Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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MEMS Optical Sensor Test
For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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Power Discrete Tester
Mostrak-2
M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
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Test Database Software Module
The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Broadband
The UNH-IOL is the industry's leader in testing broadband systems and equipment. Working closely with service providers, equipment manufacturers, and the Broadband Forum, we have spent the last 15 years developing extensive testing coverage for DSL, GPON, TR-069, and IPv6. Our broadband testing can help ensure your products and services meet your customers' expectations with the highest quality possible.
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PCI Precision Resistor Card 6-Channel, 3Ω To 5.82MΩ
50-297-052
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI Precision Resistor Module 3-Channel, 2.5 to 102k
40-297-140
This 3-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Spin Testers and Bearing Assemblies
Vidac has created several spin test systems ranging from the basic manually operated model shown here to fully automated machines that can spin the customers components to a specific speed profile. Our 3D design capability ensures the tight tolerance fit required for high speed rotation.
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In-Circuit Test Systems
TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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PCIe Compliance Testing
Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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Transportation Bounce Test System
KRD51 series
Bounce testing simulates the constant loose cargo state during truck transport. Often times, containers carrying military and civilian hardware (such as: medical supplies, electronics, weaponry, communication devices) travel for extended periods of time and must be transported off-road. All of these items must maintain functionality upon arrival at their destinations.
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DynoLAB Test Cell Supervisory System
SAKOR Technologies’ DynoLAB™ data acquisition and control systems offer reliable, cost effective automation of all types of dynamometer test systems. As with all SAKOR products, the DynoLAB system undergoes a continuous program of upgrade and improvement, regularly expanding and enhancing DynoLAB’s capabilities.
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Quality Control for more Precision in Press Hardening
PRESS-CHECK
The automated test system PRESS-CHECK works with two powerful high-end thermographic cameras for continuous measurement of two-dimensional temperature distribution. This measurement is carried out before the pressing operation on the surfaces of the boards to be processed and subsequently on the resulting molded parts, ultimately enabling exact compliance with the thermal process parameters.
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Functional Test Fixtures
RNS can build almost any test equipment and automated test machinery. We have delivered soltions for HiPot, LED Test, Leak Test and RF shielded applications for years. We can provide Complete Test Systems, including Test Fixtures, Rack System and even Programming. Our team is committed and has a proven track record of delivering exceptional products independent of scope, so simple- and high-complexity projects are handled with equal care.
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IC Tester
ICE1
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, MCX
40-878-242
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Food Grips and Fixtures
AMETEK Sensors, Test & Calibration
We supply material testing instruments to some of the world’s most innovative companies within the food industry. The reason for this is our extensive experience within food testing, combined with our high precision texture analysis and packaging test systems.
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PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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MIPI Receiver Test Solution
M8085A
The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
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PXIe-2526 , 158‐Channel, 2 A PXI Multiplexer Switch Module
780587-26
158‐Channel, 2 A PXI Multiplexer Switch Module—The PXIe‑2526 is a high‐density PXI multiplexer switch module that is ideal for routing signals within automated test systems. It uses electromechanical relays to perform immediate switch operations in either a 158x1 1‑wire or 79x1 2‑wire multiplexer topology. The PXIe‑2526 also features onboard relay counting for relay monitoring.
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PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, SMB
40-878-211
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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AMIDA ATI 600 Tester
AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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PXI Precision Resistor Module 4-Channel, 1.5 to 472
40-297-120
This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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NI-9222 , ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
783283-01
±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.
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High Volume Manufacturing Handling, Stimulus
ULTRA P
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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CMK Mechanical Kits
Columbia has created a unique mechanical click system using ball bearings and guiding sleeves. The UUT is connected to the spring contact pins that are connected to the testing environment in a completely linear fashion. Connecting the UUT to probes can be approached both from the top and the bottom and, optionally, even from the side. The ergonomic housing provides generous space for additional measuring electronics. The back and bottom of the housing can be adapted to the various test system interfaces.
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PCI 3-Channel Precision Resistor Card
50-297-103
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test Points
TestStation LX2
TestStation LX2 is Teradyne's largest pin count in-circuit test system. Configurable up to 15,360 pins, TestStation LX2 utilizes the new UltraPin II 128HD pin card for testing large, complex, and heavily-integrated printed circuit board assemblies.
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PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 395kΩ
40-298-142
The 40-298-142 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 395kΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Resistance Measurement
PROMET 100 / 200 / 600 high-accuracy, precision ohm meters deliver an adjustable test current up to 600 A which is independent of the supply voltage. They utilize the four-wire resistance measurement method, enabling them to meet extremely stringent accuracy requirements when determining resistance values in the micro-ohm range.State-of-the-art power electronics coupled with a robust design guarantee maximum reliability, even when used as portable devices in switching stations or industrial environments.The modern operating concept, an interface to the test systems of the ACTAS product line and an optional remote control unit make these micro-ohm meters flexible and versatile.
