LIV
Light Intensity current Voltage laser diode test.
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AMIDA VCSEL Tester
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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PXIe Short SMU
52403P
Chroma's 52403P is a PXI Express Short Pulse SMU (Source/Measure Unit) designed for fast, precise and reliable sourcing and measurement of thermo-sensitive devices such as high-power laser diodes (LD). Integrating a high-speed pulser, a high precision SMU and a DAQ module into a single PXIe SMU, the 52403P can measure both the LIV and the low-level leakage current of a high-power LDs.
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Laser Diode Light Current Voltage (LIV) Test Instruments
The Yelo LIV test instrument allows LIV measurements to be taken from laser devices loaded into a Yelo module. This module can also be used with the Yelo Y1000L Low Power Burn-in system. The LIV test instrument has been designed for easy operation. Once powered on, and with laser supply enabled, the touch screen can be used to initiate, monitor and review measurements of laser devices.
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Automated Optical Inspection
AOI
No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
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LIV – High-power Laser Diode Testing
An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or laser IV curve. By applying increasing current to the laser diode so it that emits light, the optical output is measured together with the voltage drop across the diode element. The resulting LIV curve reveals important clues about the quality of manufacture and the performance of the laser diode, enabling a pass/fail decision to be met.
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Laser Diode Characterization Testing
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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LASER DIODE TESTER
LASER DIODE TESTER LD-607 Basic Functions LIV curve test. LD horizontal and vertical test. LD Spectrum test
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PCI Smart Bus Extenders
Live Insertion PCI Bus Extenders
The Ultraview PCIEXT64 extender series offers excellent PCI signal integrity, due to high speed trace layout, including high impedance signal traces and minimal ground inductance, as well as active bus isolation, to ensure minimal effect on the board-under-test. Power monitoring and current limiting features allow a robust debug and test environment. The capabilities of Ultraview's two models of Universal 66/33MHz 64/32-bit PCI extenders are as follows:
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Analysis In Real Time
Live Analyzer
Vibration Research Corporation
With Live Analyzer, you don’t have to wait until post-process to begin data analysis. View data in real-time and then pause the live stream to select, analyze, and export a section of the time waveform. Access the ObserVIEW graphing packages, employ averaging, analyze tachometer channels, and more.
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Java, .Net, or PHP apps Release Automation
LiveRebel
Release multiple applications onto their environments, at once Hotpatching is deprecated and will be supported in 3.0.x only JetBrains TeamCity is now officially supported
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Hardware Versatility
Live Fatigue Analysis
Vibration Research Corporation
With Fatigue Damage Spectrum, calculate the amount of fatigue your product will experience in a lifetime. Then, monitor your test as it is running to determine how long it will take for the product to arrive at the lifetime of accumulated fatigue. The hardware provides the length of time to reach fatigue in each axis.
