Surge Test
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
Signature Surge Tester
TSM
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Compact cabinet that contains a multi-position carry/tilt handle and a rear plastic snap-on cover for cable storage and transportation in the shop or in the field. Tektronix TDS1002, 1 Billion Samples/sec, real time, programmable, storage oscilloscope and includes a built-in 3 phase test selector switch that facilitates 3 phase motor testing by mechanically re-positioning the ground terminal.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Surge Generator
CFL SG 1610
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SCOPE offers CFL SG 1610, Surge Generator with output of 16kV and 1000 Joules. It is ideal choice for fault location on all types of power cables from LV to EHV. CFL SG Series is equipped with different Protections, Interlocks and Auto-discharge Facility to ensure User Safety during operation. User Friendly controls, adequate form factor, contact free HV terminations makes this CFL SG Series most durable and best-designed sets in the segment
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Product
Surge Voltage Generator
SSG 1500
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Cable fault location with the BAUR SSG 1500. Surge voltage generators are used for pre-location and pinpointing of high- and low-resistive as well as intermittent faults in power cables. The energy stored in a high-voltage capacitor is released at regular intervals or as DC voltage. The thus generated acoustic signal at the fault position can be recorded with a ground microphone and a universal receiver.* High surge voltage up to 32 kV* Continuously adjustable voltage* Voltage monitoring through kV meters with 3 measuring ranges* Automatic discharge unit
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Product
Lightning Surge Generator
STT-LSG-7K16A
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Beijing KeHuan Century EMC Technology Co,.LTD
The lightning surge generator STT-LSG-7K16A provides a common basis for evaluating the performance of equipment power lines and internal connecting lines when they are subjected to high-energy transient interference from switching and natural lightning strikes. The performance meets the requirements of IEC61000- 4-5 and GB/T17626.5 standards.
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Battery Cell Surge Tester
Chroma 19311
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Chroma Systems Solutions, Inc.
The 19311-10 has 10 channels, which can test up to 9 battery cells via scanning test, with a single unit. It can support up to 25 channels for testing up to 24 cells in a sequence by connecting with an external scanner (A190362). The test speed of the multicell scanning test by 19311-10 is extremely efficient, saving test time, and decreasing labor costs. It also increases the production capacity of the production line.
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Product
C-Type Surge Generator
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Shanghai Guantu Technology Co., Ltd.
Surge generator is an electronic measuring instrument used in the fields of information science and system science, electronics and communication technology.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Surge Voltage Generator
SSG 500
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Cable fault location with the BAUR SSG 500. The SSG 500 surge voltage generator is arranged in a 19'' housing. Maximum safety is achieved with the electrical safety control unit, the automatic discharge unit, the fully enclosed design and separate protection and system earth.* 6 output voltages up to max. 16 kV available* Electromagnetically actuated surge switch* Preselectable surge energy: 288 / 512 Ws (in all voltage ranges)* Automatic discharge unit
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Surge Tester
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Educated Design & Development, Inc.
An electronic testing device used to evaluate the condition of electrical insulation in coils, transformers, and electric motors.
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Product
Audio and Acoustic Functional Test Solution
Functional Test
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
Surge Arrestor Testing Equipment
SA 30i
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SA 30i, the Leakage Current Analyser from SCOPE is a State of the Art, On-line test system for Residual Life Assessment of Metal Oxide Surge Arresters. The instrument measures and directly displays the values of Total Leakage Current and Third Harmonic Resistive Leakage Current. It provides system harmonic compensation as per IEC 60099-5-B2. It provides Corrected Resistive Leakage Current after applying correction factors for change in system voltage & temperature.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
Test Port Cable
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
Surge and Transient Protection
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Our surge and transient protectors are safety approved for instance for ATEx. The series cover both AC and DC instrumentation, and is retrofit, so already installed instrumentation can now use the extra high protection rate of up to 20 kA.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
Test Fixture
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family.
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Product
EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.
