Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Platforms
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The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.
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Product
Automatic Transformer Test System
TH2829AX-24
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Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 24 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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Efficient All-In-One Test Solution for Low-Cost IoT Devices
KT RFCT 2400
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The low price point creates a cost effective means for testing wireless communication units, while generating a favorable cost to performance ratio.The calibrated RF test system has a small footprint, integrating seamlessly into test system infrastructures via a single Ethernet connection. GPIOs control the DUT and peripherals. The test system enables communication interfaces like SPI, I2C, UART and CAN. Simple Go/No-Go tests can be performed in parallel. The KT-RFCT 2400A features a 70 MHz to 6 GHz frequency range and includes non-signaling and signaling connections. Bluetooth signaling standards are supported up to 4.1 as well as BT-LE. WIFI signaling standards supported are a, b, g, n and ac.The KT-RFCT 2400A is the perfect test system for a wide range of applications, such as Bluetooth, Infotainment, Keyless Entry, Tire Pressure Measurement, GPS and WIFI.
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Automated Headlight Tester
VLT 0936/MK2
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Fully computerized controlled CCD Head-light Beam Tester, with fully automated vertical and horizontal movements, with automated searching of the hot spot of the beam. This robot type Headlight Beam Tester is connected to the Vehicle Test Lane Computer system and displays instructions and results to one of the large overhead SVGA monitors of the Test Lane.
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Continuous Time Interval Analyzers
GT210PXI-40
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GuideTech’s GT210PXI-40 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system with optimal cost. The ability to precisely resolve frequency and time yields both increased accuracy as well as reduced measurement time.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 2.97MΩ
40-251-151
Programmable Resistor Module
The 40-251-151 is a programmable resistor module with 1 channel which can be set between 3Ω and 2.97MΩ with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Custom Test Stands
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Our test stands and systems are manufactured to support hydraulic, fuel, pneumatic, and electro-mechanical components.
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Custom Designed Test Fixtures
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We specialize in automated test systems for both RF and digital devices, modules and systems. Please call to discuss your test requirements.
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VME Test System
VMETS
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Measurements of system performance include Bus Utilization, Transfer Rates and Statistics. As data is acquired the Min, Max and Average values are updated and displayed in graphical form.
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Defined CRPA Test System
BroadSim Wavefront Software
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Protecting your GNSS systems from jamming and spoofing is more critical now than ever before. BroadSim Wavefront was designed to enable easier and more affordable CRPA receiver testing, leveraging proven software-defined architecture.
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EMS Test System
TS9982
Test System
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Coaxial Test Contactor
ICON
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The ICON™ test contactor designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).The metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise). Featuring exceptional DC and RF performance and excellent thermal management.
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Automatic Transformer Test System
TH2829NX
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Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 72/96/120/144/168/192 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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3U PXI-E System Controller
PX32101
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LinkedHope Intelligent Technologies Co.,Ltd.
PX32101 is a 3U PXI-E system controller based on the newest Intel® Haswell platform. It is designed to provide comprehensive and reliable system controller to support hybrid PXIe-based systems for multiple environments test and measurement applications.Hybrid PXIe-based systems are often required to complete independent diversified complex testing tasks on the PXI test platform. PX32101 provides rich interfaces: 4 USB2.0 / 3.0 for peripheral connectivities; UART for communication or control equipment; dual 1000Base-T Ethernet, one port for LAN connection and the other one for the control of the next generation of LXI instruments. PX32101 can support 4 x4 or two PCIe x8-link, and up to 16GB / s system bandwidth. The ExpressCard 34 expansion slots on the front panel allow users to expand the system modules flexibly. If you install a hybrid multi-slot backplane in the system, then various standard PXI-E and PXI / CPCI peripheral cards could be fitted. In a multitasking environment, PX32101 processor is able to complete multiple tasks independently. The CPU and memory chips soldered with PCB increase reliability performance in shock and vibration environments. Combined with a variety of instrument control interfaces and reliable mechanical & electronic design, PX32101 can meet your hybrid PXIe-based testing for system application requirements perfectly.
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Digital Oscilloscope
DS8000-R
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DS8000-R series digital oscilloscope is a compact mid-to-high-end digital oscilloscope based on RIGOL's UltraVision II platform. With a compact design, DS8000-R supports multi-machine system integration, suitable for rack installation. It also allows remote control, and meet the standards of industrial automation test systems.
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Computer Based Audio Component Test System
DATS V3
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Rugged aluminum housing with detachable test leads and built-in precision calibration resistorTighter tolerances on internal components for more precise measurementsIncreased output capability means greater separation from the noise floor, resulting in more accurate measurementsDATS Linearity Test for comparing parameters and impedance plots at multiple drive levelsOptional under desk mounting brackets included to save desk spaceOnly 1" H x 2-1/2" W x 4-1/8" D for easy portability
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Flying Probe Tester
FA1817
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Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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High-Density PXI Large Matrix Modules up to 1 Amp - BRIC™
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Pickering's high-density PXI large matrix BRICs offer current handling up to 1 Amp and select models are supported by our Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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Point Universal Cable/Harness Tester
CableJoG 1024
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The CableJoG 512 and CabeJoG 512 Plus provide a flexible testing system to suit individual customer requirements. The CableJoG 512 and CableJoG Plus 512 can test up to 1024 individual connections of all manufacturers of connectors.
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System Instruments
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bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Digital and Analog Test Sets
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Our analog and digital automated test system experience covers a wide variety of applicationsfrom multiple path resistance, capacitance, and inductance testing using various Interface Test Adapters (ITA)to inter-connect multiple customer units under test (UUT). Other systems have included: equipment to monitor and record telemetry, digital data streams, and systems that evaluate packet data using a variety of VME, VXI, PXI, and LXI equipment.
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Blackbodies & Extended Area Sources
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The Infinity Series of blackbody radiation sources and extended area sources combine leading edge technology with features that support the expanding test requirements of the latest high performance sensors. SBIR designs the most stable, uniform, accurate and highly emissive blackbodies available. SBIR now offers VANTABLACK®S-IR as an optional coating, providing the E-O test community an unprecedented flat plate source emisisivty. SBIR continues to offer blackbody systems that provide the test community with unequaled performance, reliability and ease of integration into test systems. Our blackbody family includes six different varieties to choose from. The Infinity line offers four types of precision blackbody systems and our extended area sources offer two additional types of precision blackbodies to support all levels of IR testing.
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16-Station Testing System
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The ElectroPuls 16-Station testing system performs high cycle fatigue testing on multiple samples simultaneously, with a fatigue-rated load cell included on each station. The fixture uses a carousel designed with high stiffness and low mass to enable high frequency testing and reduce test time.
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Optical OTDR
TLM-01D
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Hangzhou Tuolima Network Technologies Co., Ltd.
OTDR-01D series handheld optical time domain reflectometer (OTDR) is a new generation of intelligent optical measuring instrument designed for the optical fiber communication system testing by TUOLIMA Network Technologies Co., Ltd.. This product is mainly used to measure the parameters of optical fibers and cables, such as length, loss, and connection quality, etc.; it can realize the accurate positioning of event points and fault points, and can be widely used in the construction, maintenance testing and emergency repair of the optical fiber communication systems as well as the research, production and production measurement of optical fibers and cables and so on. This product can provide you with the highest performance of solutions for installation and construction of fiber optic network construction and the subsequent fast and efficient maintenance and troubleshooting testing.
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MEMS Handler
4664-IH
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The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Flat One Side Baseplates
BE-FOS
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Bemcoil-FOS (Flat One Side) is made from 18 gauge, 304 stainless steel sheet combined with 11 gauge (0.120 inch thick), 304 stainless steel plate. Bemcoil-FOS can be circuited to allow tapped or clearance hole penetrations for mounting. This material is sometimes specified as a liquid nitrogen cooled water getter plate material in optical testing systems.
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Testing of Current Measuring Transformers
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All components from this category can be integrated into an existing current transformer test system. When selecting CT test components, both the type of converter to be tested and the required current are important.
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COLOSUS
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The COLOSUS line of electro-optical test systems from Santa Barbara Infrared Inc. and Labsphere Inc. include collimated optics, software and uniform sources for the optical characterization of sensors and cameras.
