Reflection
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Spectroradiometer
SpectraScan® PR-735
The SpectraScan® Spectroradiometer PR-735 is JADAK’s enhanced sensitivity portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
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Gesture, Color Sensors & Proximity Detection
The gesture product family performs advanced gesture detection, proximity detection, digital Ambient Light Sensing (ALS) and color sensing (red, green, blue and clear). It also implements optical pattern generation for barcode transmission and remote controls. The gesture sensor modules provide a highly integrated solution offering five essential functions to enable a touchless interface and to optimize the end user experience of communications and consumer electronics equipment. Gesture detection uses four directional photodiodes to sense IR energy emitted from the integrated LED, converting the measurements of reflected IR light into information about physical
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kSA SpectR
The kSA SpectR is a complete metrology solution for measurement of absolute spectral reflectance, growth rate and end point detection. Custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level, over a user defined wavelength range of interest, are easily measured.
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SPECTRA ONE DEGREE PHOTOSPOT
The Spectra One degree Photospot is a unique optical accessory that converts your Spectra Professional IV-A into a high-sensitivity one degree Spotmeter for narrow-angle reflected-light measurements. Readings are displayed in reflected f/stop or in footlamberts in luminance mode
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Minority Carrier Life Time System
MWR-SIM
MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
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LIDAR & Direct Time of Flight
LIDAR (Light Detection and Ranging) is a sensor technology for remote object detection and ranging, using a light source and receiver. Emitted light pulses hit objects, reflect, and return to the LiDAR sensor system where the receiver detects the returning light pulse.
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48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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Single connector for a HG cable, and two HM connectors
MVNA-8-350-2
The lower part of the Central Unit model MP-8-350-2 has a single connector for a HG cable, and two HM connectors (Fig. 9). Two Harmonic Mixers can work simultaneously, for instance HM2 detecting transmission through the DUT, and HM1, at port 3 of a directional coupler, detecting reflection from the DUT.
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Mobil Cable Test and Fault Location System
SWG-12 (SWG-32)
• testing cable insulation with DC (rectified) voltage up to 32 kV;• conditioning faults by burning faulty cable insulation with current up to 100 mA;• pre-locating cable faults with the reflectometer RIF-9 based on the pulse reflection method (TDR), voltage wave oscillation method (DECAY), impulse current envelope (ICE) method and arc reflection method (ARC / ARC multi-shot);• pinpointing cable faults with the acoustic method with up to 2000 J surge wave generator and a suitable signal receiver.
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50% Beam Splitter
10701A
The Keysight 10701A beam splitter is designed for beam diameters of 6 mm or less. It reflects one half of the total incoming laser beam, and transmits one half. The Keysight 10701A optic includes a housing for standard mounting.
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Spectrally Flat Class A Albedometer
LPPYRA11
Albedometers are composed of two pyranometers that are mounted back-to-back. An albedometer measures in two directions; one pyranometer is facing upwards (measuring the global solar radiation), the other pyranometer is facing downwards (measuring the reflected solar radiation).
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Impulse Winding Tester
TH2883-5
Changzhou Tonghui Electronic Co., Ltd.
TH2883 series products are newly developed impulse winding testers by Tonghui. This product line makes Tonghui as the first provider of impulse winding tester from low voltage of 30V to high voltage of 10kV, single channel to multichannel (Max.:8 channels) in this industry. The instrument adopts popular 32 bit CPU and high density SMD technology, 65k color 7-inch TFT wide display screen, bringing ease for your eyes and convenience to your operation. The minimum impulse voltage of 30V, maximum impulse voltage output of 10kV, winding test of 1uH inductance value, sampling rate of 200Msps, memory depth of 6k bytes makes your test accurately. The usage of standard sample average, application of demagnetized impulse, high bandwidth analog acquisition circuit, technology of high-fidelity corona extraction as well as the opening of non-destructive test reflect the design philosophy “customer-oriented, share the future technology with you” of Tonghui.
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Retro-Reflectometer
The visibility is an important factor for road markings, traffic signs, road studs as well as high-visibility material such as warning clothes and Heavy good vehicles (HGV's) contour safety marking.The measurement of retroreflectivity is essentially a measurement of the reflectance of material under specified geometrical and spectral conditions. Instruments are available for measuring the retroreflectivity of various reflection materials.
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Verifier Computer Interface Report
VCIR
The Verifier Computer Interface Report (VCIR) is a Windows software package that allows for transferring inspection report from your Inspector series bar code verifier to a computer. Once transferred you can review the ISO/ANSI inspection results or view the scan reflectance profile for detailed troubleshooting. The inspection results can be saved by job for later retrieval or to append new inspection results to the existing job. As each job is saved an Excel spreadsheet (CSV file) is generated. You can customize which parameters should be saved in the spreadsheet. The spreadsheet provides a simple report that will have a line for each bar code inspected.
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High Voltage 50 Ω Pulse Generator
TLP-8010C
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Combines TLP-8010A and TLP-4010C into one system*Can be operated together with TLP-8012A5 and TLP-3011C pulse width extenders*Ultra fast 50 Ω high voltage pulse output with typical rise time 100 ps (0-40 A) and 300 ps (> 40 A)*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω configuration*High pulse output current up to ±80 A (short circuit) with minimum 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns (0-40 A), 1 built-in pulse width: 100 ns (> 40 A)*The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0-40 A)*Optional external pulse width extensions from 5 ns to 500 ns (> 40…80 A) using the external pulse width extender TLP-8012A5*Built-in pulse reflection suppression*Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components
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photon3D
Innovative 3D cameras from Photonfocus offer completely new possibilities for future-oriented laser triangulation applications. The photon3D platform is optimized for high frame rates and high sensitivity and offers robust algorithms for determining the laser line in the FPGA of the camera. Photonfocus has optimized these algorithms in order to suppress artifacts such as reflections.
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Handheld Tachometers
The handheld tachometer is a means of measuring revolutions within the industrial sector, either optically or mechanically. The handheld tachometer can be used for maintenance and calibration of machines that have moving parts. The principle is similar to a bicycle speedometer, where time will be measured until a wheel has completely turned. The handheld tachometer has two different measurement methods.The handheld tachometer may have a contact connection to the moving parts. Alternatively, the handheld tachometer works with reflecting marks. This will be secured on the moving part. As the laser strikes the reflecting mark during rotation, it will be reflected and detected in the handheld tachometer via a sensor. Rotation speed and speed can be seen on the handheld tachometer. The handheld tachometer may combine both possibilities (contact and non-contact connection). Next to the handheld tachometer you find other devices for measuring revolutions at PCE Instruments.
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Thin Film Metrology Systems
Gemini Series
The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates. These tools are used extensively for solar cell, flat panel and photomask applications. The tools belonging to the Gemini-TF Series are based on unpolarized Reflectance (R) and unpolarized Transmittance (T) measurements, with a 50μm spot size for both R and T. R and T are simultaneously measured to determine film thickness and n and k spectra from 190nm – 1000nm
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Metallographic Microscope
Beijing TIME High Technology Ltd.
A specialized optical instrument used to examine the microstructure of opaque materials, such as metals and alloys, by reflecting light off the polished and often etched surface of a sample.
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PXI-2797, 40 GHz, 50 Ω, 6x1 (SP6T) Terminated PXI RF Multiplexer Switch Module
782357-01
40 GHz, 50 Ω, 6x1 (SP6T) Terminated PXI RF Multiplexer Switch Module—The PXI‑2797 offers a high-density, terminated multiplexer with dual 6x1 multiplexer banks in the same module. The internal termination of the PXI‑2797 helps prevent high-power reflections that arise from open channels on the module. It is ideal for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules.
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Network Analyzer
DPNA-6G AXIe
The AXI DPNA-6G module is the world's first network analyzer in the form factor of the AXIe-1 module, as well as the first Russian device that meets the AXIe-1 standard. In the mode of the network parameters meter, the AXI DPNA-6G module measures the vector values of the network parameters on two ports: transmission coefficients (S12, S21) and reflection (S11, S22). At the same time, all necessary types of calibrations are supported: one- and two-port short-circuit, XX, matched load, transmission normalization. The software supports the import of third party calibration standard parameters. In the measuring receiver mode, the module provides:*generation of a harmonic signal (frequency synthesizer);*spectrum analyzer and power level in a given band;*measuring the frequency of a known signal;*measurement of analog modulation parameters;*phase noise measurement.
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DCA-X Sampling Oscilloscopes
The DCA-X wide-bandwidth sampling oscilloscopes are in our digital communication analyzer (DCA) family. These are modular platforms that provide accurate and precise measurements of high-speed digital designs from 50 Mb/s to 224 Gb/s. You can configure the DCA-X mainframes by selecting from a variety of plug-in modules that perform precision optical, electrical, and time domain reflection / transmission (TDR / TDT) measurements. Select specific modules to obtain the desired bandwidth, filtering, and sensitivity that match your measurement needs.
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CellCorder Battery Tester 'EU Series'
CRT - 400
The new CRT-400 is the latest version in the leading line of CellCorder battery test instruments. Lightweight, stylish, rugged and durable. Special features include new user-friendly operation, USB and IR data transfer, modem, graphical reflective LCD display for better contrast, and new cables and clamps.
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Ultrasonic Thickness Guage
KM 130D
Kusam Electrical Industries Limited
Ultrasonic Thickness Guage is an intelligent hand held meter which adopts ultrasonic measuring principle, & is controlled by micro processor, provides quick & precise measurement of thickness for most of industrial material. This unit is widely used in various precise measurement for different hard ware / parts in industrial realm; one of its important application is to monitor the level of thickness-decreasing during operation of various & pressure container. Diffusely applied in manufacture fields, metal processing, and commercial inspection. The material that conduct & reflect constant sonic velocity, this product is to be applicable to used.
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Portable Spectrometer / Portable Spectrum Analyzer
Optoplex's portable spectrometer / portable near-infrared optical spectrum analyzer (OSA) / mini spectrometer is a valuable spectral module in the Process Analytical Technology (PAT) applications. Portable spectrometer acts as a stand-alone spectral engine, imaging and measuring, through a rapid and nondestructive process, a wide range of vapor, liquids and solids through transmission and diffuse reflection.
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Laser Distance Meter with Compass
TRUPULSE 360(B)
F. W. Breithaupt & Sohn GmbH & Co.KG
*Scope magnification 7-times*Field of view 100m/915m distance*LCD Display*Range to non-reflecting targets 1.000m*Range to reflecting targets 2.000m*Accuracy in range ± 30cm (± 1m to weak targets; shown in display)*Accuracy in slope ± 0,25°*TruVector Compass Technology*Accuracy of compass ± 1° typical*RS 232/Serial interface (Model B: with Bluetooth)*IP protection IP54
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Spatial Heterodyne Surface Chemical Agent Detector
SHSCAD
Wide area, high areal coverage rate surface contaminant detection via LWIR reflectance spectroscopy employing eye safe broadband quantum cascade lasers (QCLs) and a high-speed spatial heterodyne spectrometer (SHS) in a handheld sensor package (~ 10,000 cm3, 10 lb).
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Turbidity Logger Sensor
NUL-231
This sensor measures the reflected light that enters into a tube containing a solution. As solution turbidity is higher, more light is reflected and measured by the light sensor, located perpendicular to the light source.
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2-MGEM Optical Anisotropy Factor Measurement System
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Reflective Memory PCIE card
PCIE-5565PIORC
The PCIE-5565PIORC low profile PCI Express (PCIe) Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data. Writes are stored in local SDRAM and broadcast over a high speed fiber-optic data path to other Reflective Memory nodes.
