Scanning Probe Microscopes
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: SPM
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1L-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 230gf
K100-K150230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Product
High-Voltage Differential Probe, 70 MHz
N2891A
High Current Probe
Use the N2891A 70-MHz high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2891A differential probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to ±7000 V of differential and common mode voltage.
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Product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25H79-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72J-8
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Active Scanning Technology
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ZEISS invented scanning in response to the drawbacks of single-point measurement nearly 50 years ago. This game-changing development enables the capture of thousands of data points within just a few seconds for truly reliable tactile quality assurance. It also saves time and money by delivering the high throughput and accurate results that are vital for manufacturing.
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Product
Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72I15-4
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1Z-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1Z-8-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Product
Atomic Force Microscope
Flex-Mount
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Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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Scanning Receivers
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PCTEL® scanning receivers are precision network testing tools. Designed for drive testing, walk testing, troubleshooting, and monitoring of cellular, WiFi, IoT, and critical communications networks worldwide, they provide the insights you need to improve coverage and quality of service throughout the wireless network lifecycle.
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1I-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1UN-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Boundary Scan
TurboBSD
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TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns
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Upright Microscope Systems
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Below you can see examples of an upright microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications.
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Product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25I8-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Handy Scan 3D
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The truly portable metrology-grade 3D scanners delivering highly accurate measurements.Truly portable and faster than everMetrology-grade accuracy and resolutionUser-friendly and easy to use
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Product
Rogowski AC Current Probe,30 MHz, 300 A
N7042A
High Current Probe
The Keysight N7042A Rogowski coil current probe measures AC currents up to 300 A, with bandwidth ranging from 9.2 Hz to 30 MHz. The probe has a thin, lightweight, flexible, and simple-to-use clip-around Rogowski coil that enables current measurement in the most difficult-to-reach parts and confined spaces of a circuit under test. It can also measure large AC current without an increase in transducer size.
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Product
JTAG Boundary Scan
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Our partnership with JTAG Technologies enables us to provide you with a comprehensive JTAG Boundary Scan Test Development Service.
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Product
Passive Probe, 10:1, 200 MHz, 2-Pack
N2140A
Oscilloscope Probe
The Keysight N2140A is an extremely low-cost passive probe that provides a switchable 10:1 / 1:1 attenuation and up to 200 MHz bandwidth. It features a high input resistance of 10 MΩ (switchable to 1 MΩ) to address a wide range of measurement needs with low probe loading. The probe can be adjusted for both low-frequency compensation and high-frequency compensation. For the best measurements, you should compensate your probe to match its characteristics to the oscilloscope. This probe is compatible with Keysight InfiniiVision Series oscilloscopes with 1 MΩ input.
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Product
Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0B
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Boundary Scan
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Boundary Scan is a powerful test method for digital circuit components. The hardware and software components we use for the boundary scan implementation come from Göpel electronic
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3D
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Scanning Vibrating Electrode Technique
VS-SVET
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The Scanning Vibrating Electrode Technique uses a single wire to measures voltage drop in solution. This voltage drop is a result of local current at the surface of a sample. Measuring this voltage in solution images the current at the sample surface. Current can be naturally occurring from a corrosion or biological process, or the current can be externally controlled using a galvanostat.
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Product
Measuring Microscopes, Image Processing
COMEF
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Optik Elektronik Gerätetechnik GmbH
Image processing system.
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Product
CP-2XX-6 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 69Full Travel (mm): 1.75Recommended Travel (mil): 59Recommended Travel (mm): 1.50Overall Length (mil): 236Overall Length (mm): 6.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Rapid Scanning Auto-Correlator / Cross-Correlator
FR-103XL
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The FR-103XL is a dispersion-free Autocorrelator/CrossCorrelator for monitoring the temporal width of ultrashort optical pulses. Offering unsurpassed sensitivity and resolution, it is compact and easy to operate. The FR-103XL is ideally suited for the measurement weak signals in optical telecommunications, as well as pulses from other mode-locked lasers such as Ti-Sapphire.
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Product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25Z1-6
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.10 (31.00) - 3.85 (109.00) Battery Probe
BIP-2
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 365Overall Length (mm): 9.27
