PXI Functional Test
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Product
PXI Platform
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The ruggedized enclosure provides an environmentally conditioned environment for rack mounted PXI equipment. Supports rack mounted PXI chassis. Hermetically Sealed case isolates PXI equipment from hostile environments as specified for military applications. The sealed enclosure allows the system designer to select any of the full line of PXI products without the need to Conformal Coat the cards/components. With the conditioned internal environment, there is no need to select PXI products which operate at an extended temperature range.
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Product
Functional Near-Infrared Spectroscopy System For Research
LABNIRS
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Just how the human brain functions remains one of the greatest unsolved puzzles. To solve this mystery, brain-function imaging for visualization of brain functions has developed rapidly in recent years. In particular, in vivo optical imaging by functional near-infrared spectroscopy (fNIRS) has attracted attention as a technique that supports next-generation brain science. Utilizing its leading-edge science and technology, Shimadzu has developed the LABNIRS, thereby contributing to the still growing field of brain science.
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Product
Function Tester with Low Number of Channels
UTP 6010 RF
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The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
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Product
PXIe Multi-Channel Function Generator Module, 32-Channel
43-625-001
Function Generator
The 41-625-001 (PXI) and 43-625-001 (PXIe) are function generator modules that provide 32 channels in a single PXI/PXIe slot. They can generate sine waves to 300 kHz with 5.76 mHz frequency resolution referenced to the 10 MHz PXI clock. The output voltage range is up to +/-25 V in a 16-bit resolution. It also support PXI trigger functions allowing events from other instruments to initiate waveform generation or sweeps.
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
Arbitrary Function Generators
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PeakTech Prüf- und Messtechnik GmbH
This arbitrary waveform generator has excellent technical properties, a variety of functions. In addition to the frequency sweep, burst and modulation functions, this device also has a 7-digit frequency counter with a wide range of measurement functions up to 350 MHz. Due to the high number of functions and easy handling, this device is ideal for almost all tasks in research, development and training.
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Product
Digimatic Outside Micrometer, Single function
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1/1000mm graduation Single function‚ simple design‚ economy type
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Product
32-Channel Relay/Switching Function Card
ProDAQ 3940
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The ProDAQ 3940 switching function card is a high-density card that fits into ProDAQ VXIbus motherboards and LXI function card carriers. The ProDAQ 3940 function card is a switching card with 32 independently controlled reed or solid-state relays. Two relays occupy three terminals on the function card front-panel connector, sharing one common terminal.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
PXI System for LRU Test
ARINC 629
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PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
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Product
NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Functional Test Fixtures
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Intrinsic Quality delivers turnkey standalone Functional Test fixtures and Windows based functional testers that are custom engineered with innovation and reliability to meet your testing needs. Our experience and expertise ensure a production ready functional test solution that is cost-effective, on time and on budget. Our broad range of test solutions includes simple continuity testers to complex microcontroller assembly testers. Our customers include military, aerospace, automotive, medical and consumer OEMs. We serve the needs of low volume high mix CEMs and off shore high volume manufacturers.
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Product
Load Testing vs. Stress Testing
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A load test is a planned test to perform a specified number of requests to a system in order to test the functionality of the system under specific levels of simultaneous requests. A load test ensures that a web system is capable of handling an expected volume of traffic, and therefore is sometimes referred to as volume testing. The goal of a load test is to prove that a system can handle the expected volume with minimal to acceptable performance degradation. The threshold of acceptable performance degradation must be defined by the testers as some value considered acceptable to the end user so that users will not bounce from the site.
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Product
PXI Attenuator
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Keysight offers step attenuator modules that operate across a broad frequency range of DC to50 GHz.
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Product
PXI Waveform Generators
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Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard.
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Product
Telecoms Testing
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KTL offers an extensive range of telecoms testing services, wired and wireless, for voluntary and regulatory markets worldwide. Conformance services are complemented by interoperability telecoms testing and by our commitment to provide market access through procurement specification testing.KTL provides telecoms testing to customer specific requirements and, as an independent third party test laboratory.
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Product
Leakage Test
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Leakage current and discharge current depend on the insulation of the device. The measurement simulates various fault situations that could occur during operation. The test determines whether the measured current is within the permissible limits and poses no danger to the user in case of a fault.
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Product
Protective Function Analog Multimeter
MT-2018
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Complied with 2008 CE safety standardMirrored Aluminum dial plate20k/V DC & 9,k/V AC input sensitivityOverload and mis-used protectionAdjustable back tilt device with hook-up designRobust protective holster alongsideResistance, Current & Voltage measurementsTransistor hFE TestBattery TestTest leads, batteries, fuse and user's manual includedIdeal for using in the fields of lab, school, home applications and more
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Product
Test Solution
Eye-BERT MicroX
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The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Product
Test Adapter
Ramcheck 100
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This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price.
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Product
PXI Chassis & Controller
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PXI chassis can accommodate plug-in modules according to the PXI/PXIe/cPCI standards. The basic device provides the supply, the ventilation and the bus for controlling the modules. PXI chassis differ in size and therefore in the number of slots available for compatible devices.
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Product
PXI Hybrid Amplifier/Attenuator
M9352A
Attenuator
The M9352A modules are custom built and tested to nominal* performance characteristics. Full regulatory and safety testing has been performed. This product has the same warranty and support services as other Keysight instruments. Because it is custom built, Keysight recommends checking availability and delivery information before ordering the product.
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Product
32-Channel Digital PMC with 30-ns Time Stamp function
2195
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The Technobox 32-Channel Digital I/O board provides 32-bits of bi-directional CMOS-level (TTL compatible) I/O available at the JN4 connector on a PCI Mezzanine Card. The 32-bits are individually programmed for direction ? either input or output ? by a 32-bit register written by the host processor. A 56-ohm series terminator is provided for each line.
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PXI Counter/Timer Module
Counter/Timer Module
PXI Counter/Timer Modules perform encoder position measurement, event counting, period measurement, pulse-width measurement, pulse generation, pulse-train generation, and frequency measurement. PXI Counter/Timer Modules feature up to eight 32-bit counter/timers and TTL/CMOS-compatible digital I/O. You can also choose options that support filtering, high-speed simultaneous DMA transfers, industrial voltage ranges with isolation, and onboard high-precision oscillators.
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Automation Testing
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Automated tests require a short execution time and let you avoid unwanted delays. Day or night, your automated tests will run around the clock. As a result of automation, you get a faster time to market. We automate thousands of simultaneous manual tests maximizing test coverage, and letting you lower the costs of testing in the long run.
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Test Antennas
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Lumistar provides small, lightweight portable fixed antennas for Test applications. They are available in lower L thru S bands for transmit and receive applications.
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Product
Temperature shock test chambers test
TSS series
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The operating principle of Schocktestprfschrank based of two superposed test rooms (top hot chamber, cold chamber below), between which a car with the test specimens is moved up and down by the large thermal shock test equipment may be subjected
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EMC Testing
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KTL facilities support a wide range of accredited Electro Magnetic Compatibility (EMC) and wireless testing services. Our experienced staff can assist with all EMC requirements for compliance testing to European and international standards, and can advise on pre-compliance investigative testing, which is invaluable in product development.
