Functional Test Systems
See Also: Functional Test, Functional ATE
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Function Generator
FG-274
* Output Waveforms of Sine, Square, Triangle and Pulse.* The design of DDS and FPGA technology provide high quality waveforms.* High frequency stability and accuracy: 20ppm.* Low Distortion at -55dBc.* Wide output frequency range: 4MHz* Maximum frequency resolution of full range: 100mHz.* TTL/CMOS output* Variable DC offset control* Variable Duty ratio control* Output overload protection* Store/Recall function
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AUTOMATIC WINDING TEST SYSTEM
VE9036SU
6 CHANNEL Microprocessor based Automatic Test System for Automobile Coils, Magnetos, Alternator, Motor Winding. Can Test : Impulse Winding Tester (IW), AC/DC HiPot, Insulation Resistance (IR), Inductance (L), DC Resistance (DCR)
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Circuit Breaker Test System
TDR900
It operates and records a circuit breaker’s contact timing, motion, velocity, main contact engagement & synchronization, trip and close coil initiation and currents.
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PXI - Test System
We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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Function / Arbitrary Waveform Generator
DG2000 Series
With frequencies up to 100 MHz, 16Bit Resolution, and arbitrary waveforms of up to 16 Mpts the DG2000 reproduces any waveform with high signal fidelity. SiFi II adds additional filtering capabilities making this one of the most flexible generators on the market.
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Electrodynamic Vibration Test Systems
DC-series
Depending on the reference PSD or other operating conditions such as the specimen, one part of the controlled response may deviate from the reference PSD
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Multi Functional VME Logic Module
MDGG-8
The MDGG-8 is a single wide 6U VME multi functional FPGA based delay logic and timing module which provides often needed functions as gate, delay & pulse generator, logic fan in – fan out, coincidence register and scaler / pre-scaler.
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Automatic System Function Tester
3260
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing at the system level.
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Portable System for High-Boltage Solid Dielectrics Testing
HVTS-70/50
Portable system HVTS-70/50 is designed for carrying out high-voltage withstand testing of cable insulation and other solid dielectrics with DC (rectified) voltage up to 70 kV and AC voltage up to 50 kV RMS at industrial frequency (f = 50 Hz).
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SIP-90-3 Test System Interface Probe
SIP-90-3
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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AVL Battery Test Systems
In modern electrified powertrains (xEVs), huge demands are placed on batteries. These electrochemical energy storage and conversion devices must meet market requirements such as long-lasting high power and energy performance, and dynamic charge and discharge processes.
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50MHz Arbitrary Waveform/ Function Generator
Model 645
Berkeley Nucleonics Corporation
The BNC Model 645 50MHz Function/Arbitrary Waveform Generator delivers many advanced features and user modes than our previous models, with a price that is designed to meet tough economic constraints. New DDS+ technology embraces advancements in the semiconductor industry and leverages state-of-the-art components for both standard and complex functions. The resulting design is a box for every bench, far more capable than the ARBs and Function Generators of the past. We have even incorporated IP support, so a web browser can control the instrument over LAN.
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Battery Test Systems
Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10
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FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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BMS Test System
6020
High Extensibility: for multi-string battery cell, 4 cells per channel, expandable from 1 to 16 cells per strings
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Portable System for High-Voltage Solid Dielectrics Testing
HVT-70/50
Portable system HVT-70/50 is designed for carrying out high-voltage withstand testing of cable insulation and other solid dielectrics with DC (rectified) voltage up to 70 kV and AC voltage up to 50 kV RMS at industrial frequency (f = 50 Hz).
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Vibration Test Chamber Elevator Mechanism System
Guangdong Test EQ Equipment co., Ltd.
- Structural Design: Monolithic construction with seamless TIG welding for durability and aesthetics. Lever-driven door lock mechanism.- Smart Control System: Features a Chinese/English-language color LCD touchscreen HMI + high-performance PLC, powered by TESTEQ's proprietary software for automated, intelligent, and user-friendly operation.- Energy Efficiency: Incorporates TESTEQ's patented "Static Balance" technology, reducing energy consumption by over 30% during low-temperature stabilization.- Vibration Integration: Elevator Mechanism: Wireless remote-controlled for alignment with horizontal/vertical vibration platforms.- Advanced Sealing: Custom flexible connectors ensure airtight integration between temperature/humidity chambers and vibration platforms.
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Test System
Griffin III
The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Function / Arbitrary Waveform Generator
DG1000Z Series
DG1000Z series function / arbitrary waveform generator is a multi-functional signal generator which integrates function generator, arbitrary waveform generator, noise generator, pulse generator, harmonic generator, analog / digital modulator, frequency meter and other functions.
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Vibration Testing System
Wewon Environmental Chambers Co, Ltd.
Vibration Testing is performed to determine if a product can withstand the rigors of its intended use.
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Geophone Testing – Hydrophone Testing – Vibrator TestingVersatile Quality Control System - Three Test Units In One!
Bird Dog 3 - 3 Channels
*32-bit, high speed, ADC chip for lower noise and increased accuracy*Three different operation with a single unit*8 Gigabytes of Data Storage, Expandable to 16*GPS based time and location saved for every record*Stable and rugged unit for use in all conditions*Three-Component Test Mode, checks 3 elements at onceto save time and effort*All test data saved in non-volatile memory for later download and retrieval*Connects to PC via Ethernet or optional Wi-Fi, provides control, data download and real time display and analysis of data and results
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30 MHz Function / Arbitrary Waveform Generator
DS345
Stanford Research Systems, Inc.
The DS345 Function Generator is a full-featured, 30 MHz instrument that uses an innovative Direct Digital Synthesis (DDS) architecture.
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Test Automation System
RT-Tester
Verified Systems International GMBH
Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
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High-Speed Transformer Test System
DU-7211
Delta United Instrument Co., Ltd.
Inductance, Q factor, Leakage Inductance, AC Resistance, Capacitance, DC Resistance, Balance,Turn ratio, Open/Short check
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Semiconductor Functional Verification Tools
Trek5
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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LED Power Driver Test System
Chroma C8000
Chroma Systems Solutions, Inc.
The Chroma 8491 ATS is equipped with optimized standard test items for LED driver testing (lighting & TV backlight). The user is only required to define the test conditions and specifications for the standard test items to perform the test.
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Function Generator
FG-52
*0.05Hz ~ 5MHz FUNCTION GENERATOR*LINEAR / LOG SWEEP FUNCTION*DUTY CYCLE COUNTROL*INVERT FUNCTION*AUTO RANGE AUTO GATETIME COUNTER*0.001Hz COUNTER RESOLUTION
