HIL
a system's simulation test of embedded controls by the electrical emulation of it's motors, sensors and actuators.
See Also: Loop, Current Loops, Loop Testers, Hardware in the Loop Simulation, Hardware-in-the-Loop
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Digital Reconfigurable I/O Device
The Digital Reconfigurable I/O (RIO) Device features user-programmable FPGA for onboard processing and flexible I/O operation. You have complete control over the synchronization and timing of all signals and operations along with custom onboard decision-making that executes with hardware-timed speed and reliability. You can configure user-defined hardware for a wide variety of applications, such as custom digital DAQ, high-speed waveform generation, sensor simulation, hardware-in-the-loop (HIL) test, custom digital communications protocols, bit error rate testing, and other applications that require precise timing and control.
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PXI-2514, 7-Channel, 40 A PXI Signal Insertion Switch Module
778572-14
7-Channel, 40 A PXI Signal Insertion Switch Module—The PXI‑2514 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI‑2514 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls
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PXI-2722,16-Bit, 5-Channel PXI Programmable Resistor Module
781985-22
16-Bit, 5-Channel PXI Programmable Resistor Module—The PXI‑2722 is a test module that replicates the behavior of resistance-based inputs and outputs such as potentiometers, resistance temperature detectors (RTDs), voltage dividers, and bridge elements. The PXI‑2722 programmatically controls a series of relays to vary the resistance across each channel of an I/O connector. This function is well suited for simulating environmental conditions in hardware‑in‑the‑loop (HIL) validation. The software provides a simple user interface that accepts inputs in units of temperature or resistance and configures the resistance across each channel.
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Stackable And Configurable Signal Generator For CAN Applications.
K- Volt
The K-Volt can be used to generate fast configurable analog and digital signals from CAN messages. Designed for high speed and accurate simulation of sensors (For example HIL and Replay systems). The K-Volt can be connected directly to a PC via a USB connection.
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System on Demand (SoD): HiL Test System
System on Demand (SoD) is a unique, agile and standardized principle to design HiL test systems. SoD shifts the focus away from technical-only solutions to a proven automated design process – targeting our customer‘s real issues: time, budget and flexibility.
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Brinell Optical Scope
HiLight Series
Newage Testing Instruments, Inc.
The Newage 5620 Series HiLight Brinell Optical Scopes features a high-efficiency LED array for its light source, providing excellent illumination and improved readability over conventional “flash light” scopes.
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Electric Servomotor Steering HILS Tester
This device is a complex simulation test device completed by the operation of the steering system performance / durability test machine and the hardware in the loop systems (HILS) system.
