Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Electronic Ballast Automatic Test Equipment
ATE-1
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Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency), can also test the ballast efficiency, abnormity protection, and power symmetry of partial rectifier effect and etc. • Program controlled AC power source to guarantee the smart choice of input voltage and the frequency. • Equipped with 17 inch LCD controlled machine, specially designed A/D combined with special CPU, has the two left and right testing interfaces to achieve stability of data and high- speed testing. • We can make the special-designed product for you and promise to upgrade the software for free.
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OEM, Embedded, and Custom Electronics
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Picosecond timingPrecision analog and mixed signal processingDigital delay and pulse generationHigh speed photonics and fiberoptic timing distributionAerospace instrumentation and simulation
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Area Scan Camera
Genie Nano-1GigE
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Introducing Genie Nano, a CMOS GigE camera that redefines low cost performance. Genie Nano starts with industry leading CMOS sensors and adds proprietary camera technology for breakthrough speed, a robust build quality for wide operating temperature, a three-year warranty and an unmatched feature set—all at an incredible price.
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Microscopes
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A scientific instrument designed to produce magnified, high-resolution images of objects.
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Inverted Raman Microscope
XploRA INV
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The XploRA INV inverted Raman microscope combines the automation features and small footprint of the standard XploRA™ Raman microscope with the unique sampling capabilities of an inverted microscope, especially important for demanding biological applications.
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Differential Scanning Calorimeter
DSC-60 Plus Series
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DSC (Differential Scanning Calorimeter) is an indispensable thermal analyzer for materials characterization in R&D and quality control applications in such areas as polymers, pharmaceuticals, electronic parts , foods , etc . It offers the sensitivity and easy operation required for the development of high-performance, highly functional new materials.
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Joint Services Electronic Combat Systems Tester
JSECST™
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The Joint Services Electronic Combat Systems Tester (JSECST) is part of the family of testers, supporting the U.S. Air Force, Navy, Army, and over 23 allied nation platforms. JSECST performs full end-to-end diagnostic tests of installed systems including radar warning receivers (RWRs), jamming systems, communication systems, and navigation systems. Our JSECST delivers confidence for flight crews and the technicians who support them. It quickly and accurately tests and fault-isolates electronic combat and avionics systems for today's most advanced combat aircraft.
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Electronic Safe & Arm Devices
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Excelitas Technologies specializes in the design, manufacture, and testing of MIL-STD-1316 compliant Electronic Safe and Arm Devices (ESAD), Electronic Safe, Arm and Fire Devices (ESAF), and Firing Modules (FM) for safe fuzing requirements of both legacy and next-generation missiles and munitions. Our dedicated staff of research and design experts use the latest advances in technology to design smaller, lighter, and more cost effective ESAFs and FMs to meet evolving requirements of newer more sophisticated weapon systems. Capabilities include a line of components and subsystems that have been qualified for hard target penetration environments and next-generation smaller-class munitions.
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Misc. Electronic Instruments
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Electronic components for test and measurement come in all sizes.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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6kW Regenerative DC Electronic Load (CC/CR/CV/CP/CC+CV/CR+CV)
PLZ6000R
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PLZ6000R is a DC electronic load that regenerates load power to the AC line. Regular electronic loads consume load power by having semiconductor devices convert it into heat. By contrast, PLZ6000R converts load power into reusable electric power, rather than converting it into heat as is typically done, and feeds this power to the AC line, thereby substantially reducing the amount of waste energy. PLZ6000R is an environment-friendly electronic load that can contribute significantly to your energy saving efforts.
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3D Laser Scanning Systems
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3D laser scanning is a construction, engineering, and architectural tool often used to document the existing conditions (as-builts) of any structure.
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High Speed-Large Current DC Electronic Load (CC/CV/CR/CP)
PLZ-4WL Series
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While the PLZ-4WL series succeeds to the superior operability of our conventional model of the PLZ-4W series, the PLZ-4WL series realizes the high speed rise and fall time (slew rate of 50A/µs.) in the range of low voltage with large current. The PLZ-4WL offers six operation modes, and equips with various features such as sequence operation, switching operation, soft-start function, and time and voltage measurement. The PLZ-4WL applies not only for the conventional load test of the CPU power supply, but also it can be applied to even faster current response test. In addition, the PLZ-4WL is a space-saving design (about 50% less volume of the conventional model) that can save the facility space of the testing site, and it can be applied for the single cell testing of the large scale rechargeable battery.
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Radar Scan Conversion Package
SoftScan
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Curtiss-Wright Defense Solutions
This embedded computing radar product portfolio provides ultra-high radar scan-conversion performance using unique graphics processor unit (GPU)-accelerated algorithms. Utilizing the power and performance of today's modern COTS graphics offerings, SoftScan provides unrivalled scan conversion performance with minimal CPU utilization.
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Electronics
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Flann provides control processors and switch drivers that support all Flanns current range of programmable attenuators, phase changers and waveguide switches
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Electron Sources
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SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Electronic Instruments
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The ORTEC range of modular electronics includes instruments in NIM formats as well as other modular instruments, such as photomultiplier bases, preamplifiers and other accessories. ORTEC also offers modular instruments for pulse height spectroscopy, fast timing, counting, high voltage power supplies and other special functions.
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Thermal Microscope Stage
TS-4MP
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With our TS-4MP Thermal Stage, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C
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Stereo Zoom Microscopes
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Our product range includes a wide range of gemstar stereo zoom binocular microscope, gemstar stereomaster binocular stereo zoom microscopes, zoomstar iii trinocular stereo zoom microscopes, zoomstar ii trinocular stereo zoom microscopes, zoomstar vi trinocular stereo zoom microscopes and zoomstar v trinocular stereo zoom microscopes.
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VME System Electronics
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Keysight VME electronics give the highest performance available in a laser interferometer system. Choose from a variety of axis and compensation boards.
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Boundary Scan
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Boundary Scan is a powerful test method for digital circuit components. The hardware and software components we use for the boundary scan implementation come from Göpel electronic
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DC Electronic Loads
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Electronic Test & Power Systems
An adjustable electronic load gives the test engineer the ability to qualify designs, check production batches or service and repair electrical products. Many applications demand an adjustable electronic load. These include the burn-in of new devices along with general power supply, battery, fuel cell and generator testing.
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Electron Microscope Analyzer
QUANTAX EDS for TEM
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Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Automotive Electronics Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Electronic Loads
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AMETEK Programmable Power, Inc.
Electronic loads have found a variety of applications ranging from power converter testing to current modulation. A large range of power sources can be tested using an electronic load from converters, inverters and UPSs to electrochemical sources such as batteries and fuel cells.
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Scan To CAD
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Scanning or hard probing, large or small, we have a large arsenal of hardware & software to fit our clients’ needs. With all the reference data coming directly from the CAD model this eliminates any human error that would have come through manually entering nominal information.
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1800 Watt DC Electronic Load Mainframe
N3300A
Mainframe
The Keysight N3300A is a full-rack width mainframe with 6-slots that accepts combinations of N330x user-installable load modules (150 W to 600 W) for easy system configuration and future reconfiguration. The N3300A holds up to six N3302A, N3303A, N3304A, N3307A load modules, or three N3305A, N3306A double-wide modules, allowing a total up to 1,800 watts of maximum power.
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AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Single-in-Line Reed Relays from Pickering Electronics
SIL / SIP
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The SIL / SIP reed relay is the industry standard when high reliability and consistent performance are desired in a compact package. Pickering Electronics Series 100 - 119 SIL / SIP reed relays feature the highest quality instrumentation grade reed switches making them suitable for the most demanding applications. Features include:
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Electronic Power Meters
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Also known as a digital or smart meter, an electronic power meter is a device that digitally measures the amount of electrical energy consumed by a business or electrical device. This type of meter enables remote tracking through digital connectivity so utility providers and building owners can manage usage demands and other electrical parameters.
