Manufacturing Defect Analyzers
Test for loaded PCB manufacturing defects, analyzing short circuits, open circuits, and some component values.
See Also: MDA
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Test Engineering & Manufacturing
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Whether you require just a test fixture, a complete automated test solution or a build to print service, we will work with you to ensure you get the best return on investment possible. We have highlighted our three key services for you below. Our hardware engineers are regularly trained and certified to ensure best practice. All of our software engineers have certified developer accreditation which means the code we produce is concise, easy to maintain and scalable.
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Semiconductor Manufacturing Optics
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No lithography without optics. No semiconductors without lithography. Without semiconductors there would be no microchips, without microchips no computers – no high-tech products. As an OEM (Original Equipment Manufacturer) supplier, ZEISS enables the semiconductor industry worldwide with optics and other optical modules.
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Protocol Analyzer / Exerciser
Summit M616
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The Summit M616 is Teledyne LeCroy's latest generation of protocol analyzers targeted at high speed PCI Express 6.0 and CXL I/O-based applications such as server, workstation, desktop, graphics, storage, AI, and network card applications.
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Manufacturing Analytics 360°
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Optimize quality and efficiency in manufacturing with a 360° viewof your production line by our advanced analytics
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IT Digital Manufacturing Solutions
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The future of manufacturing is connected, automated and digitally driven. As plant floor operations technologies converge with IT, numerous use cases across the manufacturing cycle become possible to ignite innovation, create more efficient operations, reduce downtime and improve worker productivity.
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Rapid Prototyping and Manufacturing
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We work closely with you in the early in the life cycle of your product development. Our extensive knowledge of the latest innovative prototyping tools enables us to design and produce initial designs quickly and to specification. Once the prototype has been tested and the design accepted, we are able to provide full small scale manufacturing options to bridge the gap to full outsourced manufacturing.
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Measuring Systems For Beverage Can Manufacture
Cross Hatch Machine
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Optik Elektronik Gerätetechnik GmbH
Uniform crosshatch pattern on a punch, specific for the beverage can industry.
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PNA-X Microwave Network Analyzer
N5247B
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Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Large Surface Defect Gauge
4D InSpec® XL Surface Defect Gauge
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The 4D InSpec XL Surface Defect Gauge expands 4D Technology’s 4D InSpec product line—they’re the first handheld, precision instruments for 3D non-contact surface defect measurement.
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Chip Manufacturing
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KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
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Two Port SAS?SATA Analyzer
Sierra M122A
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The Sierra M122A is Teledyne LeCroy’s two port SAS / SATA analyzer with special licensing to allow 6 Gb/s protocol capture. This multifunction platform is available with an integrated traffic generation option capable of host and device emulation. There is also a “Jammer” option for stress testing at the system and component level. This model of the Sierra M122A is configured for 6Gbps SAS & SATA protocol capture and can be field-upgraded to support 12Gb/s SAS testing.
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Measuring Systems For Beverage Can Manufacture
RING & PUNCH INSPECTOR
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Optik Elektronik Gerätetechnik GmbH
The RING & PUNCH NSPECTOR provides fatigue free and detailed inspection of the inside surface of each kind of ironing die and the outside surface of punches, used in beverage can manufacture.
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Audio/ Video
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Our experts/ physicist can help you in the Implementation of your algorithms including BPR, NUC , Edge Detection and movement analysis algorithms.Our development environment is based on C++ and LabVIEW libraries or tools such as Vision Builder for Automated Inspection from National Instruments.
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CXA-m PXIe Signal Analyzer
M9290A
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Deploy a smaller microwave footprint, no trade-off in precision: Rely on fully specified performance up to 26.5 GHz in 4 slots Optimize your balance between speed, sensitivity and accuracy with the choice to operate in swept or FFT modes Perform fast calibrated stimulus response measurement with full-band tracking generator Smooth the transition between R&D, manufacturing, and maintenance: CXA-m is code compatible with benchtop X-Series signal analyzers and ESA spectrum analyzers
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Transistor-Level Defect Simulator
Tessent DefectSim
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Tessent DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits. It measures defect coverage and defect tolerance. Tessent DefectSim is perfect for both high-volume and high-reliability ICs. Tessent DefectSim replaces manual test coverage assessment in AMS circuits needed to meet quality standards such as ISO 26262 and provides objective data to guide improvements in DFT. Tessent DefectSim dramatically reduces SPICE simulation time compared to simulating every potential defect.
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Real-Time Analysis, 255 MHz, Basic Detection, Multi-touch
N9040B-RT1
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See, capture, and understand elusive signals as short as 17.17 s with 100% POI and a complete set of advanced triggers View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Reticle Manufacturing
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An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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PCIe 5.0 Protocol Exerciser
P5551A
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Keysight PCIe 5.0 Protocol Exerciser gives the flexibility in emulating either as a root complex or as an endpoint device when validating PCIe designs.
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Streamline Vector Network Analyzer, 9 KHz To 6.5 GHz, 4 Or 6-port
P5021B
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Compact, faceless, vector network analyzer (VNA). Flexible four or six-port VNA dramatically reduces your size of test. Up to 6.5 GHz.
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Building Defect Investigations and Surveys
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Building defect investigations and surveys are needed not only when problems arise but when assurance is required that defects do not exist or that the standard of construction is such that problems are unlikely
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"Smart" Dynamic Signal Analyzers
EMX-4xxx
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The EMX-4xxx product family contains high-performance breakout boxes (EMX-4008 and EMX-4016), smart high density dynamic signal analyzers (EMX-4250 and EMX-4251), smart PXIe 625 KSA/s 4-channel digizers (EMX-4350), and charge and IEPE PXIe 625 KSA/s 4-channel digitizers (EMX-4380).
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Network Analyzers
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Network Analyzers measure magnitude, phase, and impedance of radio frequency (RF) devices. You can use them to make precise, repeatable RF measurements in RF design, validation, and production test systems.
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Spectrum Analyzer
FPL1000
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In an RF lab, the R&S®FPL1000 is as indispensable as an oscilloscope or multimeter. It is a single measuring instrument for a variety of measurement tasks. It supports not only spectrum analysis, but also highly accurate power measurement with power sensors and analysis of analog and digitally modulated signals.
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Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
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Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Streamline Vector Network Analyzer, 9 KHz To 14 GHz, 2-port
P9373B
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Compact, faceless, vector network analyzer (VNA). Affordable full two-port VNA which dramatically reduces your size of test. Up to 14 GHz.
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Vector Network Analyzer 9KHz-3.2GHz. Includes Adv Meas Kit, Distance To Fault Opt, Cal and Utl Kits
T3VNA3200
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Vector Network Analyzer 9KHz-3.2GHz. Includes Adv Meas Kit, Distance To Fault Opt, Cal and Utl Kits.
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Manufacturing Plug-in
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Manufacturing Test Plug-in, supports incorporating VNA software into automated manufacturing process
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Pipeline Defect Mapper
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The non-intrusive measuring device takes measurements along the pipeline and plots the results directly onto the screen of the receiver. There is no need to carry extra logging and display devices. All the data is displayed and logged into the receiver for downloading to a spreadsheet or dedicated analysis program.
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Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
