Broadband Test
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Prototyping & Test Consulting Services Solutions
test
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
6TL08 Benchtop Test Platform
H710008
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Amplifier Systems Broadband
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Systems are complete. They plug into an outlet and are ready to go. Our standard systems are 3U, which is 5.25″ and 5U, 8.75″. Systems are available with or without IEEE-488, RS-232 and Ethernet connectivity. Amplifiers Systems are available in both Broadband and Band-Specific frequencies. We are well-known in the industry for successfully adapting our amplifiers or custom designing new solutions to suit each unique project. Please refer to our Adapted & Custom Design Solutions link to begin formulating your performance objectives and other criteria.
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Broadband Current Probes
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Conducted currents can be measured without making direct contact with the source conductor or metallic surface by means of clamp-on broadband current probes. The BCP-5xx EMC Current Probes are designed to permit field intensity meters, spectrum analyzers, and other 50W impedance instruments to measure quantitative magnitudes of current.
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Product
SSPAs / LNAs / Broadband
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SSPAs based on the latest Galium Nitride (GaN) technology offer the best combination of high peak powers, high reliability, high efficiency, and soft degradation. High efficiency and high power are hallmarks of GaN technology, enabling SSPAs to challenge traditional tube-based amplifiers across the design spectrum. In addition the long lifetime from these devices, combined with the gradual degradation should individual devices fail, provide unparalleled service lifetime. Techniques such as bias modulation and linearization provide even better prime-power efficiency while still meeting the demanding requirements of pulsed or CW applications.
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
Logarithmic Periodic Broadband Antennas
Standard LPDA
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Is a demountable logarithmic- periodic broadband Antenna (LPDA). For transport and space saving storage, it is delivered with fast links. The fast links allow to demount the rear elements within a few seconds without any tools.
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Product
Broadband Coaxial Noise Sources
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Our integrated noise modules contain all the required biasing circuitry and only need a positive voltage to activate for an easy installation. Since they typically do not contain amplification, the raw noise output from the diode is seen at the output of the module resulting in a maximum ENR of approximately 35dB. Primary applications include system built-in test and laboratory use.
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Product
Optical Tables with Broadband Damping
5100 Series
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The 5100 Series features 3/16″ thick ferromagnetic stainless steel top and bottom skins, precision honeycomb construction, our patented SPILLPRUF spill management system, and broadband damping for excellent vibration absorption.Table lengths up to 20′Widths to 6′Thicknesses to 36″We love custom tables! Choose welded splice plates for extra long, wide, and “L”, “T”, or “U” shaped tables. Let us know your unique requirements and we will make it happen!All our optical tables may be paired with Active-Air or Passive-Air vibration isolators, or modular rigid supports, sold separately.
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Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Broadband Dielectric Spectroscopy
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Material Sensing & Instrumentation
Broadband Dielectric Spectroscopy is a powerful tool for investigating a variety of dielectric processes for both electrical and non-electrical applications. Also called Impedance Spectroscopy, the measurement separates molecular process on the basis of response time, providing a unique relaxation frequency along with a signature variation with frequency.
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Load Testing vs. Stress Testing
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A load test is a planned test to perform a specified number of requests to a system in order to test the functionality of the system under specific levels of simultaneous requests. A load test ensures that a web system is capable of handling an expected volume of traffic, and therefore is sometimes referred to as volume testing. The goal of a load test is to prove that a system can handle the expected volume with minimal to acceptable performance degradation. The threshold of acceptable performance degradation must be defined by the testers as some value considered acceptable to the end user so that users will not bounce from the site.
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Broadband Antenna
OBDR
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Broad frequency range, ideal for complementing RF test enclosures in various test setups
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Product
Telecoms Testing
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KTL offers an extensive range of telecoms testing services, wired and wireless, for voluntary and regulatory markets worldwide. Conformance services are complemented by interoperability telecoms testing and by our commitment to provide market access through procurement specification testing.KTL provides telecoms testing to customer specific requirements and, as an independent third party test laboratory.
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Product
Leakage Test
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Leakage current and discharge current depend on the insulation of the device. The measurement simulates various fault situations that could occur during operation. The test determines whether the measured current is within the permissible limits and poses no danger to the user in case of a fault.
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Test Solution
Eye-BERT MicroX
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The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Product
Test Adapter
Ramcheck 100
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This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price.
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Automation Testing
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Automated tests require a short execution time and let you avoid unwanted delays. Day or night, your automated tests will run around the clock. As a result of automation, you get a faster time to market. We automate thousands of simultaneous manual tests maximizing test coverage, and letting you lower the costs of testing in the long run.
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Broadband Detectors
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These waveguide bandwidth detectors use silicon beam lead diodes on a planar stripline circuit to obtain an extremely rugged and compact device. Most millimeter wave broadband detectors have very poor VSWR due to the difficulty in obtaining a good wideband impedance match to the diode. To overcome this problem, these detectors utilize two diodes and an internal matched termination and 3 dB hybrid as shown below. This circuit allows a VSWR of 2.0 or better over a full waveguide bandwidth for most of these detectors. Detectors for waveguides WR-8 and smaller use a single zero bias GaAs diode. The high sensitivity zero bias GaAs diodes can also be special ordered for use at lower frequencies when highest sensitivity is required.
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Test Antennas
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Lumistar provides small, lightweight portable fixed antennas for Test applications. They are available in lower L thru S bands for transmit and receive applications.
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Product
Temperature shock test chambers test
TSS series
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The operating principle of Schocktestprfschrank based of two superposed test rooms (top hot chamber, cold chamber below), between which a car with the test specimens is moved up and down by the large thermal shock test equipment may be subjected
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Product
EMC Testing
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KTL facilities support a wide range of accredited Electro Magnetic Compatibility (EMC) and wireless testing services. Our experienced staff can assist with all EMC requirements for compliance testing to European and international standards, and can advise on pre-compliance investigative testing, which is invaluable in product development.
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Product
Circuit Testing
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Circuit testing is generally the first diagnostics performed on an electronic device that has stopped working. Circuit testing determines whether electrical current can travel through a circuit. Resistance, measured in ohms, is the measure of the resistance in a circuit.
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Weld Testing
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Supports industries such as Aerospace, Nuclear, Automotive, Commercial Fabrication etc.Welding procedure consultancy and approvalWelder qualification test and codingWelding procedure certificationWelder performance qualificationOn site welding invigilationOffers a complete range of destructive and non-destructive testing facilities.Responsible Welding Co-ordinators available for customer supportCAA Weld Specimen SignatoriesCSWIP Approved Inspectors
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Test System
4003 TLP+™
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The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Microwave Testing
40A
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The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
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Test Prods
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Test prod with 4mm plug, test prod with 2mm pin, safety test prod, test prod 2mm, test prod 4mm, miniature test prod.
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Product
Broadband VNA Operation To 220 GHz
S93301B
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Configure a 220 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs
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Product
Test Leads
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PMK Mess- und Kommunikationstechnik GmbH
It is used to test and measure the current in a circuit. These are simple devices which are coated and colored to indicate positive and negative with the device connector on one end.
