Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
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Product
Video Pattern Signal Generator
Model A223800/01/02/03/04
Signal Generator
Support 8K Super Hi-Vision (7680x4320/8192x4320)Independent graphics core for 8K Super Hi-Vision pattern with less than 200 msec. switch timeUp to 4 signal modules per unitUp to 4 resolution and pattern outputs.7 inch 1024x 600 high-resolution touch panel, GUI interfaceBMP file format supportUSB 3.0 data accessGigabit Ethernet high-speed network interfaceHDMI 2.0a signal module (Optional) - 8K x 4K 60 Hz (4 HDMI port) - 4K x 2K 60 Hz (1 HDMI port) - Pixel rate up to 600MHz (6Gbps TMDS rate) - RGB 4:4:4 / YCbCr 4:4:4 or 4:2:2 or 4:2:0 - HDCP 2.2 / 1.4 - Wide color gamut (ITU-R BT.2020/DCI-P3) - HDR (High Dynamic Range) Testing (HDR infoframe & metadata / EOTF) - SCDC (status & control data channel) Reader
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
Test Fixture
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
HD Pattern Signal Generator
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Evaluate, Calibrate, and Test Digital Video Equipment. Advanced testing device for your audio and video equipment.
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family.
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Product
EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
Portable Logic Analyzer & Digital Pattern Generator
Digital Discovery
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The Digital Discovery is designed to be the ultimate embedded development companion. Configured and controlled by the full featured WaveForms 2015 software toolset, the Digital Discovery provides a Logic Analyzer, Pattern Generator, Digital IO, Protocol Analyzer and Script Editor. Equipped with a Xilinx Spartan 6 FPGA, the Digital Discovery can provide up to 32 channels and up to 800MSPS. Thats 8 times the sample rate of the Analog Discovery!
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.
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Product
Pattern Converter for WGL/STIL to ATE
VectorPort
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VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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Product
PCBA Pattern Analyzer
A222917
Analyzer
Chroma A222917 is a multi-functional PCBA main board board signal test device for display. It has ultra high speed LVDS (Low -voltage differential signaling) as image signal analysis core to provide high efficiency and stability test quality.
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Product
USB-controlled, FPGA Configurable Bit Pattern Generator
FAB-3226
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The FAB-3226 system connects 16 bi-directional I/O ports to a user-defined FPGA logic. As the FPGA is user-programmable, all kinds of operations can be implemented: input, output, and closed loop operation where input and output are processed in real-time. All this can be controlled by a user-defined application program running on a computer system (PC or embedded).
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
Standard Pattern Generator Board
BL-PG315-01
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
Test Platform
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
Color Pattern Generator
CG-971
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Analog video signal/Audio signal output. Conformity with NTSC,PAL,PAL-M and TNSC-4.43. Selectable sync level. Available for various and output patterns by system file* Each staircase level in step pattern settable by voltage. Natural image and Monoscope pattern output. Max. 24 pattern installation. Auto sequence mode. GP-IB, RS-232C, and Digital IF (TTL) for remote control. Half rack size of 19 inch EIA 2U.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Self-Discharge Analyzer
BT2152B
Battery Test Platform
The Self-Discharge Analyzer accurately measures cell self-discharge current and cell voltage. Depending on the characteristics of the cells, measurements are directly made in minutes or hours instead of taking days or weeks using open-circuit cell voltage measurements to indicate which cells are good vs. bad.
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Product
Scienlab Combined Battery Test Solution
SL1133A
test
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
Omni-Directional Radiation Pattern, Compatible For WiFi 5/6/6E/7
AIW-511
Dipole Antenna
Dipole antenna with omni-directional radiation patternSupport 6GHz bandCompatible for WiFi5/6/6E/7RP-SMA male connectorOperating Temperature: 0 ~ 70℃
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Product
RF Testing Platform for ATx05
AT118
Test Platform
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
Test Systems
Test System
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Product
Omni-Directional Radiation Pattern, Compatible For WiFi5/6
AIW-510
Dipole Antenna
Dipole antenna with omni-directional radiation patternCompatible for WiFi5/6RP-SMA male connectorOperating Temperature: -40 ~ 85℃
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
