Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
3U Intel® Core™ i7-7820EQ Quad-Core Processor-Based PXI Express Gen3 Controller
PXIe-3987
Controller
The ADLINK PXIe-3987 PXI Express embedded controller, based on the 7th gen Intel® Core™ i7 processor, is specifically designed for hybrid PXI Express-based testing systems, delivering maximum computing power for a wide variety of testing and measurement applications.
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Product
PXIe Controllers
Controller
VTI is the first choice for mission critical applications or applications where the cost of test is high and failure is not an option. Applications include missile system testing and solid rocket motor testing. This is because our products are recognized in the industry for their reliability and are designed with built-in capabilities to maximize measurement confidence. Simply put, if you need equipment that is going to give you the results you need, contact us to get started.
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Product
High Voltage Battery Test System
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The increasing use of electric drive systems both in the automotive industry and in transportation requires the development of new high-performance energy storage systems. In order to support you in the development and production of these systems, S.E.A. develops individually configurable test systems which are scalable and can be used flexibly for the respective requirements.
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Vibration/Shock Testing
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Quest Engineering Solutions provides a broad range of vibration testing and shock testing services. We have a variety of vibration test systems of different sizes and broad test capabilities. Vibration and shock testing and vibration analysis are important to achieving product quality. Our experience can help you choose the tests which will optimize your product's design and reliability.
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Product
PowerNet Tester
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The PowerNet Tester (BNT) is designed to test batteries, ultracaps and all other types of electrochemical power sources for 14 V and 42 V power net systems. Designed to test vehicle system batteries for 14V and 42V power net systems. But they may also be used for testing all other types of electrochemical power sources just by setting the required current and voltage values.
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Shock Test Systems
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Sanwood Environmental Chambers Co ., Ltd.
Is featured with advanced design, high degree of automation and reliability, simple operation and convenient maintenance. The system meets the requirements of both shock and collision test, can perform conventional half-sine wave, post-peak sawtooth wave, square wave and other waveform shock tests.
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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Product
Universal Test Fixture
CAM/GATE
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The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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Product
Spectroradiometer
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Designed to have a capability of producing any visible spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant power emitted by individual LEDs. This LED test system will be used as a transfer standard for photometric, colorimetric and radiometric applications.
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Product
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
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High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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Product
Air-Cooled Universal Test Platform
Diamondx
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Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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Product
SWB-2810, 4x43, 1 A, Row Access, Reed Relay Matrix Module for SwitchBlock
781420-10
Reed Relay
4x43, 1 A, Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2810 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
ECM Noise Under RF Test System
BK8020
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The BaKo Type BK8020 ECM Noise Under RF Test System tests microphones under RF noise, using a ‘Direct Injection Test’ in the frequency range of 5MHz~2.5GHz with an amplitude modulated (AM) disturbance signal of 1kHz. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When you finish testing, you can print data as an MS Excel report or save it for comparison and analysis.
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Product
PXIe Vector Network Analyzer, 300 kHz to 14 GHz
M9373A
Vector Network Analyzer
Pay for only the frequency range you need with a choice of six frequency ranges up to 26.5 GHz Improve accuracy, yield and margins with the best PXI VNA speed, dynamic range, trace noise and stability Add functionality to your test system with a full 2-port VNA that fits in a single PXI slot Address your multiport applications needs by cascading multiple models Increase throughput and lower costs by adding modules in a multi-site configuration
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Product
DC Blocks
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BroadWave designs and manufactures DC Blocks and other coaxial RF components that are ideally suited for test, verification and system integration. With frequency ranges of DC to 18 GHz, our components offer consistent performance at a low cost with an emphasis on performance and configuration flexibility.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
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AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Product
Functional Test Fixtures
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RNS can build almost any test equipment and automated test machinery. We have delivered soltions for HiPot, LED Test, Leak Test and RF shielded applications for years. We can provide Complete Test Systems, including Test Fixtures, Rack System and even Programming. Our team is committed and has a proven track record of delivering exceptional products independent of scope, so simple- and high-complexity projects are handled with equal care.
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Product
Database API
Woodcreeper
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LXinstruments Woodcreeper provides a convenient database API for our MySQL test database. It allows manipulation of the database from within the test sequence, for instance when data from upstream process steps needs to be accessed. Third party test systems can also be easily linked to the LXinstruments test database. One license for Woodcreeper comes with the TSCOE4 system license; standalone licenses are also available.
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Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
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The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Pump Testing Panels
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Aarohi Embedded Systems Pvt. Ltd
AAROHI Pump Testing Panels - full load, semi/fully-automatic pump test systems
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Product
EV &Recharging Testing
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PONOVO has long-term follow-up technology in China and abroad. Based on its own mature intelligent power detection equipment, and according to its own advantages in the field of new energy, PONOVO could be able to provide users with professional new energy test system solutions. In the field of electric vehicle technology, the electric vehicle charging facility detection platform based on the Internet cloud platform was introduced. This platform is one of the few domestic testing platforms that can automatically test the charging piles for network inspection, project acceptance, and factory testing. The platform has the advantages of automatic testing, low usage threshold, and high integration. It is widely used in the detection of relevant charging facilities in more than 20 provinces and cities in China, effectively meets the inspection of electric vehicle charging stations, and provides powerful technical support for the site acceptance test of charging stations.
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Product
Field Test
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Field test equipment is an optimised solution for large system testing, which, thanks to its distributed architecture, enables the placement of several small-sized testing systems.
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Product
PXI Very High Density Versatile 2 A Multiplexer
40-612B-002
Multiplexer Module
The 40-612B (PXI) and 42-612B (PXIe) Very High Density Versatile Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves.
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Test Automation Systems
iTest
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Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Product
PXI 2.5W Programmable Resistor Module, 2-Channel, 2Ω to 52.4kΩ
40-251-133
Programmable Resistor Module
The 40-251-133 is a programmable resistor module with 2 channels which can be set between 2Ω and 52.4kΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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ATE & Test Systems
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Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Product
LTE eNodeB Testing
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The DuoSIM and DuoSIM-Advanced are the most scalable eNodeB test systems in the industry. From basic functional testing to complex C-RAN environment simulation, the DuoSIM line of testers makes validation and development of network equipment faster, easier, and more cost effective.
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Product
PXI Precision Resistor Module 3-Channel, 3 to 11.4M
40-297-153
Programmable Resistor Module
This PXI Precision Resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
