Audio Test
See Also: Audio Testers, Audio Test Systems
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Turn-Key Test Solutions
Our Product line cover the very basic of safety test needs. We have products focus on single safety test like Hipot, Ground-Bond, Leakage-Curret and Insulation Resistance. Advanced models combining all the safety tests function together.
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Diagnostic Testing
Response Dynamics Vibration Engineering, Inc.
Response Dynamics has made diagnostic testing our core focus for over 30 years. We do this detective work well because we have particular expertise in structural dynamics and how it relates to vibration and acoustic noise issues on a myriad of levels. We enjoy this work because it stays interesting and draws on multiple disciplines in engineering and science.
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Material Testing
*Abrasion Testing*Adhesion Testing*Brittleness Temp.*Bursting Strength*Coating Testing*Coefficient of Friction*Compression Testing*Compression Set*Dart Drop Testing*Density Determination*Fatigue Testing*Fiberboard Testing*Flammability Testing*Flexural Testing*Foam Testing*Hardness Testing*Heat Deflection*Hydrostatic Testing*Impact Testing*Life Cycle Testing*Melt Index Testing*Plastic Testing*Ply Separation*Resin Content*Rubber Testing*Shear Strength Testing*Stress Crack Testing*Tear Testing*Temperature Testing*Tensile/Elongation*UV Exposure*Water Absorption*Wood Testing
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SSD Test Dystems
MPT3000HES / MPT3000HES2
Compact, highly efficient SSD test solution allows customers to accelerate time to qualification for their new designs and time to market for their latest storage products.
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Container & Package Testing
*Incline Impact. *Drop. *Cobb. *Static and Dynamic Compression. *Dart Puncture. *Environmental Conditioning. *Vertical Linear, Rotary Motion, Sinusoidal and Random Vibration. *Internal Pressure. *Vacuum
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Twist Testing
STT
The STT Shaft Twist Tester is a system designed for quickly testing of twist structures and/or twist-freed condition on shafts in seconds.
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Creep Testing Machine
JINAN PRCISION TESTING EQUIPMENT CO., LTD
Measures the alteration of a material after it has undergone stresses.
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SSD Test Systems
MPT3000ES / MPT3000ES2
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Environmental Test Chambers
ET-Series
Environmental Test Chambers are designed with uncompromised features included in the system to meet your changing application needs of simulation of wide range of temperature, relative humidity etc., conditions without the added cost of expensive add-on’s as options. Available in varied volumes to fit your differing specimen sizes
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Test Programming LabVIEW
With LabVIEW, National Instruments provides an industry standard for developing a test environment.Our employees have many years of experience in many areas of this development environment.
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Battery Testing Systems
The CT2001 series Battery Testing Systems are designed for energy storage materials research and battery test. The eight channels are independently programmed and controlled by the computer. The Current ranges are from 1 mA to 5 A and Voltage ranges from 2V to 15V. Each testing system is specifically built for customer needs.
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Vibration Test Chamber
Series TV / CV
During transportation, or when used under heavy mechanical loads your products vibrations or oscillations can be exposed, which may negatively affect the quality and longevity. To simulate these effects can be personalized with the modular standardized versions of the corresponding CTS installations, the requirements such as vertical and horizontal meet vibration and this in conjunction with very high rates of temperature change.
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Non-Destructive Testing
Piezoelectric ceramic materials are the active component in nondestructive testing transducers. The material is driven with an ac signal to generate an ultrasonic sound wave that is coupled into an object. The ultrasonic wave is reflected back to the transducer when it encounters a change in density in the material caused by a crack, porosity, or other object with a different density.
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Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Meter Testing System
ASTel
Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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Ground Testing
Weshine Electric Manufacturing Co., Ltd
1.Soil resistivity tester supports 2, 3 and 4wire grounding resistance measurement. 2. 4digit large LCD display with white screen backlight, suitable for use in dimly lit places. 3. IP65 protection grade, good waterproof, compact and portable, supports multiple functional tests.
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Semiconductor Testing
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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Ultrasonic Testing
Pundit 250 Array
The Pundit 250 Array brings a quantum leap in the ultrasonic pulse echo testing. A number of unique innovations make the Ultrasonic multi-channel instrument the best and fastest solution for thickness measurements, detecting defects and localizing objects which cannot be easily detected by any other technology. This includes the assessment of thick concrete elements such as tunnel linings as well as pipes and tendon ducts beyond the rebar layer.
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Nondestructive Testing
BMP Testing and Calibration Services Inc.
Achievement is a construct, or rather a phenomenon, which everyone wishes to be a part of. Everyone seeks success to be the best, well-known, and well settled in life. This is why we want to excel in our lives by choosing a promising career for our future.
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Vibration Test Systems
L.A.B.’s Vibration Test Systems help you design high quality, cost-effective products and shipping containers by accurately measuring sensitivity to vibration.
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VCORE Power Test
To support the heavy computing loads required by AI technologies, system servers must rely on high performance CPUs and GPUs capable of complex, real-time processing. These processors are powered by VCORE power supplies, embedded DC/DC converters, or voltage regulator modules (VRMs).
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Test Solutions For MROs
Through our 50+ years of experience, we’ve designed equipment that test components on nearly all aircraft platforms. Because of our experience and our attention to industry trends, we can anticipate what components you’ll be testing tomorrow. We design our test stands to exceed your current test requirements for simple upgradability to ensure that you’re ready for the future.
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RF Test Sets
ETS-Lindgren's MF-9F Series of RF Leak Detector/Attenuation Meter Kits are designed to simplify the performance evaluation of shielding enclosures.
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Functional Test
Products and systems used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems.
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Test Compliance
AMETEK Programmable Power, Inc.
A growing number of electronic products manufactured today have to meet international regulatory requirements for emissions and immunity. This is particularly true for products sold in the European community as well as a growing list of countries in the Far East. AMETEK Programmable Power compliance testing solutions measure products for the latest standards.
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Metallurgical/Metallographic Testing
A partial view of our Metallurgical examination areas, showing metallurgical microscopes with digital filar micrometers. These instruments, along with our cross-sectioning and polishing equipment, make the Optical Metallography facilities at Pacific Testing among the most extensive in the industry. In addition, these facilites are under the supervision of our Chief Metallurgist, with a Ph.D. in Metallurgy.
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Digital Incircuit Test
PFL780/760
The PFL780 and 760 use IC clips as a test interface. This makes them ideal for the service and maintenance of legacy systems. If you need to work on high density surface mount PCBs you should consider the GRS500 as a more suitable alternative.
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In-Circuit Testing and Test Engineering
GenRad 2287
3560 Hybrid Test NodesWindows InterfaceTotal GenRad 227X Migration Capability20 Mhz Clock, Sync, and Trigger, 5 Mhz data ratesVector Test for VLSI, PLCC’s & ASICSTest Express Vectorless TestingMultiple Chain Boundary ScanAnalog Functional Test Module
