSP). Our range of HDMI/DVI transmitters provide conversion of a range of formats such as HDMI, MIPI, and TTL to HDMI video data. Typical applications include set-top boxes, video distribution, and digital cameras. In these applications, Analog Devices’ HDMI transmitters and DVI transmitters offer proven interoperability over years of implementation into many products. Our HDMI parts also support HDCP for encrypted content protection.
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Handheld VoIP Service Tester
925VST
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THE 925VST is a powerful handheld voice over packet (VoP)service qualification tool for field deployment and troubleshootingpersonnel who need a rapid and reliable installation tool.
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Protocol Analyzer
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Multi-speed, Ethernet protocol, multi-function test platform. Used in the development, qualification, manufacturing and support of equipment with external or embedded communications interfaces.
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Non Destructive Testing (NDT)
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NDT covers a wide group of testing techniques used to evaluate the properties of a material, part, product, weld or system without causing damage. NDT carried out at KLL includes:Liquid Penetrant Testing (LPT) is used for the detection of surface breaking discontinuities on magnetic and non-magnetic metallic materials.Fluorescent and colour contrast penetrants are available to be used in the following methods:-Water washableSolvent removablePost emulsifiableMagnetic Particle Inspection (MT/MPI) is used for the detection of surface breaking and slightly sub-surface (up to 2mm) discontinuities.Bench type crack detectors and portable units are employed producing various waveforms (i.e. A.C, HWDC and induced magnetic flow) to give both circular and longitudinal magnetism.On-site testing is carried out using electro magnetic yokes and permanent magnets producing induced magnetic flow.Ultrasonic Flaw Detection (UT), also known as Ultrasonic Inspection, is used for the detection of volumetric discontinuities in ferrous and non-ferrous products (forgings and castings etc.), and welds in magnetic and non-magnetic materials.UT is capable of penetrating metals, dependent on the material characteristics, up to 10m in length.Some thickness and depth checks can also be carried out using ultrasound.Radiography services are available through sub-contract booked in advance. Notice is required for on-site work.Personnel are available at short notice for in-house or on-site work in the UK and overseas.All inspectors undertaking non destructive testing (LPT, MT/MPI and UT) are qualified to, and meet a minimum of, PCN Level 2.PCN Level 3 supervision is available in-house for LPT, MT/MPI, UT offering consultancy services including procedure writing and commentary, auditing of techniques and Level 3 Supervisor cover.We can assist clients in product qualification, material testing, quality assurance and audit programmes.
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Open Top BGA Sockets
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Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Defect Inspection and Review
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KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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PCB Connectors
CMD Series
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Smiths Interconnect's versatile, high density CMD connector solution for board to board and wire to board with built in coding and keying as well as ESA qualification
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Evaporative Emissions Testing
GASERA ONE SHED
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Evaporative losses from the fuel system are tested for vehicle certification. GASERA ONE SHED allows direct monitoring of evaporative emissions as part of the qualification testing procedures for vehicles. The GASERA ONE SHED’s photoacoustic technique is approved by the Environmental Protection Agency (EPA) and the California Air Resources Board (CARB).
