Protocol Test
See Also: Protocol Analyzers
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Protocol Testing Software
IOL INTACT®
To meet the needs of its higher layer protocol based conformance testing, we have developed a custom software test tool and API, named IOL INTACT® (Improving Networks Through Automated Conformance Testing). A modular and cross-platform API with built in packet generating, scheduling, triggering, and filtering capabilities offering fully automated protocol analysis and testing, the IOL INTACT software is used in a number of our Testing Services including IPv6, Routing, and Home Networking.
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USB Power Delivery and Type-C™ Tester & Analyzer
GRL-USB-PD-C2 (GRL-C2)
GRL-USB-PD-C2 (GRL-C2) is the only solution available that supports all compliance test specifications for USB Power Delivery 3.0 and USB Type-C Alternate Mode designs, and enables product developers to quickly run full compliance and validation test suites at the push of a button. GRL-C2 provides an automated, efficient, and fully-integrated way perform all required USB Power Delivery version 3.0 and 2.0 and related tests over the USB Type-C connector, as well as PHY test automation for USB Type-C Alternate Modes. GRL-C2 automates all required USB PD compliance tests for power providers (chargers), consumers, dual-role ports, and cable and adapter E-Markers; and is the only solution available that integrates Qualcomm Quick Charge 4+ and Intel Thunderbolt-specific test items. GRL-C2 also incorporates analyzer capability to sniff PD traffic. GRL-C2 integrates all required USB PD tests into a single 2-port tester, including all tests supported on GRL’s USB-IF approved first generation solution introduced in 2015. Each port can be configured independently as a PD Provider or Consumer. All other PD Protocol and Power tests are fully integrated, removing the need for external electronic loads.
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802.1 Core Test Software
IOL vIOLett®
The same tool used for testing everyday in the UNH-IOL Ethernet Switching Protocols (ESP) Testing Services is now available to use in your own labs. See the below list of available testing packages. Each test package contains a complete set of tests for use with IOL vIOLett® Software, which is included with any test package license.
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Ultra Portable SuperSpeed USB Analyzer
Advisor T3
Teledyne LeCroy’s Advisor T3 is an ultra portable SuperSpeed USB analyzer that delivers market leading accuracy at an extraordinary price. Designed to put precision USB protocol test tools in the hands of every engineer, the Advisor includes all the essential features for SuperSpeed USB debug.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Infotainment Test for Automotive Applications
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
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ARINC 818 Analyser
iWave’s ARINC 818 Video Protocol Analyzer (VPA) instantly verifies the ADVB Packets against ARINC818 Standards. ARINC818 VPA software efficiently captures, decodes the ADVB data, and displays the ADVB data, raw video data, and error status. It is an excellent troubleshooting tool that helps to quickly detect and rectify errors in the ARINC 818-2 applications, simultaneously ensuring compliance of the system with the ARINC 818-2 standards.
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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USB 2.0 Protocol Analyzer
Mercury T2
The Mercury T2 is the industry's smallest, most affordable hardware-based USB 2.0 protocol analyzer that combines the defacto standard CATC Trace display with powerful analysis features. The pocket-sized Mercury T2 is bus powered and is controlled using any Windows PC. With comprehensive triggering, the Mercury T2 provides much of the same lab quality protocol analysis capabilities offered in Teledyne LeCroy's top-of-the-line USB analyzers.
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Wireless Protocol Analyzer
Frontline X500
The Frontline X500 Wireless Protocol Analyzer is a powerful one-box test solution for wireless product developers that captures information streaming between devices enabled with Bluetooth, Wi-Fi, and 802.15.4 technologies.
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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SAS 4.0 Protocol Analyzer
Sierra T244
The Sierra T244 is a SAS 4.0 protocol analyzer designed to non-intrusively capture up to four 24 Gb/s SAS logical links providing unmatched analysis and debug capabilities for developers working on next generation storage systems, devices and software.
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Protocol Analyzer / Jammer for PCI Express 5.0
Summit M5x
The Summit M5x is Teledyne LeCroy's PCIe/ NVMe Jammer solution and is the latest protocol analyzer targeted at high speed PCI Express 5.0 I/O-based applications such as workstation, desktop, graphics, storage, and network card applications.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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High Speed Test Bench
AT444
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Environmental Control System Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Bottom Electrode SMD Test Fixture
16198A
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Modular Functional Testing Platform
OTP2
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Electronic Control Unit Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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PCIe 2.0 Test Platform
PXP-100B
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
