Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Power Electronics Test Solutions
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Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.
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High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
Thermal Microscope Stage
TS-4MP
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With our TS-4MP Thermal Stage, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C
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Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Product
Electronic Ballast Automatic Test Equipment
ATE-1
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Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency), can also test the ballast efficiency, abnormity protection, and power symmetry of partial rectifier effect and etc. • Program controlled AC power source to guarantee the smart choice of input voltage and the frequency. • Equipped with 17 inch LCD controlled machine, specially designed A/D combined with special CPU, has the two left and right testing interfaces to achieve stability of data and high- speed testing. • We can make the special-designed product for you and promise to upgrade the software for free.
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Electronics Cooling Simulation Software
FloTHERM
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Perform thermal analysis, create virtual models, and test design modifications of electronic equipment before physical prototyping. FloTHERM uses advanced CFD techniques to predict airflow, temperature, and heat transfer in components, boards, and complete systems, including racks and data centers. It''s also the industry''s best solution for integration with MCAD and EDA software.
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Product
Boundry Scan Testers
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Qmax Test Technologies Pvt. Ltd.
Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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Electronic Components Test
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Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, m, magnetic core loss, B-H curve, U curve and I curve Output capacity of the high frequency power: Uout: 1~300V, Iout: 0.05~5A, Pout: 300VA, frequency: 10~300kHz Accuracy: 2% With 12-bit high-speed A/D, sampling rate up to 40MHz, ensuring data precise and stable test result Supermaximal database, suitable for almost all kinds of magnetic material in market, such as: circle, E ,U , ETD-EER, JAR, RM , EP , PM , EL , ER, PQ, EFD, plane E, etc Perfect software interface enables observation of curve in detail Meet international test requirements for magnetic particle ASTM E1444, ASTM E709-08.
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Product
Quick Scanning Moisture Meter
L601-3
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The rugged L601-3 is specifically designed for the demanding environment of the sawmill or wood products manufacturing plant where quick-scanning of lumber is a must. The L601-3''s "Wood-Friendly" electromagnetic waves penetrate beyond the surface into the wood to a depth of 1" and provides an instant averaged reading of the board''s moisture content in a 2.5" x 2.5" x1" scanning area.
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Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Electronic Brake Meter
BrakeCheck
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The Bowmonk BrakeCheck is a fully self-contained, portable, battery-powered brake meter that can be used by workshops, government traffic authorities, testing and inspection stations etc. to test and report on vehicle brake efficiency. The unit is MOT approved.
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Electronics Failure Analysis System
Sentris
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Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Industrial CT Scanning Services
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Computed tomography (CT) is also referred to as industrial x ray and industrial imaging. It is an x-ray methodology yielding 3-dimensional (3D) results by placing an object on a rotational stage between an x-ray tube and x ray detector, rotating the object 360 degrees and capturing images at specific intervals—such as every degree or every half degree.
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Microscope Software
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Choosing the right software for your Vision Engineering microscope is just as important choosing the hardware. Whatever you need and however you like to work, you’ll find the right application software here.
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Product
Boundary Scan Test (BST)
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In the simplest case, the BST can be carried out via the connector of a module.Digital components require a JTAG port. In direct comparison to the ICT, the BST requires longer test times and the testing of analog components is not possible.
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Radar-Input & Scan Conversion Solution
Cougar2
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Curtiss-Wright Defense Solutions
Cougar2 is an open-standards based high performance solution for capturing, converting and mixing radar video. Designed for demanding military radar applications, Cougar2 speeds and simplifies the integration of advanced radar image processing and distribution functionality into deployed embedded systems.
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Bench Electronic Loads
EL30000 Series
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The Keysight EL30000 Series Bench electronic load with a built-in data logger provides new levels of test insights for your devices like power supplies, batteries, DC to DC converters, and more. View voltage and current trends to make real-time decisions, rather than waiting hours for a test to complete. At the heart of the EL30000 is a highly accurate measurement system that provides real-time updates to the large display. Keysight’s PathWave BenchVue software allows you to operate the electronic load remotely, execute test sequences, log data, and integrate with other test instruments. Single and dual-channel models are available with up to 600 W for measurements that require more power. Start your test with confidence and finish with results you trust.
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Product
DIOS (Digital I/O Scan Module)
JT 2122/MPV
Digital I/O
The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.
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Scanning Probe Workstations
M470.
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A modular, state-of-the-art instrument allowing users to exploit 9 local electrochemistry techniques.
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Product
Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Electronics
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The analog electronics enable the linearization of the SQUID characteristics through negative feedback to the SQUID.
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AC & DC Electronic Load
3270 Series （350V,1875W~22500W）
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3270 Series is suitable for the step, square and sine wave of the AC Power device test, especially for the uninterruptible power supply UPS, Inverter, fuses, circuit breakers, power regulator AVR, battery, AC / DC power supply / components ... and so on, absolutely is the best test solution in the market.
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Electronic Load Device
786530-01
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The RMX-4004 provides capabilities for qualifying power designs and validating power supply functionality in a production environment. You can combine Electronic Load Devices to customize your test system based on the number of channels, maximum load power, and voltage and current of each channel.
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SPSR-2030 (200-3000nm) Super Pure Spectral Radiation Scanning Analyzer
SPSR-2030
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Hangzhou Everfine Photo-E-Info Co., LTD
SPSR-2030 adopts double-monochromator design, which can realize super-pure&fine full-spectrum scanning ( 200-3000nm), the test parameters including but not limited to spectral power distribution, peak wavelength, dominant wavelength, CCT (correlated colour temperature), CRI (color rendering index), SDCM (standard deviation of color matching), color purity, and etc.
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Product
Electronic Speed Controller
AFI-ESC1220
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The AFI-ESC1220 is an Electronic Speed Controller designed to drive BLDC motors. It meets the industrial requirements of high power and high voltage application for electronic vehicles, airplanes, boats and medium duty industrial machinery. It is rated at 24KW.
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Modular DC Electronic Load LED Simulator
6310/A
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Chroma Systems Solutions, Inc.
Chroma 6310A Programmable Electronic Load integrates microprocessor capabilities into each load module and mainframe to provide simple and accurate parallel operation to optimize the speed and control among multiple load modules. All load modules may be configured to work synchronously, to test multiple outputs simultaneously, thus simulating real life applications.
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Life Science Microscope
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Our product range includes a wide range of smart life science microscope, excel life science microscope, select binocular microscope, crown trinocular life science microscope, classic life science trinocular microscope and premium trinocular microscope.
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Product
High Power DC Electronic Load
63200A series
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The 63200A series high power DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more. The 63200A series have three operating voltage choices, 150V, 600V & 1,200V, with models covering power levels from 4kW to 24kW and up to 2,000A in a single unit. The DC loads have unique user defined waveform (UDW) capability and external analog modulating input for s imul a t ing re a l-wor ld, cus tom waveforms. Another distinct feature is the dynamic auto-frequency sweep function, which enables detecting a UUTs worst case output deviation across a wide range of current frequencies. In addition, a 255-set of data storage function has been built in for recall of the stored settings at any time. For automated testing, the save and recall functions can save a great deal of time.
