Loop Impedance Test
See Also: Impedance Testers
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Product
Bottom Electrode SMD Test Fixture
16198A
Test Fixture
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
Loop Testing
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Megger loop testers offer both traditional measuring techniques and state of the art “non-RCD Tripping” technology. Use these products to determine the prospective earth fault current, which is the maximum current able to flow in a phase-earth fault in an installation, and also to indicate the prospective short circuit current which is the maximum current able to flow in the event of a phase-neutral fault.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
Test Port Cable
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
Controlled impedance test system
CITS900s4
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CITS900s4 is the seventh generation of Impedance test system from polar, and typically the most popular model for customers who are new to impedance control. CITS900s4 provides both differential and single ended measurement capability along with 4 channels to provide flexible probe connection.
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Product
Overhead Line & Cable Impedance Test Sets
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T&R Test Equipment Overhead Line & Cable Impedance Test Sets
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Product
Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
Loop Antennas
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A.H. Systems' designs, manufactures and delivers high performance Loop Antennas for a wide range of magnetic field testing. Whether used in a set to measure shielding effectiveness per MIL-STD 285 and NSA 65-6 or individually to satisfy specific requirements,
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Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
Battery Impedance Tester
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Weshine Electric Manufacturing Co., Ltd
The DC test method is adopted to simulate the actual use of the battery in a real and objective way, which can effectively eliminate the hidden dangers such as deficiency, deficiency and connection failure between batteries while measuring the internal resistance of the battery.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
HTOL Test Systems
Test System
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Product
Impedance Analyzers
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The E4990A Impedance Analyzer with a frequency range of 20 Hz to 120 MHz provides an industry best 0.045% (typ.) basic accuracy over a wide impedance range, with a 40 V built-in DC bias source.
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Product
Functional Test Fixtures
Test Fixture
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
SMD Array Type LCR Test Fixture
16034H
Test Fixture
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Product
Impedance meters
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Electronic components meters for circuit verification in laboratories, technical schools and technical support centres.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
Impedance Stabilization Network
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Beijing KeHuan Century EMC Technology Co,.LTD
KH8158 is a device for measuring the common mode interference voltage of unshielded twisted pair cables. Cable testing according to CISPR 16-1-2. The equipment under test (EuT) and auxiliary equipment (AE) are directly connected to the corresponding ports. The port adopts RJ-45 socket (the distribution conforms to T568A/B.) This equipment is divided into three specifications: CAT3, CAT5, and CAT6, and the corresponding equipment is selected according to the cable model.
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Product
System for Determination of Materials Impedance in Impedance Tubes
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System for determination of materials impedance in impedance tubes is used for evaluation of material’s acoustic properties.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Impedance Analyzer, 1MHz to 500 MHz/1 GHz/3 GHz
E4991B
Impedance Analyzer
The E4991B Impedance Analyzer has a frequency range of 1 MHz to 3 GHz. The E4991B provides 0.65% basic accuracy over a wide impedance range with a 40 V built-in DC bias source (Option 001). The equivalent circuit analysis function supports seven different multi-parameter models and helps you to simulate your own equivalent parameter values of components.
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Product
High Current Short Circuit Loop Impedance Meter
AMZC-310S
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Measurement of very small short-circuit loop impedances (with resolution of 0,1mΩ) using the current of 150A under 230V, maximum 280A under 440V, or measurement using the current of 23A under 230V, maximum 42A under 440V
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Product
Loop Meter
MZC-310S
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The MZC-310S is a professional portable meter for testing electrical installations with over-current circuit breakers. The instrument measures short-circuit L-PE, L-N and L-L loop and prospective short-circuit loop current. A measurements can be done either with low testing current (up to 42A) with 2-pole method or high testing current (up to 280A) with 4-pole method that enables measurements with very high accuracy and resolution.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
VXI Digital Test Instrument
T940 Series
Test Instrument
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
High Impedance Probes
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Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
