Image Analysis
The extraction and analysis of data from images.
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Product
Advanced All-in-One Bluetooth® Analysis System
Vanguard
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The most advanced, most comprehensive Bluetooth protocol analyzer ever made. Building on a legacy of innovation, the Bluetooth Vanguard All-In-One Protocol Analysis System delivers new advances designed to ease the increasingly complex tasks of Bluetooth developers. Vanguard provides synchronized capture and analysis of BR/EDR, Bluetooth Low Energy, Wi-Fi 802.11 a/b/g/n/ac (3x3), WPAN 802.15.4 (all 16 2.4 GHz channels), raw 2.4 GHz RF spectrum analysis, HCI (USB, UART, SPI), generic SPI/UART/I2C/SWD communications, WCI-2, logic signals, and Audio I2S.
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Product
Analysis Tool
CANalarm
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The CANalarm is a low priced analysis tool that can be installed in the bus permanently. It makes it possible to build up a separate and redundant monitor without change of configuration and program of the master controller. It works passive and is therefore non reactive
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Product
Protocol Trigger And Decode Analysis Software
I3C
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Tektronix I3C Software runs on Tektronix DPO/MSO5000, DPO7000 and DPO/DSA/MSO70000 oscilloscope series. I3C Software uses the hardware based real-time I3C protocol aware trigger, protocol analysis of long acquisition record length up to 125MB to provide superior I3C Protocol Analysis result at the press of button.
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Product
Imaging Multichannel Spectrometer
CC-55
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CC-55 Imaging Multichannel Spectrometer - Simultaneous acquisition 10-26 Fiber Inputs (with diameters in the range of 100-400 mic) Interline CCD, may allow a shutter-free set-up (Call us) Line imaging on tall Sony ICX285AL CCD.
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Product
Dynamics & Transients Analysis Software
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Dynamics & Transient analysis software enables engineers to simulate sequence of events including power system disturbances and evaluate system stability by utilizing an accurate power system dynamic model.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Device Parameter Analysis
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bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Product
Vibration Analysis
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The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
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Product
FPGA Image Processing (IP) Development Kit
ProcVision
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Gidel’s Vision Pro Development Kit is an optimal solution for developing,validating, demonstrating and evaluating Image Processing (IP) andpipeline designs on FPGA.The suite is designed to provide a complete and convenient envelop enablingthe developer to focus strictly on the proprietary image processingdesign. The entire Vision Pro flow is within a single FPGA, independentof the final target application(s). The Vision Pro flow is composedof a pipeline that streams simulated data to the user image processingdesign under test (DUT) and then captures the design’s output streamfor displaying, storing, analysis and/or co-processing on host software.The entire process is performed on a single FPGA without the need foradditional peripheral connectivity or tools.Vision Pro suite is plug-and-play enabling the developer to begin at oncethe IP design development and validation. A simple design example providesthe developer immediate hands-on familiarization with the systemflow and supporting tools. The final design can be ported to any IntelFPGA device or other vendors’ devices (FPGA or ASIC) by replacing basiclibraries. To significantly reduce compilation time, initial design developmentmay be on a small FPGA device and later compiled for the targetdevice(s). The target implementation may use any FPGA board. For a fullImaging/Vision system solution, Gidel offers a number of off-the-shelfgrabbers and FPGA accelerators that are designed to utilize these imageprocessing blocks and Gidel Imaging Library (GIL).
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Product
Shock Response Spectrum (SRS) Analysis Solution
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Shock Response Spectrum (SRS) Analysis SolutionMechanical shock pulses are often analyzed in terms of the shock response spectrum. The shock response spectrum assumes that the shock pulse is applied as a base input to an array of independent single-degree-of-freedom systems. SDOF system assumes that each system hat its own natural frequency.
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Product
Evaluation Units and Analysis Software
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Benefit from over 40 years of experience in inline and laboratory beverage analysis: Connect Anton Paar’s versatile and well-proven evaluation units to all generations of Anton Paar density, sound velocity, concentration and CO2 sensors. Let the data acquisition and visualization software master complex measuring tasks for you – bringing home the precision that marks measurement solutions from Anton Paar.
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Product
Functional/Protocol Debug and Analysis Reference Solution
DDR4
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Highest confidence in measurement accuracy! Industry’s fastest triggering and data capture for DDR4 analysis, test, and debug.
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Product
Automated Titration Analysis Systems
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MANTECH is a leading manufacturer of multi-parameter and titration analysis systems. We can deliver custom analysis systems that perform the following functions: pH, Chloride, Oxygen, Turbidity, Alkalinity, Fluoride, Oxidation-Reduction Potential (ORP), Nitrate, Electrical Conductivity, Color, Salinity, Total Hardness, Acidity, Ammonia, Temperature and Soil pH & Conductivity.
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Product
Solution for Flight-Data Recording and Analysis
dataMARS104
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AMPOL's reliable and field-proven product, the dataMARS104, is a complete, state-of-the-art, flight qualified solution for recording, monitoring and analyzing flight data. Once the unit is installed on the aircraft, its solid-state recording media can be easily removed and taken directly into the lab for analysis and report generation. Its included unique and powerful post-analysis software has the ability to decode flight data on-the-fly, even while recording is in progress providing an accurate, up-to-date, realtime picture of the data as it happens.
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Product
Probing & Analysis Adapters
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No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Product
DCME Analysis System
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DCME Analysis System (SCL-DAS) is a software based application, which is designed to classify, process and decompressed the compressed signals transmitted over the satellite links.DCME Analysis System supports most of the commercially available DCMEs including PCM, ADPCM, DX-3000, DX-7000, DTX-600, DTX-360, DTX-240 (D,E,F,T), CELTIC-3G, OKI TC-2000 etc. While processing the compressed/normal E1 carrier, the SCL-DAS provides the processed intelligible output in the form of Voice and Fax along with Originating Point Country, Destination Point Country, Outgoing Number, Incoming Number etc.
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Product
Processing and Analysis Software
DATAVIEW
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The DataView® software is an essential tool for configuring and performing measurements, viewing data in real time, recovering recorded data and creating standard or customized measurement reports.
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Product
PC Analysis Software
TekScope
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Get the analysis capability of an award-winning oscilloscope on your PC. Analyze waveforms anywhere, anytime. The basic license lets you view and analyze waveforms, perform many types of measurements and decode the most common serial buses - all while remotely accessing your oscilloscope. Advanced license options add capabilities such as multi-scope analysis, more serial bus decoding options, jitter analysis and power measurements.
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Product
Fluid Analysis Information Management System
SpectroTrack
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SpectroTrack is an Information Management System (IMS) optimized for laboratories that specialize in the analysis of in-service (used) lubricants for machine condition monitoring. The browser-based system is the ideal tool for accessing historical and trend information about an organization’s high-value assets. The software provides a single end-to-end view of a sample lifecycle from sample submission and receipt to results entry. The software also provides all trending, imaging, numerical and textual asset data in one secure location. Clients can see a comprehensive, historical view of fluid condition for an engine, department or an entire fleet.
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Product
Inductively Coupled Plasma Spectroscopy (ICP-OES/MS), ICP Analysis Services
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ICP-OES measures the light emitted at element-specific characteristic wavelengths from thermally excited analyte ions . This light emitted is separated and measured in a spectrometer, yielding an intensity measurement that can be converted to an elemental concentration by comparison with calibration standards. ICP-MS (ICP-Mass Spec) measures the masses of the element ions generated by the high temperature argon plasma. The ions created in the plasma are separated by their mass to charge ratios, enabling the identifcation and quantitation of unknown materials. ICP-MS offers extremely high sensitivity (i.e. low detection limits) for a wide range of elements
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Product
Terahertz Coating Thickness Analysis
TeraCota
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TeraView presents a film thickness gauge designed for the automotive industry. The sensor can determine the individual thickness of multiple paint layers on both metallic and non-metallic substrates and offers significant benefits over existing techniques.
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Product
SWIR Image Sensors
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Though NIR and SWIR act similarly to visible light, they are not visible to the human eye. As a result, these spectrums present valuable information which can show artifacts or damage that would otherwise not be seen. Click here to see some examples of how SWIR is being used in existing applications today.
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Product
Widely Tunable Ultrafast Laser System For Multiphoton Imaging
InSight X3
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Spectra-Physics’ new InSight® X3™ is the third generation of Spectra-Physics’ industry leading InSight platform, specifically designed for advanced multiphoton microscopy applications. Based on patented technology1, InSight X3 features a broad 680 nm to 1300 nm continuous, gap free tuning from a single source, nearly double the tuning range of legacy Ti:Sapphire ultrafast lasers. InSight X3 delivers high average and peak power levels across the tuning range, including critical near infrared wavelengths above 900 nm for deepest penetration in-vivo. With Spectra-Physics’ integrated patented DeepSee™, the industry standard dispersion pre-compensator, the short pulses are optimally delivered through a microscope to the sample for maximum fluorescence and penetration depth. InSight X3 also has exceptional beam pointing stability, beam quality and output power stability, as well as fast wavelength tuning, making it ideal for microscopy.
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Product
Incident-based Abnormal Software Behavior Analysis Services
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If you have a software problem that no one can analyze, need training to get your developers, support and escalation engineers improve their troubleshooting, debugging, memory dump and software trace analysis skills or just need the expert opinion on an existing analysis report please don't hesitate to contact us.
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Product
LPDDR5 Protocol Debug And Analysis Solution
U4971A
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The LPDDR5 Solution Bundle provides a systemized hardware, probing, and software solution for LPDDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Product
Structural & Stress Analysis
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Structural analysis is critical because it can determine cause and predict failure – evaluating whether or not a specific structural design will be able to withstand the external and internal stresses and forces expected for the design.
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Product
Thermal Imaging
JOHO272
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Wuhan JOHO Technology Co., Ltd
With innovative design and superior functions, this thermal weapon sight sets a new standard to build in an eye-safe laser ranger finder which you can get target distance very easily. The thermal aiming and laser ranging scale line would be changing smaller as distance further so that the shooter would easily and quickly lock target even in a further distance. To improve shooting percentage, as many as ammunition drop chart can be input to the sight program. Should any drop chart be selected, the sight would automatically generate a new shooting scale line after program calculating temperature, angle, wind speed, altitude. Different button size and battery convex design friendly for shooter night us
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Product
Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Product
Imaging Spectrocolorimeter
RM200QC
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The X-Rite RM200QC Imaging Spectrocolorimeter simplifies color measurement from incoming material to outgoing product shipments in a portable unit that fits comfortably in your hand.
