Application Security Testing
assures web application vulnerabilities are identified.
See Also: Penetration Testing
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Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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API Security Testing
In the world of digital civilizations, use of API is getting popular increasingly as a technology enabler and it connects various applications and micro-services through end points. Hence securing these end points are quite critical for businesses to protect the confidential data. QA Mentor uses the concept of API Fuzzing by providing random data to the target API until any unexpected behaviours or errors are observed. In addition, QA Mentor uses other applicable methods of API security testing like SQL Injection on target API, tampering of API parameters etc. We follow a strict 10 pointer checklist in our API software security testing services process to ensure better coverage:
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Research & Electronic Test Products
he CAL-AV Research & Electronic Test Product line includes Explosive Test Site Range Instrumentation, Illuminated Laser Warning Signs and Special Projects.. Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Web Application Testing in Ruby
Watir
An open source Ruby library for automating tests. Watir interacts with a browser the same way people do: clicking links, filling out forms and validating text. It drives Internet Explorer, Firefox, Chrome, Opera and Safari, and is available as a RubyGems gem.
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Mobile Application Penetration Testing
A Mobile application is an application that runs on mobile devices. It has become a dominant and popular business tool today. Corporates are empowering mobile devices by offering more and more services on mobile and handheld devices. Unfortunately, mobile devices like notebook computers, PDAs, Pocket PCs, smartphones, and BlackBerrys are all attractive targets for malicious attackers. By accessing your corporate network via email, VPNs, and other means of remote access, a successful compromise can result in the exposure of Personally Identifiable Information, corporate secrets, customer data, and additional sensitive information.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Vectorless Test Applications
NanoVTEP
Vectorless test solution with miniaturized amplifier to help improve test coverage.
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Security Testing
Security/negative testing is typically conducted during development to highlight how a DUT handles abnormal conditions like very high traffic load, different frame sizes (incl. undersized and oversized frames), framed with different IFG settings, various types of errors and deviation of the signal frequency, as well as various DDoS attacks.
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Cloud Security Testing
Using a cloud infrastructure is no more a new phenomenon in the digital world. Businesses use it as a basic practice now a days due to numerous benefits associated with it. Hence, it should be a top most priority for the businesses to secure their cloud infrastructure as that’s the nucleus of their business from all aspects. In cloud security testing, the cloud infrastructure is screened to identify security risks and the areas which can be exploited by the attackers. Cloud security testing is mainly performed to ensure that cloud infrastructure can protect the confidential information of an organization. QA Mentor adopts three different approaches during the cloud security testing process:
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Pull tester for security testing
SAFOR 2000
The Safor portable tester is an accurate unit, designed for testing the pulling force of fixings prior to being put into service. Easily prevent accidents by testing on site the fixings to install end brackets and safety harness eyebolts.
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Mobile Application Testing
Mobile compatibility testing covers aspects of platform fragmentation, physical characteristics, and the App Store review guidelines.
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Web Application Penetration Testing
Web Application Penetration Testing – to identify, analyze, and report vulnerabilities in a given web application. LGMS adopts a robust technology and process-based approach supported by a well-documented methodology to identify potential security flaws in the web application and the underlying environment.
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Secure Access
Schweitzer Engineering Laboratories, Inc.
Devices with secure access authenticate users, control privileges, and create audit trails.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Blockchain Application Testing
Blockchain has revolutionized the approach businesses are conducted and provides enterprises the great opportunity to track assets, collaborate and share information. Diverse verticals like retail, finance, and healthcare are reaping the benefits of blockchain distributed ledger technology. The blockchain apps have now gone way beyond crypto-currencies like bitcoin and other decentralized payment modes or systems.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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NETWORK SECURITY
Network Critical Solutions Limited
Network Critical gives all your security systems complete, uncompromising visibility into what’s happening on the network. Get better overall ROI by improving performance of existing security systems to keep pace with increasing network speed and complexity, while gaining the insight needed to better detect, contain and recover from breaches fast.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Network Security
TrustMonitor™
TrustMonitor™ provides continuous monitoring of the trust network by:*(Analyzing content & constraints for validity of credentials*Monitoring that certificate authorities are available to support validation*Easily scaling to incorporate new certificate authorities (no agent required)
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
