Current Transformer Test Set
See Also: Transformer Test, Transformer Testers, Current Transformer Test
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Product
Current Transformer Test Set
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Vanguard Instruments Company, Inc.
The EZCT-2000C is Vanguard’s third-generation microprocessor-based current transformer test set. Designed specifically for CT testing, the EZCT-2000C has the following outstanding features that can greatly increase productivity and save time during the commissioning stage:
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Product
20 Amp Current Transformer Burden Test Set
1044A
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Due to overwhelming demand, TESCO is pleased to re-introduce the 1044A 20 Amp Current Transformer Burden Test Set. This light weight, hand held unit is a simple and inexpensive means whereby a current transformer installation may be quickly checked for many sources of trouble. The 1044A provides utilities a less expensive and more traditional option for checking larger services for potential meter circuit related issues.
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Product
Current Transformer Field Test Set
1043
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The Catalog 1043 Current Transformer Field Test Set is a simple and inexpensive means whereby a current transformer installation may be quickly checked for many sources of trouble. The tests are made without interrupting the Customer's service and while the load is on.
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Product
Primary Current Injection Test Set
T 2000
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T 2000 is a portable current transformer test set which allows to perform many different measurements such as saturation, ratio and polarity tests and CT winding resistance test. Substation maintenance and commissioning test equipment, T 2000 is extremely appreciated by electrical engineers for its high accuracy and portability.
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Product
Transformer Testing Equipment
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Offering you a complete choice of products which include Automatic Transformer Turns Ratio Instruments (ATRI- 3), Automatic Transformer Turns Ratio Instrument (ATRI-201), VTRI-2000 ( Transformer turns ratio instrument ), Current Transformer Test Set (CTC-1), Potential Transformer Tester ( PT Tester ) and Current Transformer Tester ( CT Tester ).
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Product
Current Transformers Test Set
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Supreme Instrument Laboratories
The basic unit is sensitive magnetic comparator and also it incorporates electronic null detector to facilitate the balance. The reference Current 5A. or IA. obtained from Standard Current Transformer and in comparison to that the vector length and phase displacement is measured. The ratio error in percentage and phase displacement in minutes are directly compared and indicated on dials.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Brute High Current Probe
P4301-1W
High Current Probe
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Product
Test Workflow Pro
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
High-Voltage Differential Probe, 100 MHz
N2790A
High Current Probe
Use the N2790A 100-MHz high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2790A probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to 1,400 V of differential voltage and 1,000 V of common mode voltage.
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Product
N2782B AC / DC Current Probe, 50 MHz, 30 Arms
N2782B
High Current Probe
The N2782B current probe is an accurate and reliable solution for measuring AC and DC currents. Using a hybrid technology that includes a Hall effect sensor and an AC current transformer, the probe provides accurate measurement of DC or AC currents up to 30 Arms continuous.
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Product
NI-9266, 8-Channel C Series Current Output Module
785047-01
Current Output Module
8-Channel C Series Current Output Module - The NI‑9266 is ideal for interfacing and controlling industrial current-driven actuators. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing outputs to ensure safety and avoid driving actuators at system power on. The NI‑9266 includes channel‑to‑earth ground isolation for safety and noise immunity.
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Product
sbRIO-9207, Non-Enclosed, 500 S/s, 16-Channel C Series Voltage and Current Input Module
781069-01
Current Input Module
Non-Enclosed, 500 S/s, 16-Channel C Series Voltage and Current Input Module - The sbRIO‑9207 is a combination voltage and current input module designed with industrial systems in mind. It features eight current and eight voltage input channels, with built-in noise rejection. Non-enclosed modules are designed for OEM applications.
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Product
High Current Probes
High Current Probe
*Low internal resistance to minimize arching*PogoPlus bias ball design*High current optimized base material and plating*Higher temperature spring design*Specialized high current tip geometry
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
CP500X, 500 MHz, ±60 V, 10X Attenuation, Single-Ended Passive Oscilloscope Probe
784253-01
High Current Probe
The CP500X is a coaxial passive probe with fixed 10X attenuation for oscilloscopes that provide 1 MΩ input impedance. It is 1 meter in length. The CP500X attaches to BNC connections on both the signal input and instrument sides.
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Product
400 MHz High Voltage Differential Probe
DP0001A
High Current Probe
The DP0001A is a 400 MHz high voltage differential probe with 2 kV mains isolated or 1 kV CAT III rating designed for making accurate high-voltage power measurements required for testing today’s WBG power devices, power converters or motor drives.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
NI-9266, 8-Channel C Series Current Output Module
785047-02
Current Output Module
8-Channel C Series Current Output Module - The NI‑9266 is ideal for interfacing and controlling industrial current-driven actuators. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing outputs to ensure safety and avoid driving actuators at system power on. The NI‑9266 includes channel‑to‑earth ground isolation for safety and noise immunity.
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Standard - 22.08 (626.00) - 220.80 (6259.60) Godzilla High Current Probe
HC500F
High Current Probe
Current Rating (Amps): 150Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 260Full Travel (mm): 6.60Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,215Overall Length (mm): 81.66
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Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
Test Platform
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
