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Bare Board Test
SMT and PCB check prior to being populated with components.
See Also: Bare board, Bare Board Testers
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LUTHER & MAELZER BARE BOARD TEST PINS
SERIES LMP 78
Materials and Finishes MATERIAL: Heat treated beryllium copper FINISH: 24 Kt gold plate over hard electroless nickel
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Electrical Tester
R580
Nidec-Read's R580 Electrical Tester provides an affordable test system for your bare board electrical test needs. You can easily integrate the R580 with your existing manual test fixtures or select from several fixture options from Nidec-Read. The R580 is supplied with opens/leakage test ability. In addition, you can include other advanced electrical test techniques.
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Hign Speed Bare Board Test System By Non-Contact Test Technologies
SX-750SUPERⅣ
Suitable for a wide range of applications. Can be connected to a wide range of machines: from hand press to reel mechanism and in-line mechanism. We offer docking with our customers own machines. Compact main tester simplifies integration via installation inside a mechanism. If requested, we will perform a study to decide which functions should be added.
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BARE BOARD TEST PROBES
Probe Technical DataMechanicalMINIMUM CENTERS: .100 (2.54)FULL TRAVEL: .160 (4.06)WORKING TRAVEL: .107 (2.72)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current60 18 mOHMS mean63 60 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper60 24 Kt gold plated over nickel63 24 Kt gold plated over nickelBARREL: Nickel silver60 24 Kt gold plated ID and OD over nickel63 No FinishSPRING: Music Wire, 24 Kt gold platedover nickel
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LUTHER & MAELZER BARE BOARD TEST PINS
SERIES LMP VZ
Materials and Finishes MATERIAL: Heat treated beryllium copper and music wireFINISH: 24 Kt gold plate over hard electroless nickel
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Bare Board Electrical Testing
ProbeMaster
ProbeMaster is the complete software solution to your shops needs in bare board electrical testing. ProbeMaster is PentaLogixs top-of-the-line software package that combines all of the power of the PentaLogix CAM and Fixturing packages with support for moving probe, Netlist Comparison and other robust features.
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Motion Control Terminal Board For Mitsubishi J2S-A Servo Amplifiers
DIN-812M0
- On-board connector type: 100-pin SCSI-II female- Suitable for Mitsubishi J2 super servo- Dimensions: 123 mm x 107 mm x 44 mm (WxLxH)- Available for PCI-8132
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Cyclone V based 6U cPCI COTS Module
iWave’s Cyclone V based 6U cPCI Card is a rugged standalone module complaint with 6U size CPCI PICMG 2.0 Rev 3.0 backplane, aimed for the high-speed data, video processing, and display applications. The card offer speed up to 512MB/s of DMA transfer and up to a 6 channels of transceiver interfaces capable of operating up to 6 Gbps, SFP, Built-in health monitoring circuits, DVI Input, and Output Interfaces
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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FMC Add-On Cards
iWave’s FPGA-IP Evaluation Add-On FMC Card is designed to meet ANSI/VITA 57.1 FMC Standard. The card supports both High-Pin Count (HPC) & Low-Pin Count (LPC) connector and can be used in an air-cooled environment. FPGA-IP Evaluation Add-On Card can be interfaced with most of the FPGA development kits available in the market. This card also helps to evaluate iWave’s proprietary FPGA Intellectual Property (IP) Cores.
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Motion Control Terminal Board For Panasonic Minas A Servo
DIN-814PA
- Motion control terminal board with 100-pin SCSI -II cable- On-board connector type: 100-pin SCSI-II female- Suitable for Panasonic Minas A servo- Shipped with 1-meter ACL-10250 cable- Available for PCI-8134, PCI-8164 and PCI-8158- Dimensions: 123 mm x 107 mm x 44 mm (WxLxH)
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Qseven® Reference Carrier Board
Q7-BASE
Qseven is a Computer-on-Module (COM) standard for small sized and highly integrated systems adopted by SGET. The Qseven concept is an off-the-shelf, multi-vendor, Computer-on-Module that integrates all the core components of a common PC and is mounted onto an application specific carrier board. Qseven modules have a standardized form factor of 70 mm x 70 mm or 40 mm x 70 mm and have specified pinouts based on the high-speed MXM connector, regardless of the vendor. The Qseven module provides the functional requirements for an embedded application, which include, but are not limited to, graphics, audio, mass storage, network and multiple USB ports. A single ruggedized 230 pin MXM connector provides the carrier board interface to carry all the I/O signals to and from the Qseven module. This MXM connector is a well-known and proven high-speed signal interface connector that is commonly used for -PCI Express graphics cards in notebooks.
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Custom Test System Solutions
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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3U CompactPCI® Single 64-bit PMC Slot Carrier Board
cPCI-8301
- PICMG® 2.0 32,64-bit/33,66 MHz cPCI bus- Supports one single-size 32,64-bit/33,66 MHz PMC site in 4HP width- Universal V(I/O) decided by backplane- Comprehensive EMC shielding
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Terminal Board With 100-Pin SCSI-II Connector For General Purpose Servo & Stepper
DIN-825-4P0
- Supports specific servos & steppers by cable selecting- On-board connector type: 100-pin SCSI-II- Dimensions: 300 mm x 107 mm x 44 mm (W x L x H)
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Digital Input Board
VME-1129
VME-1129 128-bit high voltage digital input board with Built-in-Test and input filter. This product complies with the VMEbus specification (ANSI/IEEE STD 1014-1987, IEC 821 and 297), with the following mnemonics: A24:A16: D32/D16/D08 (EO): Slave:39/3D: 29/2D Form Factor: 6U
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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ADAS Test
Advanced driver assistance systems (ADAS) are introducing new technology into vehicles. They demand test systems that are adaptable and future-proof, so they can integrate all the technology used today and be ready for whatever tomorrow brings.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
