System Under Test
tries inter, extra and intra interoperability. Also known as: SUT
See Also: EUT, Unit Under Test, UUT
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Product
Flash Programming for Functional Test Systems
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Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Product
Device Thermal Test Systems
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Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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Product
Optics Test Systems
Front Window Scanner For Wedge Angle Measurement
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Optik Elektronik Gerätetechnik GmbH
Scanning of complete automotive windshields to measure the wedge angle and thickness change, especially in the HUD area.
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Product
Parallel Test Systems
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Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Product
Backplane Test System
402HV
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Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Product
Test Systems Integration
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Highly flexible test solutions that are cost effective offering basic tests that easily adapts to high product volumes and complicated tests. Mobile computer based test stations provide a wide variety of test solutions at efficient costs.
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Product
Automatic Safety Test System
LS9955/56
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The LS9955/LS9956 Automatic Safety Test System is according to GB4706.1, IEC/EN60335-1, UL60335, GB7000, IEC60598, GB4943, IEC60950 and GB9706.1. It used for luminaries, home application and motor tools safety test in production line or Lab R&D.
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Product
Low Voltage Test System
CKT T1
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The CKT T1 is a compact size solid-state test system featuring 128 test points.
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Product
Tire and Wheel Testing Systems
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Advanced Telemetrics International
Tire and Wheel Testing Systems can be custom designed and manufactured for practically any application. The inductively powered system is used to wirelessly measure tire pressure and temperature during testing.
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Product
Electrodynamic Vibration Test Systems
A-series
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A wider range of test requirements and higher test specifications.A-series meets the needs for such a versatile test environment.Advanced automatic energy saving, high level of functionality and a protected test environment.
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Product
MMIs for Test and System Integration
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Laying out a custom PCB is too time consuming and costly for most rush projects. Pulse Research Lab has developed Mini Modular Instruments ™ to provide cost effective solutions to the most common engineering challenges.
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Product
Mezzanine System
5181 MMS ECM
System
ECM P/N 5181 uses TI TLV320AIC23 high resolution audio codecs to provide two channels of Audio input and two channels of Audio output. Each input channel consists of two inputs a left and a right, and each output channel consists of two outputs left and right. The outputs are muteable.
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Product
Test System
Series 4x
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The 4x is the next generation test system for discrete semiconductors. Designed with high volume production in mind, the system is also ideal for incoming or general purpose test applications.
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Microtester Test Systems
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With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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Product
Electrolyzer Test Systems
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Advanced Test System for Research & Development of PEM Electrolyzers
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Product
System Tests Radar Pulse Stability
PN9002
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Noise eXtended Technologies S.A.S.
The cost-effective PN9002 test simplifies the testing and analysis of pulse-to-pulse amplitude and phase stability for radar systems and components to 18GHz.
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Product
In-Line Full Automatic Testing System
ALMAX
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Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Swept Test System For Optical Components
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measurement platform for optical components with a fastscan speed, high resolution and accuracy. The systemcombinesour tunable lasers, polarization controller, power meter and software.
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Product
16-Station Testing System
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The ElectroPuls 16-Station testing system performs high cycle fatigue testing on multiple samples simultaneously, with a fatigue-rated load cell included on each station. The fixture uses a carousel designed with high stiffness and low mass to enable high frequency testing and reduce test time.
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Product
High Performance EV Battery Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
The 6V series battery test system uses a full-bridge circuit topology with a higher digit sampling chip. It can provide higher precision and more dynamic test data, and can provide a complete test program for mainstream lithium-ion batteries and batteries with a variety of material systems such as sodium batteries.
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Product
Mobile Measuring & Testing Systems
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Individual testing tasks for technical plants and large machines often require the use of a large number of measuring instruments on site, which are difficult to network with each other and which, in the case of complex measurements, require a lot of experience and time in operating the measuring equipment and analysing the recorded measured values. The applications and possible uses can be quite different:
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Product
High Voltage Cable/Harness Test System
CKT1175-50
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The CKT1175-50 is a high-voltage wiring analysis system that features a switching matrix that can be distributed around the workshop or in and around the assembly to be tested. This system is expandable in 100 or 150 test point increments to 96,000 test points, and is available with a variety of adapter cable interface connectors, with the standard being the CKT MAC interface system
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Product
Digital Interconnect Test System, Reference Solution
Test System
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Product
Electroluminescence Test Systems
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The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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Product
Accelerated Life Test Systems
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Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Product
Wireless Test System
WTS-80
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CETECOM offers a wide range of services and solutions to help companies develop and execute product testing plans to determine a product’s compliance status and master the increasingly complex regulatory issues of the international market.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
