Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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PCI Precision Resistor Card 18-Channel, 1Ω to 31.5Ω
50-297-010
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Motor Testing Solutions
IES Systems, Inc, is a turnkey motor testing solutions provider with 10 years of proven experience in the design and manufacturing of motor testing equipment. We provide custom designs to meet our customers' testing requirements. IES Systems, Inc. designs and builds no-load motor testers, full load motor testers, dynamometers, core-loss testers and ECM testers
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PXIe-5831, 44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver
786856-01
44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver - The PXIe-5831 supports validation and production test into mmWave frequency bands. The PXIe-5831 incorporates a vector signal generator, vector signal analyzer, and high-speed serial interface with FPGA-based real-time signal processing and control. The PXIe‑5831 combines fast measurement speed and the small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments, making it an ideal solution in both the lab and the production floor. The PXIe-5831 meets the stringent challenges of 5G New Radio, but it is also able to test a variety of cellular and wireless standards such as Wi-Fi 6. In addition, you can easily expand a test system in the PXI Express form factor to support multiple input, multiple output (MIMO) configurations with phase-coherent synchronization.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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HALT Test Service
HALT, Highly Accelerated Life Test is a system design validation tool for maximum robustness verification. In a step stress approach a system under functional test and operational conditions is check for functional and destruct limits.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781420-33
4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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370MHz To 6GHz Radiation Measurement System
RMS-0460
The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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Single column automated force test stand up to 500 pounds
701SN
The advanced 701 Universal Test System is ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials or products up to 500 pounds.This variable speed tester has increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.
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Benchtop Unit for Universal Coating Thickness Measurement
FISCHERSCOPE MMS PC2
Multifaceted for coating thickness measurement and material testing. Universal multi-measuring system for parallel coating thickness measurement and material testing with up to eight measuring modules.
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PMS Leak Test System
The system (Pressure Measuring System) is a portable, complete system for leak tests. This consist of the pressure test kit PMS3000 for performing leak tests with an integrated graphic-capable 4.3” color touch display and a pressure relief kit DAK2000 for discharge test according to W400-2, Part 16 pressure loss methods as well as DIN EN 805. The system is complemented by a variety of connection accessories like the rugged accessory case (individually equipped), the test standpipe PSR and accessories for building gas connection as well as the electronically controlled test pumps EPP and the compact air compressor KLK1030.
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Micro Ohm Meter 200A
Micro Centurion II
Raytech Digital Micro ohm meter, Micro-Centurion II, was designed for high degree of accuracy to measure very low resistances. This technology was then packed into a portable test system to be used by apparatus manufacturers, rebuild shops, and electrical maintenance crews. This intelligent system has an easy to use operation screen, which allows quick selection of the current level and resistance level to be measured.
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Portable Test System
MT781
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Test Systems Inspection Systems
Different requirements demand flexibility. ELABO boasts a modular product portfolio permitting the economical creation of bespoke solutions for every client. These solutions range from individual testing devices through tabletop workstations with integrated testing equipment all the way to automated systems with ERP connections for mass production.
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Temperature Only Chamber
HIACC Engineering & Services Pvt. Ltd.
Optimised heating & cooling system offers higher performance & energy efficiency. The test chamber can be customised suiting to different test standards. It comes with larger viewing window, ports for live specimen testing, visual alarm system, improved mobility and smaller footprint.
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Fiber Optic Light Sources
Fiber optic light sources are a necessity for performing optical fiber network testing to measure the optical fiberal loss for both single mode fiber cable and multimode fiber cables. They are designed to cover a variety of wavelength ranges to suit all optical testing needs and usually the optical light sources are used with the optical fiber power meter to test the fiber system loss. Light sources are offered in a variety of types including LED, halogen and laser. Usually the optical light source is used with the optical fiber power meters, they act as an economic and efficient solution for the optical fiber network works.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 6.97kΩ
40-251-024
The 40-251-024 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 6.97kΩ with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Short Buddy® Audible Trouble Shooter
230
Short Buddy helps you find the short! This unique tool connects at the fuse panel and becomes in series with the test circuit. A system of audible beeps helps you find the problem and permit hands free troubleshooting. Have a dead short? Short Buddy gives you continuous re-set/re-power capability, a real time saver. While you push, pull, tug and grab wires, Short Buddy is always watching the current level. If your tug causes the dead short again, Short Buddy opens the circuit for 10 seconds, then re-applies power to the circuit. Re-powering the circuit can also be done manually.
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Integrating Sphere Spectroradiometer System for LED
LPCE-2(LMS-8000)
LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Stationary Drive Test System
ACTAS CF80
Stationary test system for sequential final factory tests and function tests on up to 8 drives. The drive test system is operated and controlled with the ACTAS operating software. The test position is selected using the multiplex method. The test system can reproduce drive control with the aid of a logic module. This makes it possible to test any drive even if there is no control unit.
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Optics Test Systems
Electronic And Visual Autocollimators
Optik Elektronik Gerätetechnik GmbH
OEG GmbH specializes in the use of autocollimators, collimators and telescopes for special applications in optical measurement technology in the wavelength range from 380nm to 1550nm (SWIR).
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Electrodynamic Vibration Test Systems
i-series
Vibration tests have become diversified and specifications have become increasingly strict.i-series offer a user-friendly lineup with enhanced performance and durability.
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Force Measurement & Torque Measurement Test Stands
Mark-10 offers the industry's most extensive line of manual force measurement and torque measurement test stands. Test stands are useful in eliminating variability inherent in hand testing and can help to automate test processes. A wide range of capacities, loading methods, and configurations are available. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.
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SIP-90-4 Test System Interface Probe
SIP-90-4
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Modular Battery Test System
This modular battery test system provides for manufacturers versatile testing possibilities. Due to modularity it allows easy configuration of battery testers for a wide range of different power levels.
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RF/Microwave ATE Systems
Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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Bit Error Ratio Testers
Keysight’s bit error ratio test (BERT) system enables the most accurate physical-layer design verification of high-speed communication and multi-gigabit digital interfaces. Our expert-level support will help you select the high-performance hardware, control software, receiver test, and automation tools needed to help you master your design.
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Incline Shock Tester
HIACC Engineering & Services Pvt. Ltd.
Inline shock test system simulates a real shock environment to estimate the impact resistance or damage level of a product. The simulated environment replicates shocks produced during product handling, stacking shelves, loading/unloading and transportations. The incline shock test system is widely used in the packaging industry, scientific research institutions and transportation industry.





























