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Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Eclipse Test Development Environment
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Test Development
Best Electronics and Components Co., Inc.
USEA is involved at all levels of test development, including the necessary test board design and layout, software development, socket design and build, etc. We work on programs at all stages of the product development timeline and through to manufacturing.
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Test development service
Test development may be a complex task, because each emulated session must be unique and consistent. Unless the website consists of exclusively static pages, there is no testing tool that can fully automate the test design process. In many cases the implementation may require considerable research of the client-server communication scheme.
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Test Development Solution
Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete "turn-key" service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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In-Circuit Test Applications
With decades of experience developing test fixtures, we are the recognized industry leaders for solid and reliable quality as well as our outstanding customer service. We fully support our products locally and worldwide for maintenance, repair, and ECO work. Also, 100% wiring verification is part of our Quality Control process, by utilizing automated verification machines for GenRad/Teradyne and HP/Agilent fixture.
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VPX/VME64x Hybrid, Type 39 E-Frame, Test Platform (Tall)
39E08ADXC8Y3VG3X
The Type 39 E-Frame, test platform supports development from legacy VME64X to VPX. With a rugged aluminum construction, the versatile 39 E-Frame is 12U to hold 6U cards. The full size (84HP) width holds 17 cards (3 on .8 inch and 14 on 1 inch pitch).
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ScanWorks Boundary-Scan Test
ScanWorks Boundary-Scan Test
The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.
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Data Logging and Analysis With Tecap
Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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Semiconductor Test Software Solutions
The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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Turnkey Boundary Scan Solutions
TestGenie
TestGenie is a low-cost boundary-scan solution for those companies that have a genuine requirement for JTAG testing, but have difficulty absorbing the tool costs or assigning the resources required to implement the test technology into their development or production processes. TestGenie allows customers to use full-featured versions of Corelis ScanExpress products at a fraction of the cost.Once you’ve selected boundary-scan as a practical solution, the second biggest decision is whether you want to do the test development yourself or have a third party do it. The decision should not be considered lightly as there are advantages and disadvantages to each.
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LTE RF Communication Subsystem
The Delaire USA LTE RF Communication Subsystem is designed to provide a versatile solution for the testing needs of the next generation wireless systems. With the LTE test subsystem developers can build an end-to-end test environment for complete system operation. From end user equipment and eNodeB base stations to full system functionality, the LTE RF Communication subsystem allows developers to test and evaluate equipment and system performance in a controlled laboratory environment.
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Drive-Thru Feature, GTE 10.00p
K8218A
The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
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Manufacturing Test Station
Scan Executive
The Scan ExecutiveTM Manufacturing Test Station is used to apply the same IEEE 1149.1 tests that were developed and used in the lab in a high-volume manufacturing environment without requiring additional development.
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Tabletop Single Site Test Handler
3111
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Multichannel Memory-Mapped ARINC 708/453 Interface Card
EXC-708mPCIe
The EXC-708mPCIe is a multichannel, memory-mapped ARINC 708/453 interface card that supports two ARINC 708/453 channels, each programmable as transmit or receive. Each channel implements a 64K x 16 FIFO and supports polling and/or interrupt driven operation. The card complies with the PCI ExpressTM Mini Card standard. It’s small size and suitability for Mini Card compatible computers make it a complete solution for developing, testing, integrating 708 interfaces and for performing system simulation of the ARINC 708/453 Weather Radar Display databuses, both in the lab and in the field. In Transmit mode, each ARINC 708 word is written to the FIFO as a block of 100 16-bit words. In Receive mode, each ARINC 708 word is stored in the FIFO as a block of 103 16-bit words. The first two words comprise the 32-bit Time Tag, indicating the word’s time stamp. The next 100 words comprise the 1600 bits of the ARINC 708 word, which are followed by the Status Word.The EXC-708mPCIe card comes complete with C drivers including source code.
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Tribometers/Abrasion Testers
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
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PLD ISP Feature, GTE 10.00p
K8220B
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Thermocouple Wires & Connectors
Is designed for sensor manufacturers for the production of commercial grade thermocouple junctions, and for users of large numbers of exposed junctionthermocouples such as test & development laboratories where multipoint temperature sensing of test pieces is required.
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4U Compact 42HP CompactPCI Serial Chassis Platform
CPCIS4VC800
The CPCIS4VC800 is a 4U vertical-mount chassis that holdsup to eight 3U slots at a 0.8” pitch. The modular card guidescan be adjusted to allow 1.0” pitch or other spacing in .2”increments. The standard PSU is a fixed 350W ATX, but other options are available. Conduction-cooled card guides arealso available for testing and development.
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Turnkey Data Acquisition Systems
Series 6800
Based completely on the Series 6000 hardware and software platform, Series 6800 is a turnkey system configured for specific measurement types and environments. Systems are available for Strain/Bridge, Voltage/IEPE, Thermocouple and packaged for laboratory or portable applications. Systems range in channel count from 8 to 128 channels and can be easily expanded, should test requirements change. Included turnkey software helps facilities focus on testing, not developing software. If you don’t see a configuration that fits your application, we can likely build a system specific to your needs.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Multi Protocol Analyzer
LE-8200A
The LE-8200A is the top-level model of battery-powered communications protocol analyzer. The LE-8200A has an enlarged display in response to an increasing demand without degrading the excellent portability of the LE Series. It is ideal for development tests of communications systems and industrial equipment, as well as for after-sale services and communication trouble analysis.
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STAR-Ultra PCIe
163
The STAR-Ultra PCIe is a SpaceFibre Multi-Lane interface and link analyser, designed to aid test and development of SpaceFibre equipment. It can transmit and receive SpaceFibre traffic from a host PC at data rates in excess of 10 Gbit/s, and it can record and display SpaceFibre traffic transmitted and received on one SpaceFibre port.
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Multi Protocol Analyzer
LE-8200A
The LE-8200A is the top-level model of battery-powered communications protocol analyzer. The LE-8200A has an enlarged display in response to an increasing demand without degrading the excellent portability of the LE Series. It is ideal for development tests of communications systems and industrial equipment, as well as for after-sale services and communication trouble analysis.
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JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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In-Circuit Programmer/Loader
SKU-018-01
The In-Circuit Programmer/Loader (“EasyLoader” or “eLoader”) is a standalone device that was designed to provide a flexible and cost-effective solution for electronic device manufacturers, as well as for hardware design companies and their customers. It allows you to upgrade code on any JTAG/SPI/I2C compliant device (like FPGA/CPLD/EEprom/Flash, etc.) or Microcontrollers at any time of development, testing or production.
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Software Test Framework for LabVIEW
VI Tester
VI Tester is a software test framework for LabVIEW that allows software developers to test their LabVIEW code (VIs). Software testing is a critical component of agile development and test driven development processes and is also critical for validating software functionality. VI Tester is based on the industry standard xUnit software test architecture that is used in many other programming languages. This architecture is very flexible and powerful, but also very easy for beginners to learn.
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Boundary-Scan DIMM Socket Tester
ScanDIMM
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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LTE Emulation for End-to-End QOS Validation
IxLoad-Wireless XAir2
Keysight Network Applications and Security
Ixia’s XAir2 load module provides LTE user equipment (UE) emulation that enables a powerful IxLoad eNodeB Layer 1 to 7 test solution. With complex UE modeling, it offers realistic and easily-configured traffic models and call patterns. Using IxLoad’s real-world subscriber modeling, testers do not need to be protocol experts to develop test realism. From a single tool, users can perform capacity tests, detail a cell throughput, measure voice and video quality, model a wide variety of mobility scenarios.
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
