Open Area Test Sites
test objects to 30MHz to 3000 MHz frequency range.
See Also: OATS, Comb Generators
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Product
Crypto Libraries Test Suite open source
Project Wycheproof
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A set of security tests for identifying cryptographic vulnerabilities. Project Wycheproof tests crypto libraries against known attacks.
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Product
Open Networking
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We are committed to the ever changing world of Data Communication and Storage Networks. As the industry moves forward into Open Networking, we are keeping pace. Working closely with various Open Network organizations such as the Open Compute Project (OCP) and the Open Platform for NFV (OPNFV), we are leveraging years of experience of effecting positive change in the industry and creating robust test programs to enable markets.
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Area Scan Cameras
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JAI provides a wide selection of industrial machine vision cameras with both single-sensor and multi-sensor configurations. Resolutions range from 0.3 MP to 20 MP, with high frame rates ranging up to 250 fps for full 5MP resolution. A selection of cameras can operate beyond the visible – in the ultraviolet, near infrared and in the short wave infrared light spectrums.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Area Scan Camera
Genie Nano-CXP
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Introducing Genie Nano-CXP, a camera designed for full-throttle performance. Genie Nano-CXP builds on Nano's proven, industry leading reputation and leverages a CoaXPress 6Gbps interface to deliver the maximum throughput from leading edge high resolution CMOS image sensors.
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Variable Area Flowmeters
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Is a meter that measures fluid flow by allowing the cross sectional area of the device to vary in response to the flow, causing some measurable effect that indicates the rate.
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BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Portable Meter Site Test System
Bantam Plus
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The Bantam Plus is the newest and most technologically advanced portable three-phase meter site test solution available for today’s metering professional. This innovative solution supplies a safe, accurate and highly versatile answer to the diverse test requirements of today’s electric metering.
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Open Source Advanced Web Security Testing Platform
IronWASP
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IronWASP (Iron Web application Advanced Security testing Platform) is an open source system for web application vulnerability testing. It is designed to be customizable to the extent where users can create their own custom security scanners using it.
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Product
Innovative Open Standard
PROFINET
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PROFINET is the innovative open standard for Industrial Ethernet, development by Siemens and the Profibus User Organization (PNO). With PROFINET, solutions can be implemented for factory and process automation, for safety applications, and for the entire range of drive technology right up to clock-synchronized motion control. PROFINET is standardized in IEC 61158 and IEC 61784. Profinet products are certified by the PNO user organization, guaranteeing worldwide compatibility.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Area Scan Cameras
ace Series
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Enjoy a new class of digital cameras that will help you to be even more successful and efficient at what you do. High quality and performance levels combined with a low starting list price of only 199 and a small 29 mm x 29 mm housing make Basler ace cameras one of the world's best-selling cameras with thousands of satisfied customers. It is available with several resolutions and speeds and with sensors from all leading manufacturers so that you can easily find the right ace camera model for your application. Choose from the most popular and standard proven data interfaces in the vision market: With the ace Gigabit Ethernet models, you benefit from our GigE market leadership, easy multi-camera setups and 100-meter cable length. Camera Link is the interface for high image data transfer. And with USB 3.0 there is an interface technology which is easy to use and real-time capable.
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Product
3-Axis Non-Robotic Automated Testing System
AT3
Test Instrument
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Area Scan Sensors
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The ams family of pipelined global shutter sensors features high frame rates for a wide range of demanding professional and industrial applications. Their resolutions range from VGA up to 50Mpixels. Rolling shutter image sensors feature high 71Mpixel resolution for use in demanding industrial applications.
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Batterie Inspektor
Battery Test Platform
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Open Optical Encoders
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An optical encoder is an electromechanical device which produces an electrical signal output proportional to the linear displacement of a linear guide or the angular position of an input shaft.Open encoders are exposed and feature no external integrated enclosure. The advantages of open optical encoders include the effective elimination of backlash, shaft wind-up (torsion) and other mechanical hysteresis errors.A rotary open optical encoder consists of a position measurement readhead and an accurate rotary scale marked either on the periphery of a ring or on the face of a disc.The readhead measures position by optically sensing the regularly-spaced scale markings and outputs this information as an analogue or digital signal.The signal is subsequently converted into a position reading by a digital readout (DRO) or motion controller.
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Portable Three-Phase Meter Site Analyzer
RW-30X / RW-31X
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RADIAN RW-30/31X Meter Site Analyzers deliver comprehensive three-phase field testing and site analysis utilizing the Radian Research RX Xytronic series reference standard as its measurement engine. The RW-30/31X provides for testing meters with integrated, precision, true three-phase voltage and current sources or using customer’s load. Choose the RW-30/31X NS (no source) model to test using customer’s load only.
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Product
Test Fixture
16047E
Test Fixture
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
