Alternator Test
See Also: Alternator Testers, Alternator
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Product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25T-6
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25H-6
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2D-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Broadband Test
458-3SLB
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This compact, versatile unit accepts 1, 2 or 3 line modules or other products that use Telebyte's convenient line module form factor. At home in the lab or a high-volume production environment, it is capable of controlling from 1 - 24 channels and is ideal for testing DSL modems and other bandwidth-compliant telecom devices. While it can be used as a stand-alone unit, the built-in Control Module interfaces with a PC via RS-232, IEEE-488, or Ethernet. In addition, the 458 Universal GUI (included with purchase) may be used to control the unit from a PC. For added convenience, the Control Module firmware is field-upgradeable through the RS-232 port.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3A-1
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Structural Testing
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Structural testing is used to verify the static strength, or fatigue strength, of a component by applying measured loads. Testing can be done to failure, to contractual requirements, or to validate finite element model predictions.
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Product
Semiconductor Testing
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The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
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Product
44 Pin D-Type Cables - 44 Pin To Alternative Connector For Pickering Products
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High-density, 3-row, 3A-rated, 250VAC-capable connector assemblies used primarily for interfacing PXI, LXI, or PCI switching modules.
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Product
Sencha Test
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Sencha Test is the most comprehensive unit and end-to-end testing solution for Ext JS apps. Based on years of testing Ext JS applications and the deepest integration with the framework, Sencha Test helps you improve application quality, accelerate time to market, and reduce testing time and costs. With Sencha Test, you can create unit and end-to-end tests quickly, and execute them on multiple browsers simultaneously. Cross-browser testing is critical to ensuring quality for organizations, and test automation is a requirement to meet delivery timelines. Sencha Test is the only dedicated testing solution for Ext JS applications. It helps you build an end-to-end testing plan without having to cobble together testing tools.
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Product
2.5mm Test Rod Test Probe Needle
CX-4C
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Shenzhen Chuangxin Instruments Co., Ltd.
2.5mm test rod test probe needle Used to verify the protection of persons against access to hazardous parts.
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Product
Alternate 3.00 (85.00) - 5.70 (162.00) General Purpose Probe
P2664G-1C2S
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
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Product
25 Pin 1.27mm Pitch Micro-D Cables - 25 Pin Connector to Alternative Connector
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The connector to connector cable assemblies below are suitable for high-density applications including Pickering’s LXI DIO/Trigger port.
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Product
DDoS Testing
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DDoS testing is a simulation of a DDoS attack performed under controlled conditions with real traffic. The goal of DDoS testing is to answer specific questions about the target environment.DDoS attacks are unique for many organizations in that they are relatively infrequent, but when they do occur they're often catastrophic. This catastrophic nature requires that a strategy be implemented to protect the organization, but a lack of real-world experience may limit the effectiveness of any solution. The infrequency of DDoS attacks often means that IT teams are developing solutions based on the "last attack" and waiting until the "next attack" to determine success. To address these challenges, NimbusDDOS created the first DDoS attack simulation platform. Our DDoS simulation services provide organizations the ability to proactively perform DDoS attack tests, using the same techniques used by real attackers. Unlike a real attack, a DDoS test is performed in a controlled manner and structured in a way to achieve the customer's objectives.
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Product
Test Sockets
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socket design as per customer specificationsquick + easy socket changehigh-performance spring probesdesigned for high frequency up to 16 GHz-55C/-67F to 150C/302F temperature rangemanual/automatic application optionssmall socket footprintone socket base for each insert (3x3 to 9x9 QFN)one-click switch from engineering to production socket modedevice dependent standard socket frame with changeable insertmore than 500,000 compression cyclesKelvin test applicabilitytool-free insert + actuator exchanges0.3 mm minimum lead pitchQFP extender available
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Product
In-Line RF Test Platform
AR925
Test Platform
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
Customized Testing
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Independent Testing Laboratories
ITL specializes in providing custom testing. Let us help you with designing your next R&D project.
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Product
Test & Measurement
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Quintech Electronics and Communications Inc.
RF Switches for Testing Wireless Solutions.
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Product
Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72T38-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
In-Circuit Testing and Test Engineering
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5184 Test NodesHPUX or Windows60 Mhz ASRU Frequency Counter, Timer10 Mhz Clock, 6 Mhz data ratesVector Test for VLSI, PLCC & ASICSTestjet and VTEP Vectorless TestingAdvanced Boundary ScanSilicon Nails AvailableSeries V upgradeable
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Product
Test Software
DISPATCHER
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DISPATCHER is offered as a fully functional download with a 15-day free trial period. In this way, you can fully test the software and connectivity before purchasing a license, to be sure it will work properly with your hardware.
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Product
Innovative Testing
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Originally founded as a test house, the IPTE Group today has in-depth knowledge in all areas of testing and test automation. Our internationally producing customer groups value our expertise in all areas of measurement and test technology as well as the often combined technologies such as software flash or optical test for their quality assurance.
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Product
Battery Testing
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Electric vehicles (EVs) rely on batteries as their primary source of energy storage. As battery packs require battery management systems (BMS) to operate safely and reliably, it is vital to test control algorithms for state of charge (SoC) estimation or cell balancing at an early stage.
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Product
Test Antennas
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Lumistar provides small, lightweight portable fixed antennas for Test applications. They are available in lower L thru S bands for transmit and receive applications.
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Product
Voltage Testing
MicroDetect series
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Hachmann Innovative Elektronik
Voltage detection simple and reliable with the MicroDetect line you get a type series of handy, exact and simply useable voltage detectors.
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Product
Soldering Test
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The soldering tests are conducted to determine if materials can withstand soldering effects, such as resistance to soldering heat, as well as the solderability of components during the manufacturing process.
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Product
Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-F180-2
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Connector Test
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A connector test system which provides expansion of up to 160 Kelvin pair connections. The system incorporates high voltage AC and DC power supplies with a maximum output of +/- 2100 Volts peak for Hi Pot, Insulation resistance measurement. LCR bridge control is provided with 4 terminal multiplexing in order to add precision capacitance, inductance and resistance measurement capability. An integral H.V. capacitor bias option permits capacitance measurement to be made at up to 2.1kV.





























