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Optical Loss Test Set
measures the total amount of attenuation in a length of fiber.
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Quad Optical Loss Test Set
KI27624-INGAAS
A Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber optic systems at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful optical multi-meter style solution to improve test flexibility and productivity.
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Two-Way Optical Loss Test set
KI23403OLV-INGAAS-APC
A Dual Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on multimode fiber at 850 / 1330nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. A multimode APC connector on this model is required for reliable ORL test performance.
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SM & MM Quad Optical Loss Test Set
KI2724-INGAAS-APC
A SM & MM Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber with an APC connector at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful solution to improve test flexibility and productivity.
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SM & MM Quad Optical Loss Test Set
KI2724-INGAAS
A SM & MM Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber optic systems at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it is a powerful fiber optic multimeter / OLTS with improved test flexibility and productivity.
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Pro Optical Loss Test Set
CertiFiber
The CertiFiber Pro Optical Loss Test Set improves the efficiency of fiber optics certification. The Taptive user interface simplifies set-up, eliminates errors and speeds troubleshooting. A set reference wizard ensures correct reference setting and eliminates negative loss errors. Built on the future-ready Versiv platform, CertiFiber Pro Optical Loss Test Set (OLTS) provides merged Tier 1 (Basic) / Tier 2 (Extended) testing and reporting when paired with OptiFiber Pro module.
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OPTICAL LOSS TEST SET (OLTS) MQJ KIT
4000-1025
The OLTS (Optical Loss Test Set) - MQJ Kit includes a soft, padded carrying case with strap that is provided to protect all of the components during transportation and/or storage.
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Two-Way Optical Loss Test set
KI23422OLV-INGAAS
A Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on single mode fiber at 1310 / 1550 nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use.
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Two-Way Optical Loss Test Set
KI23410OLF-INGAAS-APC
A Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on single mode fiber with an APC connector at triple 1310 / 1550 / 1625 nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. The 650 nm VFL is on a separate port.
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Two-Way Optical Loss Test Set
KI23422OLF-INGAAS-APC
A Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on single mode fiber with an APC connector at 1310 / 1550 nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. The 650 nm VFL is on a separate port.
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Two-Way Optical Loss Test Set
KI23427OLF-INGAAS-APC
A Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on single mode fiber with an APC connector at triple 1310 / 1490 / 1550 nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. The 650 nm VFL is on a separate port.
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Optical Loss Test Set (OLTS)
MaxTester 940/945
First tablet-inspired, multifunction optical loss test set (OLTS) delivering insertion loss, optical return loss and fiber length measurements at two wavelengths in five seconds via fully automated bidirectional FasTesT™ analysis. With its step-by-step reference wizard and intelligent fault diagnosis, the MAX-940/945 provides expert guidance throughout the test process to ensure immediate efficiency by first-time users while removing risk of errors or negative loss—a common source of issues when testing low loss fibers.
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Quad Optical Loss Test Set
KI27624-INGAAS-APC
A Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber with an APC connector at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful solution to improve test flexibility and productivity.
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Optical Loss Test Set/Light Source/Optical Power Meter
The CMA5 series (Optical Loss Test Set/Light Source/Optical Power Meter) offer superior accuracy and reliability for evaluating a wide range of optical devices and systems including WDM.
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Optical Loss Test Set
KI23424OL-INGAAS-APC
A Quad Two-Way Optical Loss Test set / OLTS fiber tester that's perfect for medium to ultra high fiber count loss, length & optical return loss testing applications on both multimode and single mode fiber with APC connectors on both ports at 850 / 1330nm 1310/1550 nm. A pair of these compact SM & MM instruments set new standards of productivity, ultra-stable source accuracy and ease of use.
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Optical Loss Test Set
KI 23400
A Bidirectional Optical Loss Test set (OLTS) that's perfect for medium to ultra-high fiber count loss, length & ORL testing. A pair of compact instruments set new standards of productivity, accuracy, and ease of use.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Optical to Electrical Converters
High bandwidth, broadband optical to electrical converters available in a range of configurations. Choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Broadband Optical Source - MATRIQ
Our SLED MATRIQ instrument is a compact super-luminescent LED light source with high output power, large bandwidth and low spectral ripple.The SLED comes in various wavelength models to address various key applications across telecom and datacom, and is ideal for building a customized optical testing platform that delivers reliable and repeatable results.
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Broadband Optical Source - PXI
SLED 1000 Series
The SLED 1000 Series is a super-luminescent LED light source with high output power, large bandwidth and low spectral ripple. It comes in various wavelength models to address applications in the telecom and datacom markets.The SLED is a single-slot PXIe module and is ideal for building a customized optical testing platform that delivers reliable and repeatable results in manufacturing or R&D environments.
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Electronic Control Unit Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
