Ethernet Test
Evaluation of a packet based ethernet network's wiring and signaling.
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Product
In-Line 1553 Ethernet Converter
NLINE-E1553
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Full BC, RT, and BM 1553 Controls Built-in a Small, Rugged, In-Line package. Control and convert 1553 messages to/from Ethernet in real-time (<20 uSec). Auto-bridge 1553 messages (BM) to UDP Ethernet without any programming.
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Product
8FE Slim-Type Unmanaged Industrial Ethernet Switch
BB-ESW108-A
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8 x fast Ethernet ports with auto MDI/MDI-X, Supports 10/100 Mbps auto negotiation, Compact size with DIN rail and wall mount. Supports redundant 12~48 VDC or 10~24 VAC power input, Wide operating temperature range of -40 ~ 75°C, C1D2 for hazardous locations.
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Product
8FE+2G Combo Managed Ethernet Switch
EKI-7710E-2C
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Certified to IEC 62443-4-2 SL2, 8 Fast Ethernet ports + 2 Gigabit Copper/SFP combo ports, Redundancy: Gigabit X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D).
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Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
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The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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Product
EN50155 Managed PoE Ethernet Switch
EKI-9528E-8GMPX
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M12 connector with ruggedized IP54 certified housing, Complies with EN50155 and EN50121-3-2 standards, 24 x PoE IEEE802.3af/at ports, Wide nominal power input range: 24 ~ 110VDC. Operating power input range: 16.8 ~ 137.5VDC, X-Ring Pro delivers rapid and predictable convergence.
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Product
24GE+4G Combo Unmanaged Ethernet Switch
EKI-2428G-4CI
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19" Rackmount, -40~75℃, 24 x Gigabit ports + 4 x Gigabit copper/SFP combo ports, SFP socket for Easy and Flexible Fiber Expansion. Provides 8K MAC address, Supports 12-48V DC power input, -40 ~ 70°C wide-range operating temperature.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
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Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Battery Management (BMS) Environmental Test System
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The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Product
EN50155 Managed PoE Ethernet Switch
EKI-9516G-4GMPW
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12 x M12 X-Coded 10/100/1000 Mbps PoE ports + 4 x M12 X-Coded 10/100/1000 Mbps Byapss ports, Complies with EN50155 & EN50121-3-2,Operating temperature: -40 ~ 75°C, Operating power input range: 16.8~137.5VDC.
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Product
Electronics Testing Solutions
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Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
1553 to Ethernet Converter
eNet-1553
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eNet is a small, rugged 1553 to Ethernet appliance/converter (~200 grams and about the size of a 4 stub coupler) and offers the same advanced BC, mRT and BM functions as our cards. In addition, eNet can provide an additional independent BM mode to auto bridge (transmit) 1553 messages on user defined IP/UDP packet header. The appliance can also auto-load setup images for fast auto start-up, which would be ideal for simple RT applications that wouldn’t even need an API interface (just a standard UDP interface – usually through simple socket programming).
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Product
Unmanaged Ethernet Switch
EKI-2712X-SPE
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Provides 2 x 10G, 2 x 2.5G, 2 x SFP+, and 6 x SPE ports, SFP+ socket for easy flexible fiber expansion, Offers DIN Rail and wall mounting options. Supports wide-range 9–36VDC power input, Compliant with IEEE 1588 E2E TC standard, Supports gPTP IEEE 802.1AS-2020 Time-aware bridging.
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Product
Liquid Test Fixture
16452A
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The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Product
8FE Unmanaged Ethernet Switch, -40~75℃
EKI-2528I
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Provides 5/8 Fast Ethernet ports with Auto MDI/MDI-X, Supports 10/100 Mbps Auto-Negotiation, Provides compact size with DIN-rail/Wall mount, and IP30 metal mechanism. Supports redundant 12 ~ 48 VDC power input and P-Fail relay, Supports wide operating temperatures from -40 to 75°C.
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
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Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
5FE Slim-Type Unmanaged Industrial Ethernet Switch
EKI-2525I-LA
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5 x fast Ethernet ports with auto MDI/MDI-X, Supports 10/100 Mbps auto negotiation, Compact size with DIN rail and wall mount. IP40-rated metal enclosure, Supports redundant 12~48 VDC or 10~24 VAC power input.
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Product
Dielectric Material Test Fixture
16453A
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The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
PCIe 2.0 Test Platform
PXP-100B
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The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
PCI Express 4.0 Test Platform
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The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
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The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Other Test Systems
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Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Product
Fixturing Kit
10744A
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The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
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Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
In-Circuit Tester
Sparrow MTS 30
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The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Product
Low-Power Ethernet Bridge Converter for MIL-STD-1553 and ARINC
eNetX-MA4
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eNetX-MA4™ is an innovative product for “remoting” 1553 & ARINC-429/717 operations on 10/100/1000 Ethernet local area networks (LAN). eNetX-MA4 is a very small, low-power, rugged device that provides real-time UDP connectivity to for 1-2 dual redundant 1553 (A/B) busses and 4 ARINC channels. Tested to MIL-STD-704F/810G/461F and DO160.
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Product
BSD (Test Diagnostics)
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BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
