Board Test Fixtures
jigs which hold, align and engage pcb with test interconnect.
See Also: Fixtures, Test Fixtures, Bare board Fixtures, PCB Test Fixtures, Genrad Fixtures
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Research & Electronic Test Products
he CAL-AV Research & Electronic Test Product line includes Explosive Test Site Range Instrumentation, Illuminated Laser Warning Signs and Special Projects.. Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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Vacuum Test Fixtures
Vacuum fixture kits for Pylon block fixture, Teradyne, Keysight, Digitaltest,Seica, Cobham (Aeroflex), ATX exchangeable system.
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MIPI Test Fixtures & Software
The UNH-IOL has been a contributing member of the MIPI Alliance since 2007 and tests all mobile devices looking for MIPI conformance and physical layer testing including C-PHY, D-PHY, DSI, and CSI-2. All UNH-IOL MIPI Test Fixtures and Tools are available to member and non-member companies. Below are just some of the MIPI Solutions we offer. For a full list please visit our MIPI Test Fixtures page.
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Test Fixtures & Test Sets
Keysight test fixtures are used to hold electronic components or materials (physically and electrically) in order to perform various measurements. Keysight offers a variety of test fixtures from Parametric, Dialectrice, Liquid test fixtures and more.Some of our test fixtures allow you to connect directly to your measurement instrument, while others require various adapters.
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Mach Airspeed Test Fixture
TA-6055A
The TA-6055A is a Mach Airspeed Test Fixture built to support the testing and repair of the 2082 and 2083 series of Servoed Mach Airspeed Indicators (SMASI) used in some Boeing aircraft. These mach airspeeds are synchro driven and require a coarse and fine input for altitude and a third input for airspeed. This test fixture was designed around the test procedure and is interfaced with our TA-1001 panel which provides for two of the synchro sources and two Angle Position Indicators (API).
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Exchangeable Test Fixture
MA 2109/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Stand-Alone Test Fixture
MA 2013/D/H/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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PCB Test Fixture Kits
Emergent's fixture kits are available in bottom and double sided probing versions. They are fully scalable, from compact benchtop testers to full size multi-UUT production floor models. The removable, interchangeable plate design allows you to easily add and move test points, or swap out plates to test a completely different product. Each kit comes with a standard linear collapse over-clamp. A cam-follower closing system can be specified for higher force applications. Our fixture kits are manufactured using industrial grade phenolic laminate, which is similar to G10 in hardness and strength but easier to machine. The standard kit comes pre-assembled with blank plates for machining.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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In-Circuit Test Fixtures
Every type of in-circuit test fixtures (wired, wireless, pneumatic, vacuum) for all major tester brands.
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Custom Designed Test Fixtures
We specialize in automated test systems for both RF and digital devices, modules and systems. Please call to discuss your test requirements.
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Fixtures, Programming & Test Services
Comware Technical Services, Inc.
Fixtures and programming services are available for Agilent, GenRad, and Teradyne testers. Working from CAD data, a program can be created in only a few days allowing for fast and cost effective testing of your products. Engineering services are available for fixture revisions or repairs.
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Custom PCB Test Fixtures
Emergent Electro-Mechanical designs and manufactures customized test fixtures and burn-in racks. Each of our custom designs is unique to our customer's particular project requirements. Emergent fixtures feature innovative design components including a linear collapsing system, interchangeable and reusable plate design, and top and bottom probing.
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USB A TX Test Fixture
AUT20135
This newly designed AUT20135 brings enhanced user-experience with the following features:
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Universal Breakout Test Fixture
CA-323
The CA-323 Universal Breakout test fixture was designed to provide, as the name suggests, a universal test solution for aircraft trouble-shooting. The unit gives the technician the ability to monitor (100) different conductors or open an individual conductor for simulation or measurement. Any avionics component can be extended and in many cases with only a voltmeter and oscilloscope the operation in question of the Unit Under Test can be determined.
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GPS/FMS Universal Test Fixture
TA-3000
This panel was designed to give the avionics shop the capability to test and troubleshoot many of the GPS, GPS/COMM and FMS units on the market today. Breakout jacks are provided for both analog and digital signals that need to be monitored or simulated. A data port update jack is provided as well as Arinc 429 and RS232 loopback switches. Switches for Gillham altitude are provided as well as fuel flow adjustments. An array of annunciators and configuration switches are also provided to verify those outputs and inputs. Optional UUT configuration overlays also availabl
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Custom Vibration Testing Fixtures
Paragon Systems is unique in being able to not only perform your vibration test, but also to design, fabricate and qualify your vibration testing fixtures. Usually all we need from a client is their vibration test profile, a CAD model and the GD&T of the DUT.
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Latch-on Test Fixtures
Latch-on Test Fixtures provide a convenient way for production personnel to quickly and reliably make electrical connections to a product for programming or final test. These custom fixtures eliminate the need to hand-wire products in order to power them up and communicate with them. Typical applications for latch-on test fixtures are metering devices, control panels, and any type of controls that connect via terminal strips.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Test Fixture, Shielding Effectiveness
EM-2108 | 1.5 GHz – 10 GHz
The EM-2108 is a standard test fixture for evaluation of the electromagnetic shielding effectiveness (SE) of planar materials.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
