EMI Test Systems
See Also: Faraday Cages
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PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Benchtop Test System
300 Series Benchtop ATE
The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Function Test System
Focus-FX
This is general function test system. User can change board model easily by replacing a test fixture and changing inspection program. We have variety of measurement instruments such as FX modules which can control commercial instruments. It is possible to add required modules into existing units as they are connected by USB port. User can expand as per desired inspection specification.
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Test System
LB303
Computer Gesteuerte Systeme GmbH
The test system features the durable G12 receiver from the Virginia Panel Cooperation for the adapter interface. The LB303 is equipped with a power supply of max. 6 kW and can control up to 2 load boxes (in an external rack).
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Environmental Test Systems
Manufactured products can be exposed to both thermal and mechanical stresses.These should not be considered separately, as the effects may be linked.IMV can supply vibration-test systems combined with climatic chambers to provide complete vibration, temperature and humidity environmental testing.These systems can be custom-designed to meet your application.
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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System Test
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Electroluminescence Test Systems
The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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Vibration Testing System
F Series
Suited to durability tests for all industrial products such as aeronautical, automobile, electronic and precision equipment.
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Mezzanine System
5047
The 5047 provides breakout of all ECM signals for debug, design validation and development. Plated through holes on the PCB allow soldering of probe wires to IO, Data, Power and Serial Identification signals. LEDs indicate presence of 3V, 5V, +12V, -12V and Ground. Elevates the ECM module by 2 mm and saves wear on the ECM carrier board connectors. Since this is a debug too there is no serial identification circuit.
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PXI Test System
APT-1000
18 Slot NI PXI chassis (PXIe-1065)Amfax MDU with E-StopMAC Panel SCOUT Receiver chassis and tableProgrammable DC power supply4 channels- 0-30V 2AFan Vented 29u Instrumentation rackIndustrial PC i7- Windows 7 or 1024 inch touchscreen LED Monitor on armLight TowerCE CertifiedFully wired and testedFull documentation packDelivery and commissioning on site
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Vehicle Test Systems
What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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Meter Test Systems
We offer a huge variety of products for meter testing. From the smallest device with the size of a single-phase meter up to customized semi-automatic systems with more than 40 test positions.
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Test Cell System
qCf FC25/100
The quickCONNECTfixture with an active fuel cell area of 25 cm 2 has been an integral part of our product portfolio since 2006. The excellent properties and the patented design of the cellFixture offer enormous advantages in the characterization of cell-internal components for fuel cells and electrolysis.
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Test System
ETS788
The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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Power Line EMI Adapters
How much EMI noise is on your power lines indeed? How to assess the levels of noise and its properties when it is obviously a bad idea to connect your oscilloscope or a spectrum analyzer directly to your power lines?Our EMI interface adapters provide a barrier for high mains voltages but a straight passage for high-frequency signals so that you can connect your sensitive instrument to power lines for analysis and quantification. We offer plug-in and hand-held adapters which can measure both differential ("normal") and common-mode noise.
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Fully-automated Test Systems
Special mechanical systems/solutions
Foerster Instruments, Incorporated
Alongside individual test instruments, we collaborate closely with our customers to develop and produce customized test systems for their application. Following a consultation with our product and sales specialists, we develop a concept to suit you. For the production process that follows, we enter into product-specific collaborations with professional mechanical system manufacturers to achieve the best possible solution. We are also happy to work with mechanical system suppliers proposed by our customers. These suppliers are often familiar with the peculiarities of the component and know how to handle them. Even after the production stage, we assist you with commissioning the test system and are are on hand to answer any questions afterwards.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Lightwave Test Systems
Keysight offers a wide range of innovative test-and-measurement solutions to accelerate the progress of next-generation high-bandwidth optical networks. Keysight's mission in the optical market is to shorten time to market and reduce cost of test for customers in R&D and manufacturing. In addition, Keysight enables new technologies that include 40 Gb/s optical components, network elements and systems, and all-optical fiber networks.
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SSD Test Systems
MPT3000ES / MPT3000ES2
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Battery Testing Systems
The CT2001 series Battery Testing Systems are designed for energy storage materials research and battery test. The eight channels are independently programmed and controlled by the computer. The Current ranges are from 1 mA to 5 A and Voltage ranges from 2V to 15V. Each testing system is specifically built for customer needs.
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Meter Testing System
ASTel
Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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Vibration Test Systems
L.A.B.’s Vibration Test Systems help you design high quality, cost-effective products and shipping containers by accurately measuring sensitivity to vibration.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Advanced Test Systems
ATS
The commercial version of the RTS-503, this one is not built with the rugged qualifications of the RTS-503. The case is plastic and fuses are used. Otherwise, the internal components and software capabilities are very similar.
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Battery Test Systems
Was designed to meet the specific demands of our loyal customers. This system is used to test both single cell batteries as well as super-capacitors.
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EMI EMC test Solutions for Immunity
Scientific Mes-Technik Private Ltd
EMI EMC test Solutions for Immunity
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Optics Test Systems
WAS 160: Wedge Angle Sensor
Optik Elektronik Gerätetechnik GmbH
Portable measuring head for wedge errors and radius of curvature, eg of car windshields, airplanes and helicopters. It can be used for any other glass panes.
