System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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400GbE Load Modules
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Keysight Network Applications and Security
The Ixia 400GbE Jumpstart Test System is a developer tool kit to help network equipment manufacturers shorten development and test time – accelerating pre-standard 400GbE networking hardware. Now customers can create, test and verify the interoperability of their next Higher Speed Ethernet technologies while maximizing their 400GbE test investment.
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PXI Programmable Resistor Card 4-Channel 2 Ohm to 255 Ohm - SPST
40-294-113
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These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Rack - Rotatable Arm for Peripheral Devices
OTP2-Modul-Nr041
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The module is for mounting on a rack, such as the midi or maxi rack. The extension of the module can create new possibilities for your test system.
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Check Case Definition Language
CCDL
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CCDL is a test specification language that provides a dedicated high-level and easy to learn test language for powerful requirements based system testing. The fully automated test execution and evaluation shortens testing cycles and reduces required manpower. The intuitively readable CCDL test specification reduces documentation effort and the test execution flow visualization reveals the dynamic behavior of the system under test (SUT) and clearly spots any deviations against the expected results.
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PXI Precision Resistor Module 9-Channel, 2 to 102k
40-297-034
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This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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100 High Speed Programmer
Commander Accelerator
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The Commander High Speed Programmer (HSP) is low overhead system designed to test Flash Memories, PLA's and Micro-controllers. The parallel multi-module architecture provides the flexibility to program and test multiple devices. It's full-featured capabilities support chip erasing and programming, sector erasing and programming, sector protect and unprotect, and data verification functions.
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P-GW Functional Tester
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The LTE PGW Functional Tester provides a wrap-around test solution for the Packet Date Network Gateway by emulating all the LTE network elements surrounding the PDN-GW (System Under Test). The P-GW Functional Tester emulates LTE Core Network entities such as the S-GW, PCRF, OCS and OFCS. It tests the S5/S8, S7/Gx, Gy and Gz interfaces of the P-GW.
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Modulation Distortion Up To And Beyond 125 GHz
S930713B
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S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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DynEDGE Controller
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The DynEDGE controller offers an integrated, multi-loop control and data acquisition system in an off-the-shelf solution for dynamometer applications, including system modernizations, new installations, turnkey systems, and complete test cell control and data acquisition systems. The controller provides both speed and torque control with four control channels that can be configured for ±100 mA, ±10 V, and ±20 mA.
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Waveform Generators
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Drive your test systems forward with PXI instruments from Astronics. Small size, power-packed, and cost-effective, these waveform generators provide the perfect upgrade for your test bench.
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Software
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Besides the primary WITE32 Test Environment package at the heart of our spinstand-based test systems, Guzik offers a variety of software options to provide additional measurement accuracy and analysis. Control and Automation software enhances various electro-mechanical capabilities of the test system (such as servo accuracy), and the available suite of Analysis software tools provides deep insight into the drive component under evaluation. Adjacent Track Interference, 3D Pulse Profile, Media Scanning and Bit Error Rate are examples of some of the optional additions. Some software tools require the WDM5000 Waveform Digitizer to be part of the overall test system.
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Product
Copper Diffusion TestSystems
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Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded. The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.
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Powertrain
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The MOTOMEA Electric Powertrain Dynamometer is part of a fully integrated modular system with hardware-in-the-loop testing. System capabilities include drive cycle and virtual test driving. Powertrain testing capabilities also include battery testing and simulation using bidirectional DC power supply.
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Surge Generator
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Surge Generator is the backbone of underground cable fault locator test systems. Surge Generator is used with a Prelocator for fault distance measurement and also used with a PinPointer for pinpointing the fault spot.
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Servopulser Table-Top Fatigue And Endurance Testing Machine
EHF-L Series
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This revolutionary fully digital servo controlled multi-functional materials testing machine opens up a new era in fatigue testing systems. It provides excellence in all aspects, including precision, reliability, and expandability, through its fully digital control achieved by bringing together the latest technologies.
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ECM Noise Under RF Test System
BK8020
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The BaKo Type BK8020 ECM Noise Under RF Test System tests microphones under RF noise, using a ‘Direct Injection Test’ in the frequency range of 5MHz~2.5GHz with an amplitude modulated (AM) disturbance signal of 1kHz. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When you finish testing, you can print data as an MS Excel report or save it for comparison and analysis.
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Flying Prober Test
QTOUCH1202C
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Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.
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Scienlab Measurement And Control Module
SL1063B
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The Measurement & Control Module SL1063B is a rack-mount measuring and control module for measuring and switching of digital signals with 16 digital in-/output channels. The module can be used either as a stand-alone device or as extension for a Scienlab Battery Test System.
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In-Line Debug Press
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Use for DEBUG without having an In-Line TesterUse Standard 3070 Test System for DebugSupport In-Line Tester on current 3070Verify Form and FitSlides in and Out like on an actual In-Line System
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RSE Wireless EMC Spurious Emission
TS8996
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The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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System Integration
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Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.
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Robotic Cell for Testing Car Multimedia System
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It is necessary to develop an automated system for testing a multimedia device. The system should perform functional testing: testing of physical buttons, touch screen and logic of operation.
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CMK Mechanical Kits
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Columbia has created a unique mechanical click system using ball bearings and guiding sleeves. The UUT is connected to the spring contact pins that are connected to the testing environment in a completely linear fashion. Connecting the UUT to probes can be approached both from the top and the bottom and, optionally, even from the side. The ergonomic housing provides generous space for additional measuring electronics. The back and bottom of the housing can be adapted to the various test system interfaces.
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AirTech Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Hillger NDT has developed AirTech testing technology for the requirements of air-coupled testing. Our USPC 4000 AirTech ultrasonic testing system and our robust AirTech sensors consisting of optimized transmit and receive probes deliver optimal results under demanding conditions.
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High-Density PXI Oscilloscopes
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PXI and PCI general-purpose oscilloscopes offer scalable multichannel data capture in a compact, highdensity modular design, well suited for automated test systems with space and channel needs. General-purpose PXI/PCI oscilloscopes deliver scalable multichannel acquisition in a high-density and compact modular format, ideal for automated test systems with demanding space and channel count demands.
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Functional Test System
TS-5040
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The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 2.97MΩ
40-251-151
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The 40-251-151 is a programmable resistor module with 1 channel which can be set between 3Ω and 2.97MΩ with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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End to End Testing
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TestOrigen Software Testing Services Pvt Ltd.
End to End Testing basically refers to the method that verifies the application is performing according to users demand. While executing the E2E test, the complete software system from beginning to end is certified. This is done after functional and system testing and is also carried out as a regression test to validate and verify any patches or changes.
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Systems Integration for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions integrates CCAs and other sub-assemblies, cables and fabricated parts into system modules shipped directly to customers for integration into their products.- Box Build: custom built to order system solutions- High complexity box assemblies and subsystems- High frequency RF box assemblies and subsystems- Full functional RF testing up to 26 GHz (K band)- Multi-level systems integration – build and test modules and CCAs and integrate into higher level assemblies- Custom cell design for customer subsystems- Special bonding processes including thermal management and vibration- Robust torque and FOD control programs- System level testing including functional, vibration and thermal- Complex harness fabrication and integration- Fiber-Optic and RF waveguide integration and testing- Large system capacity in excess of 200 lbs.- Configure to order – Integrate different options, firmware, configurations, etc across a single order as required
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Bluetooth RF Test System
FRVS
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FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
