Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
-
Product
Test Pattern Generator Software
ScanExpress TPG
-
To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
-
Product
Multistandard Test Pattern Generator
TRF-950
-
TRF-950 is universal multistandard equipment suitable for analog TV systems and digital video. This generator supports all analog standards (PAL, SECAM, NTSC) and substandards. Digital output offer DV601/656 signal. Generator is installed in low profile case suitable for desktop use as well as for use in Rack 19" stand.
-
Product
Encoder Stress Pattern
ESP™
-
SRI's ESP is a sophisticated video clip consisting of specialized and complex artificial test patterns that stress various aspects of processing to quickly reveal television encoder deficiencies. Its unique motion sequences allow users to visually evaluate and objectively compare the quality and performance of standard- and high-definition encoders.
-
Product
Camera Link Simulator
CLS-221
-
The CLS-221 Camera Link Simulator is an affordable, high-performance video test pattern generator that supports all video formats including those introduced in the new version 2.1 specification. Fully programmable video timing enables the CLS-221 to mimic the characteristics of almost any camera. New features include enhanced timing performance, bayer color support, and additional video patterns. Control is via an RS-232 port, USB, or frame grabber COM port. The CLS-221 also incorporates the AIA validation test pattern.
-
Product
Video Signal Generator
MSPG-8000
-
The MSPG-8000 is a high performance slot type multi video test pattern generator. You can add-on any type signal generator such as HDMI, Displayport, DVI, Analog, Component, S-Video, CVBS, SCART, and audio, up to 8 slots.
-
Product
ATPG with Embedded Compression
TestKompress
-
TestKompress is an automatic test pattern generation (ATPG) tool that provides the highest quality scan test with the absolute lowest test cost. TestKompress has an industry-proven ATPG engine that applies effective fault models to your entire logic design. Manufacturing test costs are held in check by an award-winning test pattern compression technique called Embedded Deterministic Test (EDT).
-
Product
Boundary Scan
TurboBSD
-
TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns
-
Product
HDMI / 3G Reference Media Player
VQS-300
-
Versatile destop/rackmount unit, loaded with unique sophisticated set of static and dynamic test patterns - see more details in separate VQL for VQS PresentationMulti-format HDMI and 3G-SDI outputs, digital and analog AV outputs2.5 ppm accurate system clock to meet full 3G-SDI broadcast specsFront side bay for detachable SATA HDD – up to 2 TB of contentVQL - Library of unique sophisticated dynamic test patterns and sequencesLIve clips and 3D Video Tests, 5.1 Surround Sound and LR Stereo Audio TestsAll commonly used resolutions, aspect ratios, frame rates and interlace modesEasy expansion with any external USB storage device: BD/DVD, HDD, FD.
-
Product
Test Solution
Eye-BERT MicroX
-
The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
-
Product
DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
-
NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
-
Product
Computer Monitor & LCD Analyzer
MonitorTest 2.2
-
PassMark MonitorTest is a tool that allows users to investigate the quality and performance of their computer monitor or LCD flat panel screens. With more people spending more time in front of computer monitors it is important to purchase a quality monitor that will provide crisp, bright images, while reducing the strain on your eyes. The MonitorTest software generates test patterns on the screen at a variety of different resolutions and color depths to test for optimum visual performance.
-
Product
Video Test Pattern Suite
Sarnoff®
-
In the digital era, traditional video test and measurement tools are becoming obsolete. SRI offers a suite of unique visual tools that enable users to stress, evaluate, and calibrate audio and visual equipment throughout the signal chain. Test pattern products include the award-winning Visualizer digital video test pattern, the ESP encoder stress pattern, and the TSG test sequence generator.
-
Product
VGA and S-VGA test generator
TELETEST PC
-
A pocket sized, battery powered PC monitor test pattern generator. For fault finding and repairing PC systems with stand alone monitors.
-
Product
FPD Tester Model
27014
Test Platform
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
-
Product
TRF Manager 9
-
Configuration by using a PC, this is one of the major TRF generator attribute. Instruments have factory settings suitable for common applications and contain the most popular test patterns. But many users want to customize the setup or set the instrument according to specificic application requirements. They also may want to adjust parameters, that cannot be accessed by any other way. That is what TRF Manager 9 (optional software pack) can do. And much more! Pattern generators of the TRF-498 and 598 series use a parallel interface for connection with PC. Basic setup can be realized by using Pattern Manager, free software downloadable from our site. For advanced settings there is available TRF Manager 3 software. For more detailed information see the TRF-498 and TRF-598 section, please.
-
Product
Multi-Wafer Test & Burn-in System
FOX-XP
-
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
-
Product
Virtual Test Methodology
TVT
-
With TVT, you don''t have to wait for the physical device to start validating your ATE test patterns, or verifying the device interaction with the tester.
-
Product
Video and stereo audio test generator
TELETEST PRO
-
A pocket sized, battery powered professional audio and video test pattern generator.
-
Product
DisplayMate Multimedia Edition for Mobile Displays
-
DisplayMate Technologies Corporation
DisplayMate Multimedia Edition for Mobile Displays is a special version of the Multimedia with Test Photos Edition that produces native resolution Bitmap Files of all DisplayMate test patterns and photos that can be copied or downloaded to mobile devices, displays, and projectors for testing, evaluating, optimizing, analyzing and comparing their performance. Examples include: MP3 and video players, smartphones, digital cameras, picture frames, game consoles, GPS units, camcorder displays, and pico/pocket projectors.
-
Product
AMIDA 2020XP Tester
-
AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end
-
Product
Camera Testing
FLIR
-
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
-
Product
HDTV PATTERN GENERATOR
HG139
-
The HG139 is an easy-to-use handheld video pattern generator that generates a wide variety of test patterns for comprehensive testing, calibration, and repair of HDTV, analog television monitors, and other video equipments. The HG139 delivers the quality and functionality you would expect from the expensive high end HDTV pattern generator at a very affordable price.
-
Product
ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
Test Pattern GeneratorDelay & AV Sync Analyzer
VQDM-100
-
Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QCInstant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurementMulti-channel time-line analysis, including video frames continuity testing4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels)2 channels of AV timing analysis, simultaneous measurements of Video and Audio LatenciesReal time multi-channel data acquisition via USB portUnique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL pageSource of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ AnalyzersMulti-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audioNetworkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
-
Product
ICT/FCT-Fixtures Max UUT370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
Emulate Test in simulation
STIL-VT
-
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
-
Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1-228X-S (Small IF) / 230514
-
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
-
Product
Bit Error Rate Testers
-
The FarSync BERT Tester provides a comprehensive, simple to use, line testing utility for asynchronous and synchronous lines. Standard BER test patterns are used with real time error counters, user controlled error injection, full line test statistics and APIs.
-
Product
Sync Generator
LT 4610
-
The LT 4610 is 1RU full-rack size sync signal generator that can output triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) signals. It employs two power supply units for redundant operation to protect against power supply failures. The genlock function for external sync signals enables SDI signals, six sets of analog black burst sync signals, and audio word-clock signals to be output synchronously. The genlock function is equipped with a STAY IN SYNC function that maintains the phase when errors occur in the input signal, making it possible to provide stable sync systems.In addition to test pattern output including color bars and SDI check fields, the LT 4610 can embed ID characters, QVGA logo marks, safety area markers, and embedded audio in a SDI signal output.
-
Product
Silicon Test & Yield Analysis Solutions
Tessent®
-
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
