Bare Board Test
SMT and PCB check prior to being populated with components.
See Also: Bare board, Bare Board Testers
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Sencha Test
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Sencha Test is the most comprehensive unit and end-to-end testing solution for Ext JS apps. Based on years of testing Ext JS applications and the deepest integration with the framework, Sencha Test helps you improve application quality, accelerate time to market, and reduce testing time and costs. With Sencha Test, you can create unit and end-to-end tests quickly, and execute them on multiple browsers simultaneously. Cross-browser testing is critical to ensuring quality for organizations, and test automation is a requirement to meet delivery timelines. Sencha Test is the only dedicated testing solution for Ext JS applications. It helps you build an end-to-end testing plan without having to cobble together testing tools.
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Product
Analog Multiplexer Board
104-AIM-32 PC/104
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The 104-AIM-32 is an analog signal multiplexer conforming to the PC/104 standard. The card will multiplex and condition 16 differential or 32 single-ended analog signals before passing them to an analog-to-digital converter card like the 104-AIO12-8. A system may comprise one to seven of these cards in tandem with one 104-AIO12-8 A/D converter board. The 104-AIM-32 card may be used as part of a large data acquisition system. The 104-AIM-32A Kit consists of one 104-AIM-32 and one 12-bit 8-input A/D board.
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Ground Testing
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Ensuring an effective earth system is essential in a telecommunications system, and Megger is expert in earth testing having been there right from the start. These days Megger offers top end systems for design and soil surveys as well as tough easy to use testers for field engineers. We have tried to make the testers self checking as much as we can, to allow you to concentrate on collating and understanding the results.
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Digital Input Board
VME-1128
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VME-1128 is a 128-bit High-Voltage Digital Input Board with Built-in-Test. This product complies with the VMEbus specification (ANSI/IEEE STD 1014-1987, IEC 821 and 297) with the following mnemonics: A24:A16:D32/D16/D08 (EO): Slave: 39/3D:29/2D Form factor: 6U
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Optical Loss Testing
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Is to inject a known level of light in one end and measure the level of light at the other end, using an OLTS. The difference between source and receive power levels is the loss.
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Burn-In Boards
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Manufacture of burn-in boards since 1976. Established for more than 40 years in the market, Trio-Tech is recognized and is an approved global supplier to all major semiconductor companies. Trio-Tech has the capability to design and manufacture boards for all system types, with solutions available for many test conditions, Including HTOL, PTC, HAST and 85/85.
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Product
Seven-Module Test Set
F8300
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Use the F8300 for testing three-phase conventional schemes and digital protection systems. This seven-module F8000-series instrument is available in five standard configurations of HVA Current, HVA Voltage, and Low-Density Logic I/O modules.
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High-Speed Embedded Host Electrical Test Board
HSEHET
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High-Speed Embedded Host Electrical Test Board is approved by USB-IF, specifically designed for the electrical test of USB embedded host products.
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Product
Current Measurement Board
MS 1814
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*Maximum DC Voltage Rating: 15V to 75V*Maximum DC Current: 5A*Output Voltage per 1A: 1V*Maximum AC Current: 5A*Operating Temperature: 0°C to 55°C*Storage Temperature: -20°C to +65°C*90% Relative Humidity (Non-condensing)*No. of DC Current Channels: 9*No. of AC Current Channels: 4nos*Maximum AC Voltage Rating: 230VAC*Channel Selection: Through 16 CH Analog MUX*Measurement Error Over Full Temperature Range: 5%*Type of Output: Proportional voltages*Maximum Voltage Drop across Series Resistor Full Scale Measurement: 0.05VDC
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Turboshaft/Prop Test Cells
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The Atec Companies are fully equipped to execute any and all requirements for Turboshaft engine test cell projects. We regularly design, construct and upgrade turnkey brick & mortar facilities for test cells, as well as manufacture modular relocatable cells.
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Product
Demonstration Board
SAMPULSE20x2
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The SAMPULSE20x2 is a demonstration board for the Furaxa SiGe3 30GHz sampler/pulser IC. The SIGe3 IC is a dual channel sampler pulser chip, and the SAMPULSE20x2 demonstration board contains two 2.4mm combined TDR input/output connectors, one to each sampler/pulser channel in the IC. The SiGe3 IC's two sampler outputs are then sent to to two SMA jacks, the first outputting the sample taken on the rising edge of the sampler clock, and the second containing the sample taken on the falling edge of the sampler clock. The sampler clock input, which must be a square wave, may be set to any frequency from 5MHz to 1GHz, causing the board take two pairs of samples (one on each clock edge) at rates from 5 million to 1 billion per second. A pulser clock input, which may be set to any frequency from 5MHz to 2GHz, and MUST be a square wave (preferably differential) with rise time under 100pS, causes the board to produce concurrent pulses on both of the SiGe3's I/O pins, which produce near-concurrent pulses at the two 2.4mm sampler/pulser TDR input/output connectors.
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Product
Corrosion Test Chambers
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Shanghai Morningtest Environmental Chambers Co.,Ltd.
Corrosion test chambers for salt spray testing is used throughout the automotive, aerospace, fasteners, electronics, paints and coating industries!
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Meter Test Bench
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Meter Test Banch is available with high-technology to ensure high testing accuracy as well as maximum functionality. It is designed to provide precise results in any simple to complex testing. It comes with modern systems to ensure to provide artificial load that cannot be changed in the power supply. It is provided with high durability and efficacy to ensure long lasting life with no maintenance. In addition to this, it ensures high accuracy in testing without any wear.
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ISA Isolated Digital I/O Boards
ISO-P64
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The ISO-P64 has 64-channel isolated digital input board, arranged into four isolated banks. Each input channel use a photo-coupler input which allows either internal power supply or external power selected by jumper. Isolated input channels 0~15 are designed into group A, channels 16~31 are designed into group B, Isolated input channels 32~47 are designed into group A, channels 48~63 are designed into group B. The power supply of the input port may use the external power or the power from the PC side using DC to DC converter. The board interface to field logic signals, eliminating ground-loop problems and isolating the host computer from damaging voltages. The ISO-P64 has one 37-pin D-sub connector and one 40-pin header. The 40-pin to D-sub 37 flat cable is used to fix with the case. The user can connect the digital signal through the second D-sub connector. Each D-sub connector contains 16 inputs channel and 16 output channel.
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HALT Test Service
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HALT, Highly Accelerated Life Test is a system design validation tool for maximum robustness verification. In a step stress approach a system under functional test and operational conditions is check for functional and destruct limits.
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Continuity Testing
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The checking of an electric circuit to see if current flows (that it is in fact a complete circuit).
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Breakout Boards
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Breakout your Raspberry Pis and Arduinos with this broad selection of versatile breakout boards! Engineered to help you realize your robotics, GPS and altitude sensing projects as well as servo and touch screen interfacing, you''ll find many uses for these high-quality boards, most of which are manufactured in house at Adafruit!
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Product
Pulse Generation Measurement Board
MS 1806
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*TTL Pulse measurement channels (Timers / Counters) 18 Channels*TTL Pulse Generation - 12 Channels*The Pulse Generation Frequency from 10Hz to 40MHz*The no. of pulses controlled from 1 to 255 pulses*All Channels are compatible with 5V TTL / CMOS*All the pulse input and the output signals driven through Pin Driver*Standard ISA Bus Interface*Driver interface for Windows2000/XP/VISTA and LINUX OS
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Product Testing And Certification
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Nemko’s global team pairs years of industry expertise with their state-of-the-art testing facilities throughout America, Europe, and Asia to partner with organizations seeking approvals for their new devices in the market.
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Magnetic-Inductive Testing
MAGNATEST® Product Family
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Foerster Instruments, Incorporated
The MAGNATEST product family is used for the non-destructive testing of metallic materials for magnetic and/or electrical properties. The test instruments are used in the automotive and aviation sectors as well as in the production of semi-finished products. The focus is on testing components relevant to safety such as brake discs, or ball pins and functional components such as camshafts and drive shafts, pivots and piston pins. Typical test tasks include hardness checks, material differentiation and sorting. MAGNATEST can also be used for the automatic testing for the geometric properties of all metallic series components. The high-performance amplifier installed in MAGNATEST test instruments makes it possible to analyze harmonics, which guarantees an extremely reliable and precise repetition, even when impacted by perturbations.
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Product
Tri-Temp Test Handler
JANUS 2800T Tri-Temp Handler
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SESSCO Janus 2800T Tri-temp Handler is designed to accommodate small to medium size standard and custom IC packages. Supports high parallelism of up to octal sites and is equipped with dual high-speed input tube loaders and dual auto output tube unloaders for higher throughput up to 28K UPH. With over 500+ I/O and 16 temperature zones available, it has plenty enough resources for the most demanding applications. It can be customized for MEMS applications and high-voltage testing. Powered by a cutting-edge 10 ns/step all-integrated controller and modular programming design.
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Stress Testing System
Load Dynamix
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LoadDynamix (former Swifttest) is famous for its IP based converged storage system stress testing, including iSCSI, SMB/CIFS, NFS, FC and HTTP/HTTPS based storage systems. Its GUI interface is very easy to use and allow customer engineer to fully configure all the parameters at the protcol layer. Nearlly all the major IP storage system manufacturers have LoadDynamix products in their test lab.
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2.5mm Test Rod Test Probe Needle
CX-4C
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Shenzhen Chuangxin Instruments Co., Ltd.
2.5mm test rod test probe needle Used to verify the protection of persons against access to hazardous parts.
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Compress Test Machine
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JINAN PRCISION TESTING EQUIPMENT CO., LTD
A universal testing machine (UTM) specially configured to determine a material's strength and deformation behavior under compressive (pressing) load.
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Product
CPCI ARM LPC3250 Board
MS 1513
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- 32 Bit ARM LPC3250 Processor (256KB SRAM)- 133MHz External Bus Speed and 266 MHz internal CPU Speed- 32 Bit, 33MHz CPCI Bus, 6U Form Factor- External memory ( Flash – 2 MB, RAM - 512 KB, DPRAM – 128KB)- 10/100 MBPS Ethernet Interface- USB 2.0 Host/Device Interface- 2 RS232 Serial Ports, 4 RS422 Serial Ports- M Module Interface- 6U board compatible with CPCI & PXI backplanes- High Speed Logic Device- Hot Swap Feature- Front Panel and Rear IO Interface- External Bus through Rear IO- Reception of 3Kbytes within 2ms through Ethernet- Board Dimension is 160mm x 233.35mm- Power Requirements: +3.3V, +5V and +/-12V- Board Dimension is 160mm x 233.35mm- Board has Rear IO interface- Ethernet, JTAG, RS232, USB connectors at front side- BSPs and Driver software for Windows and Linux OS
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Product
Textile Testing Equipment
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Dongguan Kejian Instrument Co., Ltd.
Used for testing the performance of the wearing resistance,abrasion, appearance change (pilling degree/class) of the textiles and membrane materials.
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CO Detector Testing
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Many multi-sensor fire detectors detect carbon monoxide (CO) as well as smoke and / or heat. Under international codes and standards the CO cell needs to be functionally tested with a CO stimulus from the protected area through the detector vents to the sensor.
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Digital Test Instrumentation
Di-Series™
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The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).





























