Functional ATE
Automated application specific testing system.
See Also: Functional Test, ATE, Functional Test Systems
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PXI Three Channel Function Generator
Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. It can generate fast swept frequency signals, permitting the output to emulate the operation of variable speed devices. The module can also generate arbitrary waveforms loaded into its internal 256k memory, allowing the emulation of many waveform types including the typical waveforms of automotive and aerospace sensors.
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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PXI 8 Slot BRIC 132x16 1-Pole (12 sub-cards)
40-562A-121-132X16
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Arbitrary/Function Generator,2 Ch,150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing
T3AWG2152
Arbitrary/Function Generator,2 Ch,150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing.
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PXI Single 32x8 Matrix, 1 Pole Screened
40-531-021-S
Model 40-531 very high density matrix modules are configured as a 32x8, while the 40-532 modules are configured as a Dual 16x8. Both modules are available in a choice of reed relay formats: 1-pole, 2-pole and 1-Pole screened. The screened version is suitable for switching coaxial signals up to 50MHz. Typical applications include signal routing in Functional ATE and data acquisition systems. These PXI matrix modules are constructed using high reliability Sputtered Ruthenium Reed Relays, offering 109 operations to give maximum switching confidence with long life and stable contact resistance.
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Optimize Throughput And Cost For MmWave 5G Device Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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PXI Functional Test System
U8989A
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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NI-9351, 4-Channel C Series Functional Safety Module
784446-01
4-Channel C Series Functional Safety Module - The NI-9351 works with 24 V industrial logic levels to directly connect to various sensor types, including light curtains, emergency e-stop buttons, and final elements such as relays, contactors, and motor drives. The NI-9351 is an analog input and digital I/O Functional Safety Module capable of SIL 3 certification according to IEC 61508. You can use the Functional Safety Editor to program the safety logic solver, which resides in the module. The module features diagnostics for monitoring the status of hardware and the integrity of the connections.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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PXI 4 Slot BRIC 180x8 1-Pole (6 sub-cards)
40-561A-021-180X8
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI Function Generator
Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. It can generate fast swept frequency signals, permitting the output to emulate the operation of variable speed devices. The module can also generate arbitrary waveforms loaded into its internal 256k memory, allowing the emulation of many waveform types including the typical waveforms of automotive and aerospace sensors.
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PXI 8 Slot BRIC 75x16 1-Pole (5 sub-cards)
40-561A-121-75X16
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 184x8 1-Pole (4 sub-cards)
40-560A-121-184X8
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 40x32 1-Pole (8 sub-cards)
40-562A-121-40X32
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Arbitrary/Function Generator,2 Ch,8-DIG ch, 150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing
T3AWG2152-D
Arbitrary/Function Generator,2 Ch,8-DIG ch, 150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing.
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Function Generator
FG-32
*6 FUNCTION,6RANGE.*LINEAR/LOG SWEEP*AUTORANGE COUNTER*0.001Hz RESOLUTION.*AUTO GATETIME.*COUNTER TRIGGER DETECT.
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JTAG Functional Test
JFT
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Function Test System
Focus-FX
This is general function test system. User can change board model easily by replacing a test fixture and changing inspection program. We have variety of measurement instruments such as FX modules which can control commercial instruments. It is possible to add required modules into existing units as they are connected by USB port. User can expand as per desired inspection specification.
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Arbitrary Function Generators
PXI Arbitrary Waveform and Programmable Function Generators as well as DC source cards and a precision standards module.
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Azure Functions
Develop more efficiently with Functions, an event-driven serverless compute platform that can also solve complex orchestration problems. Build and debug locally without additional setup, deploy and operate at scale in the cloud, and integrate services using triggers and bindings.
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Counter/Timer Function Cards
ProDAQ 3800 Series
The ProDAQ 3800 Series counter/timer function cards are high-density cards that fit into ProDAQ VXIbus motherboards and LXI function card carriers. ProDAQ instruments are versatile, providing users with the highest channel density and functionality available on the market.
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Functional Test Fixtures
Intrinsic Quality delivers turnkey standalone Functional Test fixtures and Windows based functional testers that are custom engineered with innovation and reliability to meet your testing needs. Our experience and expertise ensure a production ready functional test solution that is cost-effective, on time and on budget. Our broad range of test solutions includes simple continuity testers to complex microcontroller assembly testers. Our customers include military, aerospace, automotive, medical and consumer OEMs. We serve the needs of low volume high mix CEMs and off shore high volume manufacturers.
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Multi Function Testers
Kyoritsu Electrical Instruments Works, Ltd.
Live circuit warning LED:Immediate illumination of a warning lamp if the circuit under test is live Auto Discharge:Allows fast and safe discharge of electrical energy stored in capacitive circuits following testing Integral overload protection on internal continuity and insulation test circuitry Autoranging 500V DC test voltage for insulation tests 200mA short circuit current on continuity ranges Loop and RCD Testing Wiring connection check LED''s:Immediate indication if wiring of circuit under test is correct Overheat Protection:Rapid detection of overheating of internal circuitry,display of warning signal to user and automatic halting of measurement Supply Voltage Indication:Can display supply voltage value in loop impedance mode Low Current Loop Impedance Test:Short duration low test current will prevent tripping of many passive RCDs
