Visual Inspection
See Also: PCB Inspection
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Product
Complete Non-Contact Inspection System For OLED/TFT/LTPS
GX3/GX7
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*Fastest*Workable to large panel as well as fine pattern of medium-small panel*Workable to large mother glass of every generation*Possible to dock width Repair Machine
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Product
Ceramics and Glass Inspection Systems
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Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
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Product
3D X-ray hybrid inspection system
YSi-X
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Ideal for 100% inspection of onboard automotive products and many other items by 3D X-rays acquire layered of target. X-ray, optical, infrared, and laser height measurement as standard equipment; hybrid and high reliability with multiple inspection modes.
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Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Product
X-ray Inspection Of PCB Boards And More
The RTX Series
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Glenbrook’s RTX Series of modular, real-time systems include models designed to meet a variety of production requirements including circuit board components. Numerous options make it easy to customize any RTX model to your specific application. All hardware and software elements are fully compatible to ensure the continued value of your equipment.
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Product
In-Process Wafer Inspection System
7945
System
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
Double Sheet / Splice Inspection
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Leuze electronic GmbH + Co. KG
Double-sheet control sensors enable the reliable differentiation between one or more layers of very thin objects made of different materials. This allows, for example, single-layer paper sheets to be reliably pulled in or individual electrodes to be stacked for the production of a battery cell. Different operating principles, based on ultrasonics and capacitive sensors, cover the range of materials for different applications. Sensors for splice inspection detect desired and random splices in paper webs independent of the surface color and material properties.
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Product
Visual Fault Locator
TM191
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TM191 series visual fault locator is used for the measurement in single mode or multi-mode fibers. It features a rugged design, a universal connectorand an accurate measurement
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Product
Automotive Inspection Kit
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Produced specifically for the automotive aftermarket and Insurance Assessors, 3rd party consultants, body shops and used car sales, these kits provide an instant measure of the coating thickness of panels.An illuminated magnifier is supplied to enable close inspection of bodywork.Measurement parameters include:Surface temperatureSurface inspectionCoating thickness
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Product
Cargo and Vehicle Inspection
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In a world where threats continue to evolve and concealment techniques become more sophisticated, our customers are facing more complex, difficult missions than ever.
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Product
Analytical Gear Inspection Machine for Workpieces Up to Ø 6,000 mm
KNM X series
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machine structure with outstanding intrinsic accuracylarge bearing distances of guidesinherently stable granite machine base on active dampers to absorb vibrations ? no foundation requireddrive system close to center of gravitylinear motors in X-, Y-, Z- measuring axeshigh precision air- or hydrostatic bearing rotary tables (diameters from 500 to 1,800 mm) with direct drive and through holemotorized positioning of measuring column (V-axis) to the actual workpiece diameterlaser based system for safe operation
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Product
Solar Power Plant Inspection Service
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We provide various performance/safety tests including insulation resistance measurement, ground resistance measurement as well as string I-V inspection, EL inspection, and IR inspection using thermography. We provide services of pre-operation voluntary test and pre-operation self check, mandated by revision of FIT scheme in 2017 for solar plants of 500kW – 2,000kW.
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Product
Visual Fault Locator VFL X5007
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Metal case, Rugged and durableLow battery indication, to avoid leakage and wrong judgmentESD protection design, Protect the LD effectivelyIntegrated case, to avoid the case intermediate brokenRe-changeable ceramic tube, to avoid returning to manufacturer for this small faultLong battery life, up to 60 hours@1mW
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Product
All-at-once Waveform Visualizer and Comparator
Oscilloscope Multi
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The plugin offers stereo or mid-side channels waveform extraction as well as several synchronization modes. The zooming and precise measurement capabilities let you analyze the waveforms in details, and the XY phase scope view will help you track phase issues within an effect chain or while recording with multiple microphones
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Product
Visual Editor for the Automatic Test Markup Language (ATML)
ATML Pad
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Reston Software offers ATML Pad, a visual editor for the Automatic Test Markup Language (ATML).The ATML formats are versatile but complex. Direct editing in XML is next to impossible, even with capable XML editors. ATML Pad overcomes this problem by exposing an application-specific visual interface. ATML Pad manages the complexity of the ATML formats, allowing you to focus on describing your tests. It abstracts XML ID references, allowing you to simply select the referenced item from a list. In addition, ATML Pad can generate XML IDs automatically and ensures that IDs remain unique while you edit the data.ATML Pad allows you to quickly generate complex ATML constructs through a single mouse click. It validates your data during input and on-demand, ensuring that valid ATML documents are produced.ATML Pad interoperates with the NI TestStand ATML Toolkit to deliver automatic code generation solutions that reduce the cost of implementing NI TestStand test programs and ensures their cost-effective long-term maintainability.
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Product
Thin Film SPY Inspection w/ Built In Jeep Meter
780
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For thin film coatings the easy-carry and easy to handle SPY Model 780 speeds inspection time with its built in Jeep meter and various other time saving and comfort features.
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Product
High-speed In-Line 3D CT Inspection System
X-eye 6300
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Automatically inspects the defects of products in customer's line with high-speed 3D CT tomography.Able to inspect every defects of Double-sided PCBA & BGA mounted components precisely by solving overlapped X-ray image issue.Inspection speed of 3 sec/1FOV from loading to automatic Good/NG judgement.
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Product
AXI Inspection Systems
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises AXI Inspection Systems
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Product
Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Product
Real-time X-ray Medical Device Inspection System
The Bench-X
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Our latest real-time, compact system used for Medical Device X-ray Inspection. Very configurable and compact with high resolution at relatively low radiation levels.
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Product
IPC Inspection
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Customers of MASER Engineering that are designing electronic products and thereby using bare and assembled Printed Circuit Boards (PCB's) are interested in the manufacturing quality of the PCB and assembling quality of the PCBA.
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Product
Packaged Food X-ray Inspection System
EPX100
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Our revolutionary new x-ray system is so advanced it will not only improve your product safety and meet regulatory compliance but also will optimize and streamline your product inspection.
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Product
3/4D Image Visualization and Analysis Software
Imaris
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Our latest release, Imaris 8.4, introduces a new and innovative approach to tracing neuron structures in 3D images. Torch™, a patent-pending tool which intuitively highlights structures in close proximity to the cursor while darkening the rest of the image, enables users to efficiently and accurately trace individual neurons within dense and thick samples. Improved depth visibility makes tracing in thick samples easier than ever before, allowing for the selection of a dynamic region of interest for tracing. All of this possible with terabyte-sized datasets.
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Product
Visual Fault Locator
FFL-210-U
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FFL-210-U Visual Fault Locator is equipped with a 650 nm high power visible laser diode,can be operated in CW (continuous) or MOD (1Hz modulation) mode. There are two LED indicators:RED & GREEN; the RED one shows the operating mode of the Laser Diode output signal, and the GREEN one indicates low battery level. FFL-210-U is housed in a pocket-size, rugged metal casing, comes with a carrying pouch.
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Product
Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Product
Thickness and Flaw Inspection
MultiScan MS5800
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Eddy current testing is a noncontact method used to inspect nonferromagnetic tubing. This technique is suitable for detecting and sizing metal discontinuities such as corrosion, erosion, wear, pitting, baffle cuts, wall loss, and cracks in nonferrous materials.
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Product
Structural Adhesive Bead Inspection
Predator3D
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The Predator3D bead inspection technology measures bead height, width (volume) and position to assure structural integrity. It also alerts users to skips and partial skips, where material is deposited with insufficient volume.
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Product
High Power Fiber Optic Visual Fault Locator
VFL-700
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Shanghai Fibretool Technology Co.,Ltd.
The VFL-700 is specially designed for field personnel who need an efficient and economical tool for fiber tracing, fiber routing and continuity checking in an optical network during and after installation.
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Product
The Complete Solution for Optical Surface Quality Inspection
OptiLux SD (Scratch-Dig)
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RedLux’s OptiLux SD system provides the complete solution for control of optical surface quality (scratch-dig) by offering a breakthrough in measurement performance along with conformity to industry standards. Designed with flexibility in mind and further enhanced by a range of customer inspired features, the OptiLux SD can support the most demanding of optical surface quality inspection processes, from highly customized optical components in low volume, to standard components in high volume.
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Product
3D Automated Optical Inspection Systems
New 3Di Series
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To handle today’s rapidly changing market trends, the system can handle complex inspection challenges such as high component mounting density areas containing highly miniaturized parts placed near much larger and taller component. With our new 3D AOI system, you can strengthen quality assurance and increase production efficiency.





























