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Broadband Test
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Broadband
The UNH-IOL is the industry's leader in testing broadband systems and equipment. Working closely with service providers, equipment manufacturers, and the Broadband Forum, we have spent the last 15 years developing extensive testing coverage for DSL, GPON, TR-069, and IPv6. Our broadband testing can help ensure your products and services meet your customers' expectations with the highest quality possible.
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DSL/Gfast Test Software
Test Sentinel is a full suite of automated DSL and Gfast tools that allow a user to easily perform experiments and run standardized testing. This is the same set of tools used in our DSL and Gfast Testing Services to perform a wide variety of requests including Broadband Forum standardized tests and the Broadband Forum Gfast Certification.
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RF And Microwave Modules
Unlike specialized RF and microwave module product suppliers, Shengbo Technology has accumulated rich experience in designing and developing broadband microwave test products. As a sophisticated RF and microwave test system, a large number of high-performance RF and microwave modules are required for system integration. To this end, we have conducted in-depth research.
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2.0 ~ 68.0 Gb/s Pulse Pattern Generator
CA9809
The UC INSTRUEMNTS CA9809 2.0 ~ 68.0 Gb/s Pulse Pattern Generator pulse pattern generator and error detector is a high performance, flexible and costeffective broad band data rate covered Pulse Pattern Generator that can operate from 2.0 Gb/s to 68 Gb/s. The CA9809 can be used with existing equipment to generate higher rate bit streams for use in telecom applications up to 68 Gb/s. Broadband test systems will benefit from the low power dissipation, precision connectors, and excellent output waveform characteristics. The compact size of the equipment allows the CA9809 to be placed at the measurement plane, reducing or eliminating artifacts related to long cables.
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Serializer/Deserializers & Selector Muxes
Serializer/Deserializer muxes use both rising and falling edges of the clock to serialize the data from parallel inputs to serial output while demuxes deserialize the data from its serial input to parallel outputs. Selector muxes routes the differential inputs to either one or more of the desired outputs upon assertion of the appropriately selected port. Muxes can be used in various applications including High Data Rate Ethernet, Fiber Communication, Signal Routing and Broadband Test & Measurement Equipment.
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TEM Cells
Transverse Electro Magnetic (TEM) cell or Crawford cell (named after its inventor) is used to generate accurate electromagnetic waves over a wide frequency range: DC (0 Hz) to GHz., EM waves generated in the cell propagate in transverse mode and have the same characteristics as a plane wave. It can be used to calibrate E-field broadband probes for testing radiated E-field immunity as well as for measuring radiated emission from a product with a spectrum analyzer/EMI receiver.TEM cell generates a consistent electromagnetic field for testing small RF devices such as wireless pagers, receivers, portable phones, etc.
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Clock Generation Devices
Analog Devices offers ultralow jitter clock generation products for wireless infrastructure, instrumentation, broadband, automatic test equipment, and other applications demanding subpicosecond performance. Our clock products are ideal for generating the high speed, low noise clock signals required to clock high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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Broadband Test
458-3SLB
This compact, versatile unit accepts 1, 2 or 3 line modules or other products that use Telebyte's convenient line module form factor. At home in the lab or a high-volume production environment, it is capable of controlling from 1 - 24 channels and is ideal for testing DSL modems and other bandwidth-compliant telecom devices. While it can be used as a stand-alone unit, the built-in Control Module interfaces with a PC via RS-232, IEEE-488, or Ethernet. In addition, the 458 Universal GUI (included with purchase) may be used to control the unit from a PC. For added convenience, the Control Module firmware is field-upgradeable through the RS-232 port.
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Broadband Network Test
Whether testing via Voice Switch, DSLAM, OLT or external access device, Enghouse LoopCare comprehensively manages testing in mixed technology networks.
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Vibration Table Top, series
OVTT 24
The OVTT, OmniAxial Vibration Table Top, series introduced the first stand-alone, compact, repetitive-shock vibration system on the market and features Qualmark's patented six-degree-of freedom vibration technology. The OVTT24 system provides 77% more table surface area than the OVTT 18 which makes it an ideal tool for in-production-line, broadband spectrum vibration testing of product. It is also ideal for quick evaluation of field returns, repair verification and random vibration testing of multiple small products and can be configured for placement inside a thermal chamber for combined stress tests.
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Active biconical Antennas
BicoLOG X Series
Only a single broadband test antenna for the complete frequency range from 20MHz up to 3GHz. Optimal for usage with spectrum analysers for EMC measurement. Active Antennas with high gain up to 41dBi.
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Microwave Power Amplifier 10W 100 MHz to 20 GHz
GT-1000B
The Spanawave GT-1000B Microwave Power Amplifier offers linear high-power amplification across multi-octave bands. It is ideal for testing in EMC, wireless communications applications and Defense EW systems. For EMI/EMC and standards laboratories, the GT-1000B with 100 MHz to 20 GHz frequency range allows broadband testing without band switching or swapping narrow band amplifiers resulting in faster and more accurate testing.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Custom Test System Solutions
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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ADAS Test
Advanced driver assistance systems (ADAS) are introducing new technology into vehicles. They demand test systems that are adaptable and future-proof, so they can integrate all the technology used today and be ready for whatever tomorrow brings.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
