Highly Accelerated Life Test
Processes a product through extreme temperature, vibration and product tailored stresses to expose design limits.
See Also: HALT
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Product
UV Accelerated Weathering Testers
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Dongguan Amade Instruments Technology Co., Ltd
UV accelerated weather tester is also well known as UV test chamber, which is a type of environmental test chamber using fluorescent UV as light source to determine the resistance of plastics, leathers, rubbers, fabrics and so on to weathering under the specified conditions. We know that Ultraviolet light only accounts for 7% of the total sunlight, but it plays a core role in deterioration of materials. Not only does the ultraviolet, but UV test machine also can simulate dewing, high temperature, high humidity, black environment to be reappeared as a circulation. So UV weathering test is an essential measure for people to research and know the degradation state of specimens in advance as the time goes on.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
UV Accelerated Weathering Tester
TF424
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TESTEX Testing Equipment Systems Ltd.
UV Accelerated Weathering Tester, age tester, to simulate the testing environment of sunlight, rain, and dew to reproduce the effect of sunlight with fluorescent ultraviolet lamps, providing rain and dew with condensing humidity. The aging of the specimens is accelerated by exposing the samples to alternating cycles of light and moisture at a certain temperature.
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Product
Long Life Serismic Energy Source
2800LLX
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Bolt introduced the LONG-LIFE air gun in 1992. Since then it has become the standard energy source for marine seismic exploration.
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Product
High Core Density 2U Network Appliance With Security And Acceleration Features Ready. Ideal For Network Security And Crypto Acceleration Workloads.
FWA-6080
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Single AMD EPYC™ 7003 Processors, up to 64 Cores16 x DDR4 ECC RDIMM slotsHot-swap 2.5" disk bays and system fan, redundant PSU, 2 x HH/HL Gen4 PCIe x16 slotIntegrated security features with secure boot, memory encryption, and virtualizationIPMI v2.0 compliant, with web interface8 x Advantech network module expansions w/ PCIe Gen4 bandwidth
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Product
Laser Diode Burn-in Reliability Test System
58604
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The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Network Interface & Acceleration Cards
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Advantech's PCIe accelerators and network interface cards bring high-speed connectivity and fast packet processing to network appliances and servers.
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Product
Accelerate Semiconductor Development With IP-Centric Design
MethodicsIPLM
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Methodics IPLM provides a scalable IP lifecycle management platform that tracks IP and its metadata across projects, providing end-to-end traceability and enabling effortless IP reuse. Learn more by connecting with an IP expert today.
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Product
Conformance Test System
TS-RRM
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The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Product
SKYvec: Accelerates Software Development
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The SKYvec software development tools simplify code development for large multiprocessor systems by automating many of the processes which otherwise would have to be designed or managed by the programmer.
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Product
GS1 Acceleration Sensor
AGS11351
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Panasonic Industrial Devices Sales Company of America
GS1 Acceleration Sensor
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Product
PCIe Based FPGA Processing / Acceleration Card
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iWave’s PCIe based FPGA Processing / Acceleration Card is a half-length PCIe x4 card featuring a high-performance user-configurable Xilinx® Kintex®-7 FPGA enhanced with high-speed memory and a high-throughput serial interface. Front I/O adds dual SFP ports, 1x HDMI1.4a IN, 1x HDMI1.4a OUT. All of these features combine to make the card ideal for a wide range of applications such as Edge Computing, ARINC818 Avionics Video Bus, Acceleration.
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Product
Lens Module Test Platform
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The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
ESD Test System
58154 Series
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ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Scienlab Battery Test System — Cell Level
SL1002A
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Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Power Cycling Semiconductor Life Test System
ITC52300
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The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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Product
Acceleration Simulation Mode Roller Set for Vehicles with a Single Driven Axle
ASM-BF/1 | VP 230043
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Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-BF/1 roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97.
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Product
Digital Test Instrumentation
EDigital-Series™
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Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
Highly Collimated Solar Simulators
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This solar simulator is based on a Fresnel lens to collimate the light beam from the arc lamp source to infinity, which results in highly collimated illumination of the target spot. A 2.5kW xenon ozone free lamp is used as the light source. The spectral distribution of the xenon light source, along with the use of specially calibrated AirMass filters, closely simulates the sun’s true spectral distribution in various conditions on Earth.
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Product
Test Handler
M6242
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Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
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The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Product
6TL08 Benchtop Test Platform
H710008
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Test System for High Volume Production Testing of Integrated Circuits
ETS-364
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The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
Linear Accelerators
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The latest interlaced dual-energy technology offers improved material discrimination, with an option to alternate X-ray energies on a pulse-to-pulse basis.
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Test Fixture and Test Programing
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Landrex Technologies Co., Ltd.
Test Fixture and Test Programing
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Product
NFC Conformance Test System
T3111S
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The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
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The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
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Product
PCIe 5.0 Test Platform
PXP-500A
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The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Built-To-Print Cable Assemblies For Highly Technical Specifications
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Our engineering and production teams fully recognize the need to stay on the forefront of the latest in technology and materials. Our commitment to product advancement gives our customers a distinct advantage in solving challenges to their applications. Teledyne Storm Microwave focuses on all phases of design, testing and manufacturing to achieve the finest tailored products to meet our customers' needs.
