Bare Board Test
SMT and PCB check prior to being populated with components.
See Also: Bare board, Bare Board Testers
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Product
NI's Electrical Functional Test Solution
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PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
Test System
UltraFLEX
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The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
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Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
3U CompactPCI® Single 64-bit PMC Slot Carrier Board
cPCI-8301
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- PICMG® 2.0 32,64-bit/33,66 MHz cPCI bus- Supports one single-size 32,64-bit/33,66 MHz PMC site in 4HP width- Universal V(I/O) decided by backplane- Comprehensive EMC shielding
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In-Circuit Test System Rentals
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Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Portable, Integrated O-Level Test Platform
Guardian™
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Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Safety Compliance Test System
EN 60601
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Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
Combination Board Functional Test System
QT 4256 ATE
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Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
3U CompactPCI® Serial XMC Module Carrier Blade
cPCI-A3XMC
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- 3U 4HP CPCI-S.0 peripheral- One XMC slot- Operating temperature: -40°C to 85°C with qualified components
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Product
VLSI Test System
3380D
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
6U CompactPCI Dual 64-bit PMC Slots Carrier Board
cPCI-8602
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- Supports two single-size 32,64-bit/33,66 MHz PMC sites in 4HP width- PICMG® 2.0 32,64-bit/33,66 MHz cPCI bus- PICMG® 2.1 Hot Swap Specification Compliant- 3.3V or 5V V(I/O) for cPCI bus and PMC sites- PLX® PCI-to PCI bridge PCI6154 for PCI bus- Power and HotSwap LED incidators on front panel
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Product
ARINC-708 Module
M4K708
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The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
Digital Output Board
VME-2128A
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VME-2128A 128-bit High-Voltage Digital Output Board with Built-in-Test
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Product
EBX & 5.25" Single Board Computers
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Advantech's EBX and 5.25" embedded single board computers (SBC) measure 203 x 146 mm and feature rich I/O choices and super-slim compact designs with multiple expansion options. These offer scalable x86 performance for low-power Intel Atom™ processors through to high-performance Intel Core™ i processors.
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Product
SMD Array Type LCR Test Fixture
16034H
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The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Product
Test Fixture (SMD Components)
16034E
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Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Intel Core Ultra Processors (Code Name: Panther Lake)
MIO-5381
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Intel Core Ultra Processors, up to 14 Cores, TDP 28W/15WDual Channel DDR5-7200 up to 128GB, with IBECC support4 simultaneous displays: eDP + 2x HDMI + USB-C with DP Alt.2x LAN, 6x USB (incl. 1x USB4), 4x UART, 2x CAN-FD, 8bit GPIO, I2C(*SMBus)4x M.2 Expansions: E-Key 2230, B-Key 3052, 2x M-Key 2280Supports Windows 10/11 LTSC & Ubuntu 24.04 LTS, embedded software APIs, DeviceOn Remote Management, Robotic SuiteSupport EdgeBMC for OOB(Out-of-Band) remote control management
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SoC Test System
V93000 SoC / Smart Scale
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Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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H(3)TRB & HTGB Test Systems
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SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
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The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
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High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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LTE RRM Test System
T4010S
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The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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SAS Protocol Test System
M124A
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The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Intel® Celeron J1900 & Atom E3825/E3845, 3.5" MI/O-Compact SBC, DDR3L, VGA, HDMI/DP, 48-Bit LVDS/eDP, 2GbE, Mini PCIe, MSATA, IManager, MIOe
MIO-5251
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Intel® Celeron J1900 & Atom™ E3825/E3845, DDR3L-1066/1333MHz SODIMM up to 8GBDirectX11, OpenGL3.2, OpenCL1.2, multi-display: VGA+LVDS/eDP+ HDMI/ DP*Flexible design using integrated multiple I/O: MIOe to approach vertical applications & keep domain knowhow2 Intel i210 GbE, rich I/O: 4COM, SATA, USB3.0, SMBus/I2C, GPIO full-size Mini PCIe w/ SIM holder, full-size mSATASupports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite
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Semiconductor Testers
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Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Environmental Control System Test Platform
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The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Product
VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
