Ethernet Test
Evaluation of a packet based ethernet network's wiring and signaling.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
EN50155 Managed PoE Ethernet Switch
EKI-9516G-4GMPW
Ethernet Switch Module
12 x M12 X-Coded 10/100/1000 Mbps PoE ports + 4 x M12 X-Coded 10/100/1000 Mbps Byapss ports, Complies with EN50155 & EN50121-3-2,Operating temperature: -40 ~ 75°C, Operating power input range: 16.8~137.5VDC.
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Product
4GE+4G SFP Managed Ethernet Switch, -40~75℃
EKI-7708G-4FI
Ethernet Switch Module
4 Gigabit ports + 4 SFP ports, SFP socket for Easy and Flexible Fiber Expansion, Redundancy: X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D), IXM function enables fast deployment, Security: 802.1x (Port-Based, MD5/TLS/TTLS/PEAP Encryption), RADIUS.
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Product
8 Ports Entry-Level Managed Switch
EKI-5728I-MB
Ethernet Switch Module
Entry-level managed switch, Provides wide operating voltage 8.4~52.8 VDC, C1D2 and ATEX certified for horizontal area. IXM function enables fast deployment, Modbus/TCP enabled by default, Supports X-Ring for ultra high-speed recovery time less than 20m.
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Product
8FE PoE And 2G Combo Managed Ethernet Switch
EKI-7710E-2CPI
Ethernet Switch Module
Certified to IEC 62443-4-2 SL2, 8 x IEEE 802.3 af/at PoE Fast Ethernet ports + 2 x Gigabit Copper/SFP combo ports, Redundancy: Gigabit X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D) IXM function enables fast deployment, Security: 802.1x (Port-Based, MD5/TLS/TTLS/PEAP Encryption), RADIUS.
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
Test Platform
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
8FE Managed Ethernet Switch Support Modbus/TCP,-40~75℃
EKI-5528I-MB
Ethernet Switch Module
8 ports Fast Ethernet RJ-45 (EKI-5528/I-MB)Entry-Level Managed SwitchIXM function enables fast deploymentManagement: SNMP v1/v2c/v3, WEB, Standard MIB, Private MIB
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Product
1553 to Ethernet Converter
eNet-1553
Ethernet Interface
eNet is a small, rugged 1553 to Ethernet appliance/converter (~200 grams and about the size of a 4 stub coupler) and offers the same advanced BC, mRT and BM functions as our cards. In addition, eNet can provide an additional independent BM mode to auto bridge (transmit) 1553 messages on user defined IP/UDP packet header. The appliance can also auto-load setup images for fast auto start-up, which would be ideal for simple RT applications that wouldn’t even need an API interface (just a standard UDP interface – usually through simple socket programming).
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
EN 50155 M12 8FE PoE + 2GE Managed Switch
EKI-9510E-2GMPW
Ethernet Switch Module
M12 connector with IP67 rugged housing, Complies with EN50155 & EN50121-3-2, Complies with EN45545-2 & EN61373, Supports PoE IEEE802.3af/at. Wide nominal power input range: 24~110VDC; Operating power input range: 16.8~137.5VDC. Compact size to fit in different narrow spaces, Operating temperature: -40 ~ 70°C.
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Product
EN50155 Managed PoE Ethernet Switch
EKI-9516E-4GMPW
Ethernet Switch Module
12 x M12 D-Coded 10/100 Mbps PoE ports + 4 x M12 X-Coded 10/100/1000 Mbps Byapss ports, Complies with EN50155 & EN50121-3-2. Operating temperature: -40 ~ 75°C, Operating power input range: 16.8~137.5VDC. Supports X-Ring Pro for rapid and predictable convergence, Supports IXM for fast and easy maintenance.
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Product
Communications Test System for Frontline Diagnostics
ATS3000P
Test System
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
EN50155 Managed Ethernet Switch
EKI-9516E-4GMX
Ethernet Switch Module
12 x M12 D-Coded 10/100 Mbps ports + 4 x M12 X-Coded 10/100/1000 Mbps ports, Complies with EN50155 & EN50121-3-2, Operating temperature: -40 ~ 75°C. Operating power input range: 16.8~137.5VDC, Supports X-Ring Pro for rapid and predictable convergence, Supports IXM for fast and easy maintenance.
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Product
EN 50155 M12 8GE PoE Unmanaged Switch
EKI-9508G-PW
Ethernet Switch Module
M12 connector with IP67 rugged housing, Complies with EN50155 & EN50121-3-2, Complies with EN45545-2 & EN61373, Supports PoE IEEE802.3af/at. Wide nominal power input range: 24~110VDC; Operating power input range: 16.8~137.5VDC, Compact size to fit in different narrow spaces.
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Other Test Systems
Test System
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Product
Ethernet Module
M4K-ETH
Ethernet Interface
The M4K-ETH is an intelligent Gigabit Ethernet interface module for the multiprotocol Excalibur 4000 family of carrier boards. The module supports 10Mhz, 100Mhz and 1Ghz Full Duplex UDP/IP Ethernet.
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Product
Conformance Test System
TS8980
Test System
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
