Image Analysis
The extraction and analysis of data from images.
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Product
Comprehensive Analysis
RemoteView™ PRO
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Our flagship thick-client imagery exploitation product, RemoteView Pro, provides analysts with premier analytical tools. Users are able to quickly enhance imagery and gain valuable perspective through analytical tools and extensions that are essential for mission planning and operational support. As the geospatial intelligence solution of choice, RemoteView has a long history of success across a broad range of users within the U.S. intelligence community, Department of Defense, and across analysis directorates in 27 countries.
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Product
Dynamic Signal Acquisition and Analysis
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m+p Analyzer systems are available for field and laboratory use from 4 to many hundreds of measurement channels. From gathering simple time history data to narrowband (FFT) spectra, fractional octaves, wavelets, shock response spectra and much more, m+p Analyzer real time analyzers can be used with a wide range of instrumentation hardware including our own m+p VibPilot, m+p VibRunner and m+p VibMobile systems, National Instruments (CompactDAQ USB, PCI, PXI) and VTI Instruments (PCI). Low cost portable instruments to systems for distributed measurements can be configured for maximum flexibility. Measurement data from all sources are stored in a common format so it is easy to compare and handle results from any measurement source.
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Product
4G Analysis & Drive Studies
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Berkeley Varitronics Systems, Inc.
Portable, calibrated test transmitters and receivers to simulate and analyze cellular 4G LTE, CDMA, UMTS and WiMAX base station coverage for drive study engineers and technicians.
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Product
4D Imaging Radar Chipset Solution
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Through enhanced FMCW technology, Arbe’s chipset technology transmits and receives signals from multiple antennas. By converting information from time to frequency domains (FFT), Arbe provides a 4D image with unparalleled element density in high azimuth and elevation resolution while simultaneously sensing the environment in long range with a wide field of view in real time. Additionally, Arbe technology reduces sidelobe occurrence levels close to zero, resolving range-doppler ambiguities and avoiding interference from other radars.
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Product
System Modeling for Diagnostic Design and Analysis
EXpress
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eXpress is a comprehensive model-based diagnostics engineering software application providing an environment for the design, capture, integration, evaluation and optimization of complex or large-scale system diagnostics, prognostics health management (PHM), systems testability engineering, failure mode and effects analysis and system safety analysis. eXpress is uniquely suited to influence the diagnostic development for new designs or to exploit the diagnostic challenges of existing legacy systems. Its robust structure facilitates the capture of extensive interdisciplinary design knowledge providing an unmatched ability to corroborate, reuse and re-purpose expert knowledge in performing standardised testability, reliability and maintainability analyses.
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Product
Sound Analysis Software NoiseImage
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Our sound analysis software NoiseImage is a general-purpose platform software providing all tools required for the whole measurement and analysis process. You can use the core package on its own or expand its functionality with any combination of add-on modules for different acoustic measurement types or analysis methods. The add-on modules connect seamlessly via one integrated software environment. You can combine as many expansion modules as you need.
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Product
Multifunctional Thermal Imaging Monocular
FLIR Breach® PTQ136
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Built for the rigors of law enforcement, the FLIR Breach PTQ136 spots the heat of suspects and objects in total darkness. Featuring the new FLIR Boson core and a compact design, the FLIR Breach offers unmatched tactical awareness. Weighing only 7.4 ounces (210 grams), the FLIR Breach can be concealed in a pocket or mounted to a helmet with its mini-rail feature, while adding minimal weight to officers’ heavy gear. Additional features include onboard recording and seven palettes for fast detection of suspects or evidence, day or night.
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Product
2D Multibeam Imaging Sonar in Compact Form Factor
BlueView M450 Mk2
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Your product description goes here.BlueView M-series - when you can’t compromise on imagery. Compact full featured 2D multibeam imaging sonar in a compact form factor with low power requirements. Delivers high quality sonar imagery over a wide field of view with leading data quality.
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Product
Professional Imaging Moisture Kit
MR160-KIT5
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The FLIR MR160-KIT5 has all the tools you need to quickly locate and diagnose moisture issues. Featuring Infrared Guided Measurement (IGM™), the MR160 visually guides you to the problem so you can confidently take measurements and analyze readings. An integrated pinless sensor and an external pin probe provide the flexibility to take either intrusive or non-intrusive measurements. The kit also includes a hammer/wall cavity probe combo for additional measurement applications.
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Product
Systems Analysis Interface
Saint2
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The Systems Analysis INterface Tool 2, a Delphi Preferred Tool, for Low-cost EOL Testing & Reflashing Without the Need of Additional Hardware.
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Product
Liquid Crystal Thermographic Analysis Tool
thermVIEW
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Advanced Thermal Solutions, Inc.
thermVIEW is a high resolution liquid crystal thermography system for cost effective temperature measurement of electronic circuit boards, micro circuits, hybrid components and integrated circuits. One micron level* thermal mapping of electronic devices.
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Product
Data Acquisition Analysis SystemWave Stocker
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This is the really useful equipment which our Solution Teamdeveloped using their experience obtained at their customer' s site.Simultaneous measurement by with sampling of max.16 channels is possible, enabling easy waveform analysis. This can be used for versatile tasks as the measurement at the site, inspection and R & D.
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Product
1600x1200 Pixel Sapphire CMOS Image Sensor
Sapphire 2M
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This 1,600 x 1,200 pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 50/60 fps in full resolution. Novel industrial machine vision application features such as multi ROI, histogram outputs and 3D range gating are embedded on-chip.
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Product
Failure Analysis
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Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
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Product
Thermal Imagers & Systems
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Advanced Energy’s turn-key thermal imagers and systems accurately measure temperature and use reliable infrared technology. These high-tech instruments can precisely determine the temperature and temperature distribution of small and fast-moving objects.
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Product
Signal Analysis
STA/LTA Detector
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The STA/LTA Detector program is a representation of a detector of various events in triaxial or single-component time signals. The software is based on one of the STA/LTA detector types.
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Product
E-Band Signal Analysis Reference Solution
Reference Module
The E-band signal analysis reference solution provides an effective measurement solution for today’s wideband signals as well as emerging communications standards. With the M1971E waveguide harmonic mixer, which provides a 55 to 90 GHz input; Keysight oscilloscopes, which provide excellent signal integrity; and the powerful 89600 VSA software, you have a high-quality wideband measurement solution. A simple user interface also provides integrated mixer setup, correction and LO optimization, allowing for accurate measurements.
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Product
Manual Media Analysis Solutions
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Truly one tool to view them all. The Ultimate Analyzing Tool for manual in-depth analysis, verification and validation of various file formats and containers. Metadata extraction and stream manipulation available.
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Product
The Leading Measurement System for the Analysis of Porous Materials
ELWIS
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ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.
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Product
Stack Usage Analysis
StackAnalyzer
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AbsInt Angewandte Informatik GmbH
StackAnalyzer automatically determines the worst-case stack usage of the tasks in your application. The analysis results are shown as annotations in the call graph and control flow graph
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Product
Machine Tool Analysis
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HEIDENHAIN offers comparator encoders for the calibration and acceptance testing of machine tools. These modular sytems deliver very high measurement accuracies with optical scanning and a sturdy measuring standard. Robust and easy-to-use, they are well-equipped for frequent usage under shopfloor conditions.
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Product
Analysis System
Pegasus (EDS-EBSD)
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The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Product
AXIe Logic Analysis & Protocol Test
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Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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Product
Wafer Analysis Systems
Tropel®
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Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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Product
Water Fluoride Analysis
Aztec AFM631
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The Aztec 600 fluoride analyzer provides reliable and highly accurate measurement of fluoride concentrations to enable precise control of water fluoridation.
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Product
Measuring Microscopes, Image Processing + Drawing Die And Wire Measurement
Easy Low Cost Wire Drawing Die Measuring Microscope
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Optik Elektronik Gerätetechnik GmbH
Simple optical measuring system for diameter and ovality of wire drawing dies with image processing software.
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Product
Thermal Analysis
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Thermal Analysis is important to a wide variety of industries, including polymers, composites, pharmaceuticals, foods, petroleum, inorganic and organic chemicals, and many others. These instruments typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature. Properties characterized include melting, crystallization, glass transitions, cross-linking, oxidation, decomposition, volatilization, coefficient of thermal expansion, and modulus. These experiments allow the user to examine end-use performance, composition, processing, stability, and molecular structure and mobility.
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Product
Visible / Infrared / Imaging Test System
System 1808
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Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Product
Spectrum Analysis Up To 125 GHz
S93093B
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The S93093B has all of the capability of the S93090xA spectrum analyzer application with an upper frequency of 125 GHz
