Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Modular Test Systems
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Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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SSD Test System
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The Neosem’s SSD test system combines advanced SSDtest hardware, software and environmental chamber into a single platform and supports all popular storage interfaces including PCIe, SAS & SATA and fast emerging protocols such as NVMe and AHCI.
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Product
PXI Precision Resistor Module 9-Channel, 1.5 to 472
40-297-020
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This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Three-phase Fully Automatic Test System
TS41
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Calmet Smart Calibration Devices
The Calmet TS41 test system consists of a three-phase reference meter of accuracy class 0.02% (or 0.04%) and an integrated three-phase current and voltage source up to 3x120A/600V. It makes possible automatic testing of electricity meters in meter test stations
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Sound Level Test System
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In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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Noise Sources
WGNS
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The system allows the user to extend the frequency range of the NFA to allow for accurate noise figure measurements to be performed on a device operating in the 26.5 – 170GHz range on wafer as well as in benchtop applications. Farran offers the WGNS series of noise sources to be used in conjunction with the FBC down converters for use as frequency extenders for noise figure measurement test system.
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Audio Test Software
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1. Distortion free stimulus even the equalized stimulus.2. Unlimited channels acquisition and processing. (Hardware limited)3. Human correlated listening test(Bark Scale intensity chart). (Requires large memory)4. Hi Res intensity chart for buzz/pop detection. (Requires large memory)5. Auto equalization method with target dBSPL accuracy.6. TCP client for test framework integration.7. Easy limits and logs development.8. Easy logs visualization module.9. Auto waveform alignment and triggering.(Upto single point alignment accuracy)10. Easy regression testing via TCP client.11. Standard Magnitude, Phase, THD, THD+N, Rubb&Buzz, Pink Noise, Noise Tests.12. Unlimited calibrations and equalization for scaling to different products and stations.13. Lowest test system and test sequence development times.14. Requires minimal training and debugging.15. Automatically avoid Reference speaker play and stop pops.16. WMD/ASIO driver compatible sound cards supported.(B&K 3670 recommended)
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Avionics Test Solutions
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IES Systems is a turnkey test systems solution provider with 10 years of proven experience in avionics test solutions. We provide final acceptance test equipment and environmental stress screening test equipment for the following programs.
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PXI & LXI Simulation Tools
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Our PXI & LXI simulation tools help you to accelerate the development process by simulating the product in your test system. These tools allow you to develop and test the system software independent from your application hardware. By using the tools, you can minimize the time required with the physical system.
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TestStand
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TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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PXI Solid State Versatile Multiplexer
40-682-002
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This versatile solid state multiplexer is especially useful where a high density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future. The PXI multiplexer uses high performance solid state switching to ensure a service life of greater than 10 years and fast operation.
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ESI Test Jig
MS 1543
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This Test System designed to test the analog, discrete, Ethernet, RS232, RS422, Synchro /Resolver and SPI Signals. It is standalone test equipment and has GUI ATP Software interface with laptop/PC through RS232/Ethernet Interface.
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Mixed Signal Test Systems
MTS1000i
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The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Arbitrary Waveform Generator
MGHCH
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MGHCH is designed to reproduce arbitrary waveforms, as well as to reproduce sinusoidal signals with amplitude, frequency, phase modulation or without modulation. MHVCh can be used for research, tuning and testing of systems and devices used in radio electronics, automation, computing and measuring technology, instrument making.
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Real Car Transient Test System
RealCar Simulation Bench
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This system is suitable for transient test of actual vehicle in combination with the real-time model calculation by the measurement/control panel and low inertial motor. By replacing the wheel of the actual vehicle with the tire type bearing, the axle shaft is taken out to the outside of the vehicle and connected to the low inertia motor. It can be reproduced the sliding motion which the chassis dynamometer cannot be realized. Also, since the longitudinal force is not occurred in the vehicle, the vehicle restraint can be simplified and the behavior such as shift shock can be reproduced on the bench.
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Meter Test Board
WECO 2150
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Model 2150 automated test system is a fully ANSI compliant testboard that uses a single voltage and three independently controlled isolated current sources to test all electromechanical and solid state meters up to 50 Amps. Utilizing a precision laser optics system, the Model 2150 can test meters through the most grime-coated covers with unfailing accuracy. This same laser technology makes it possible to test using the disk’s edge without wasting time with the tricky optics adjustments found with other test systems.
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9050 - 50 Module, 2-Tier Solution
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The rack mountable 9050 50 Module Receiver is designed to accept 9025 and 9050 ITAs and is ideal for systems with advanced mass interconnect requirements. The 9050 can be adapted to accommodate vacuum or mechanical fixturing. Connector modules can be intermixed for creating custom interfaces ideal for functional and system testing applications.
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Missile Systems
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IES Systems is a turnkey test system solution provider with proven experience in Acceptance Test Procedure (ATP) testing, Highly Accelerated Stress Screening (HASS) and Environmental Stress Screening (ESS) testing.
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Flash Memory Test System
T5830
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T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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PCI High Density Pecision Resistor Card, 18-Channel, 2Ω To 239Ω
50-298-013
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The 50-298-013 is a high density programmable resistor card with 18 channels which can be set between 2Ω and 239Ω with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Evaluation and Data Mining
Magpie
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LXinstruments Magpie is a user-friendly evaluation and data mining application for our test database. The data to be evaluated can be preselected via complex, easily configurable filters. Based on the selected data, it is then possible to create reports and perform statistical evaluations as well as machine capability analyses. The graphical GUI supports easy administration of the database by authorized users.The LXinstruments Magpie evaluation licenses are always linked to the data source, which would generally mean a test system. The test data generated by the test system will be marked as available for evaluation while it is stored in the database.
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In-Circuit Test System Calibrations
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Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Software
DIGITIZER
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The Digitizer allows the recovery of design data of unknown assemblies by an electrical analysis with a Condor flying probe test system
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Phoromatic
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Phoromatic is a web-based remote management system developed for the Phoronix Test Suite. Phoromatic allows the automatic scheduling of tests, remote installation of new tests, and the management of multiple test systems all through an intuitive, easy-to-use web interface. Tests can be scheduled to automatically run on a routine basis across multiple test systems. The test results are then available from this central, secure location.
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Product
PXI-2535, 544-Crosspoint, 1-Wire PXI Matrix Switch Module
778572-35
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544-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXI‑2535 is a high-density 4x136 PXI matrix switch module that is ideal for routing low-power DC signals in validation test systems of mass produced devices such as semiconductor chips and printed circuit boards (PCBs). Featuring field-effect transistor (FET) relays, the PXI‑2535 offers unlimited mechanical lifetime and switching speeds up to 50,000 crosspoints/s. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Connector Test
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A connector test system which provides expansion of up to 160 Kelvin pair connections. The system incorporates high voltage AC and DC power supplies with a maximum output of +/- 2100 Volts peak for Hi Pot, Insulation resistance measurement. LCR bridge control is provided with 4 terminal multiplexing in order to add precision capacitance, inductance and resistance measurement capability. An integral H.V. capacitor bias option permits capacitance measurement to be made at up to 2.1kV.
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Curved Needle Test Systems
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Instron’s Curved Needle Testing System is designed for evaluating surgical and wound closure needles through two specialized testing methods: curved needle puncture testing (per ASTM F3014) and cantilever bend testing. These fixtures assess key performance attributes such as sharpness, coating integrity, and flexural strength. Compact and efficient, the tabletop system conserves bench space while delivering robust functionality. Powered by Bluehill® Universal software, it offers comprehensive control over test execution, data collection, and reporting, along with access to a wide range of built-in calculations.
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Electrical Test System TY-CHECKER
Type P Series
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Manual press systems made to suit your purpose.
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Visible / Infrared / Imaging Test System
System 1808
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Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Network Impairment Simulator
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Testing system performance under realistic network conditions requires the introduction of impairments that could be expected to be seen on networks, especially public networks which are uncontrolled. There are a number of ways to do this. A basic method is to use network simulation devices that can emulate conditions expected to be encountered.
