Pattern Generators
Produces volumes of a binary stream to test digital elements.
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Product
Fiber End-Face Inspection Interferometer
CLEAVEMETER 3D
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The CLEAVEMETER 3D™ is a non-contact interferometer designed for inspecting the end-faces of cleaved or polished optical fibers with cladding diameters of 125 µm to 1200 µm. It gives immediate and precise information on important end-face properties such as flatness, perpendicularity, hackles and dust. Based on the NYFORS CLEAVEMETER 3D™ design, in addition to producing sharp fringe patterns it also generates three-dimensional images of the cleaved fiber end.
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Product
Test Pattern Generator Software
ScanExpress TPG
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To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
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Product
12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector
CA9806-12
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The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
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Product
ATPG with Embedded Compression
TestKompress
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TestKompress is an automatic test pattern generation (ATPG) tool that provides the highest quality scan test with the absolute lowest test cost. TestKompress has an industry-proven ATPG engine that applies effective fault models to your entire logic design. Manufacturing test costs are held in check by an award-winning test pattern compression technique called Embedded Deterministic Test (EDT).
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Product
Bit-Error-Ratio Tester
OPBX280
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The OPTELLENT OptoBERT™ OPBX280 is a cost-effective easy-to-use bit-error-ratio tester (BERT) for testing components and systems in R&D and manufacturing environments at data rates up to 28 Gb/s. The OPBX280 incorporates an internal reference clock, a pattern generator, clock recovery, and a BER analyzer, in an extremely compact module.
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Product
PAL Standard Pattern Generator
PG315P
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Product
125 Mbps Low Frequency Bit-Error-Ratio Test System
OPBK125
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The OPTELLENT OptoBERT™ OPBK125 is a costeffective easy-to-use bit-error-ratio (BER) measurement system for testing components and systems in R&D and manufacturing environments as well as field installations. It incorporates a pattern generator, clock recovery circuits, and a bit-error-ratio analyzer in one compact module that provides electrical interfaces at data rates up to 125 Mb/s.
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Product
Camera Link Simulator
CLS-221
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The CLS-221 Camera Link Simulator is an affordable, high-performance video test pattern generator that supports all video formats including those introduced in the new version 2.1 specification. Fully programmable video timing enables the CLS-221 to mimic the characteristics of almost any camera. New features include enhanced timing performance, bayer color support, and additional video patterns. Control is via an RS-232 port, USB, or frame grabber COM port. The CLS-221 also incorporates the AIA validation test pattern.
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Product
HDTV PATTERN GENERATOR
HG139
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The HG139 is an easy-to-use handheld video pattern generator that generates a wide variety of test patterns for comprehensive testing, calibration, and repair of HDTV, analog television monitors, and other video equipments. The HG139 delivers the quality and functionality you would expect from the expensive high end HDTV pattern generator at a very affordable price.
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Product
Remote Intelligent Pod
ScanTAP
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The test patterns generated by the PCI-1149.1/Turbo controller are distributed to the target system either directly through ScanTAP 4 and ScanTAP-8 pods. The ScanTAP-4 and ScanTAP-8 pods can apply test vectors and/or ISP patterns to target boards with a variety of JTAG chain topologies. In the simplest case, the ScanTAP-4 and ScanTAP-8 will provide the interface between the PCI-1149.1/Turbo controller and a target system consisting of a single JTAG Test Access Port (TAP). This would be the case where the target system consists of one JTAG chain and its single associated TAP.
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Product
4.25Gbps Electrical & Optical Bit-Error-Rate Tester
OPB4250
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The OPTELLENT OptoBERT™ OPB4250 is a cost-effective easy-to-use bit-error-rate tester (BERT) for testing Fibre Channel (FC) devices, components, modules and systems in R&D and manufacturing environments as well as field installations of Storage Area Networks (SANs). OPB4250 supports 4GFC, 2GFC and 1GFC. The OPB4250 tester is also ideal for Gigabit Ethernet and Infiniband (2.5G) testing. It incorporates a pattern generator, clock recovery circuits, and a bit-error-ratio analyzer in one compact module that provides optical and electrical interfaces at up to 4.25Gb/s. An intuitive graphical user interface (GUI) enables easy point-and-click operation. The GUI displays error counts, BER, and related statistics.
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Product
Video Generators
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Black Burst, Full Field and SMPTE Color Bars GeneratorsFull-featured Digital Pattern Generator DG-4Range of analog products from single output black burst (SG-2) up to six black burst plus SMPTE Bars (SG-7)Full Field ID generation available in SG-3, SG-7, BG-3 and BG-7 modelsNTSC (all models) or PAL (DG-4, SG-2, BG-2CB, BG-3/7, BG-4CB, and BG-5CB)
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Product
PRBS Pattern Generator
PRBS Generator
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– Internal variable-frequency clock source– Wide operating range, from 10 Gb/s to 28 Gb/s– Small size – 94 x 60 x 20 mm3– Multiple output PRBS patterns– Differential outputs
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Product
Light Shaping
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VirtualLab Fusion supports light shaping by freeform surfaces, diffractive beam splitters and pattern generators, diffusers, and general arrays of micro-optical components, including, but not limited to, micro-lens arrays.
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Product
Display Color Analyzer
Model 7123
Analyzer
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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Product
Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
Pulse Generator
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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Product
NTSC Standard Pattern Generator
PG315N
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The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Product
PCIe Fast Digital Waveform Acquisition/Pattern Generator - 32 Digital I/O Channels, 1 kS/s up to 125 MS/s Sampling Speed
M2P.7515-X4
Digital Waveform
The M2p.75xx series of fast digital I/O cards allow to acquire or replay digital patterns with a programmable speed of up to 125 MS/s. The direction can be switched by software between input (digital data acquisition) and output (digital pattern generation). The on-board memory of 1 GByte can be completely used for digital pattern. Furthermore the on-board memory can be switched to a FIFO buffer allowing to continuously stream data in either output or input direction.
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Signal Generators
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2, 4 and 8 Channel Arbitrary Waveform Generator and Pulse Pattern Generator solutions are ideal choice in automated test benches, for physics experiments, semiconductor tests, analog and digital debugging.
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Product
16-channel, 1GHz, 1Mb/ch USB Logic Analyzer Plus 8-Channel Pattern Generator
LA-Gold-16
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A maximum sampling rate of 1 GHz is available on all channels. The LA-Gold-16 has a large data buffer of 1 Mega samples per channel for sampling rates of up to 500 MHz on all 16 channels. The large buffer allows long capture times at high sampling rates. The digital logger function is for capturing very slow varying signals, e.g. room temperature.
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Product
4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector
CA9806
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The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
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Product
8K Super Hi-Vision Video Pattern Generator
Model 2238
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Featured in modular design, the 2238 Video Pattern Generator is capable of providing 8K Super Hi-Vision (7680 x 4320 / 8192 x 4320) resolution for testing. Full 8K at 30/60 Hz resolution is supported by one single module (via a HDMI Display Port), and up to 4 modules can be installed and configured as required for all testing application to 8K. DisplayPort 1.3 signal module (Optional)
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Product
Video Signal Generator
MSPG-8000
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The MSPG-8000 is a high performance slot type multi video test pattern generator. You can add-on any type signal generator such as HDMI, Displayport, DVI, Analog, Component, S-Video, CVBS, SCART, and audio, up to 8 slots.
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Product
Video and stereo audio test generator
TELETEST PRO
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A pocket sized, battery powered professional audio and video test pattern generator.
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Product
GPIB Interface Card
PI-31000
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The Pulse Instruments PI-31000 IEEE Interface Card is a standard GPIB Interface card offered by National Instruments. This interface card is used in applications where the PI-2005 Pattern Generator or other instruments are controlled from a remote system CPU, or it can be used as the system controller when the CompactPCI CPU is the system computer.
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Product
Modulated Sources and Receivers
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CSI's modulated fiber optic sources are optimized for high-speed modulation up to 12.5 Gbps. The units are intended to be modulated by a pattern generator for testing the performance of optoelectronic components such as photodetectors and receivers. They are powered by wall plug units.
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Product
HOTLink module (SAM)
ARINC 818
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The HOTLinkTM stand alone module (SAM) is an invaluable tool for HOTLink testing. The SAM can be used as a portable signal converter, splitter, test pattern generator, or continuity tester. The SAM comes standard with an A/C adaptor and is also compatible with A/C 28 VDC.
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Product
Pattern Generator
PI-2005
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As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Product
Pattern Generator
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AVLINK TECHNIC TAIWAN CO., LTD.
* Intelligent functionality. * With 162 MHz pixel frequency. * Support total 38 timings. (up to UXGA) * Support Sync Type: H/V (TTL), SOG. * Low cost. * Single interface easily use. * Portable design, working time up to 8 hours by inside Re-chargeable battery. * Auto Power-off on Battery mode. * Provide total 34 patterns, Include: Color bar, Gray, Grid, Block¡K * By 16x2 Character LCD and key buttons, easily control.
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Product
DWL 2000/4000 GS Laser Lithography Systems
DWL 2000 GS / DWL 4000 GS
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The DWL 2000 GS / DWL 4000 GS Laser Lithography systems are state-of-the-art pattern generators renowned for their speed and flexibility. These systems leverage advanced grayscale lithography technology that not only complies with the highest industrial standards but also generates complex 2.5D topographies essential for micro-optical applications.





























