SEM
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, Scanning Electron Microscopes, EBSD
-
Product
EBSD tools
-
EDAX EBSD tools provide leading performance and groundbreaking technology for analyzing crystallographic microstructure, using electron backscatter diffraction in the SEM.
-
Product
Magnetic Field Testing
-
Response Dynamics Vibration Engineering, Inc.
As magnetic field consultants, we have been working with magnetic field issues for sensitive tools for many decades from cutting edge development of scanning electron microscopes (SEMs) to active cancellation systems for MRI tools, to site surveys for specification compliance, debugging, and tool Magnetic Field Sensitivity Testing.
-
Product
Electron Microscope Analyzer
QUANTAX EBSD
-
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
-
Product
Ion Beam Milling Systems
-
When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
-
Product
Wafer Cathodoluminescence Microscope
Säntis 300
-
Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
-
Product
Heavy Duty Dynamometers
MD-250-HD
-
The MD-250-HD series dyno (SE/DE) was designed to be a performance dynamometer first with the added benefit of being able to test 2-wheel-drive heavy-duty vehicles such as truck, buses and commercial vehicles in addition to the standard car or light duty pick-up. The 250-HD is certified in the states of Colorado, Nevada and Utah for use in loaded-mode diesel smog testing programs because of its accuracy and reliability. No other dyno in its class offers more value or better in-house motor vehicle testing capabilities than the Mustang MD-250-HD. For starters, the MD-250-HD boasts a 1,500 horsepower measurement capacity at a top speed of 175 mph and a powerful air-cooled eddy current brake provides the MD-250-HD-SE with 900-hp worth ofloading capacity for steady state testing. Loading capacity can be increased to 1,500-hp via the optional DE model. The 250-HD can be upgraded to the 250-HD-SE-M via the addition of a 100 or 200 hp AC motor for transient testing of electric buses to measure range and regeneration or for emissions testing of IC engines. Do not be fooled by its compact size – the MD-250-HD is a serious dynamometer with serious tuning capabilities. The MD-250-HD uses a powerful eddy current power absorber, a frictionless, air-cooled braking device, to enable it to apply variable and steady state loading. A complete control and data acquisition system lets you design a wide range of tests or select from a host of pre-configured tests included with the standard system. The 250-HD’s four roller design makes setting up vehicles a snap – simply drive onto the 250-HD and let the tires settle in between the rollers. The 250-HD can be installed above-ground or below-ground, it’s your choice. The above-ground system utilizes an optional premium platform and ramp system with an above-ground restraint kit. The addition of an axle pull-down kit help keep the tires from slipping or trying to “climb out” of the rollers.
-
Product
MASK MVM-SEM® E3600 Series
E3640
-
Ongoing semiconductor process shrinks are driving new demand for stable, highly precise measurement of pattern dimensions for photomask and wafer production. The E3640 satisfies these requirements with industry-leading precision measurement capabilities and upgraded functionality that enhances mask R&D and production efficiency.
-
Product
WAFER MVM-SEM® E3300 Series
E3310
-
The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
-
Product
Cross Sections and Metallography
-
Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
-
Product
Scanning Electron Microscopes
-
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
-
Product
RF Analyzer
-
Occupied Bandwidth (OBW)Adjacent Channel Power (ACP)Channel Power (CHP)Complementary Cumulative Density Function (CCDF) Intermodulation (IMD)Spectrum Emission Mask (SEM) IQ (Waveform)Phase Noise
-
Product
Energy Dispersive X-Ray Spectroscopy (EDS)
-
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
-
Product
Energy Dispersive X-ray Spectroscopy
EDS
-
Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
-
Product
Electromagnetic Radiation Analyzer
SEM-600
-
Beijing KeHuan Century EMC Technology Co,.LTD
Broadband Electromagnetic Radiation Analyzer SEM-600 can accurately measure various complex electromagnetic environments. The probe covers all frequencies from low frequency to microwave radiation. It can measure electric field strength and magnetic field by equipping different types of probes. Intensity (magnetic induction) and power density, it is also equipped with ordinary probes and other weighted probes based on human safety standards.
-
Product
Field Emission SEM
FESEM
-
Materials Evaluation and Engineering
The FESEM is an advanced microscope offering increased magnification and the ability to observe very fine features at a lower voltage than the SEM found in most laboratories.
-
Product
Scanning Electron Microscope
SEM
-
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
-
Product
Scanning Electron Microscope
Verios G4 XHR SEM
-
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
-
Product
Ultra Clean, High Concentration, High Flow Ozone Generator
SEMOZON® AX8415
-
The SEMOZON® AX8415 is the most innovative and versatile ozone generator developed by MKS. Ultra clean, high concentration, high flow ozone is produced by this generator's novel architecture and patented cell design, converting oxygen to >400 g/Nm3 of high concentration ozone for leading-edge applications in the semiconductor, flat panel display and photovoltaic industries.
-
Product
EM & Thermal Simulation Software
SEMCAD X
-
Schmid & Partner Engineering AG
SEMCAD X is the latest generation of 3-D FDTD full-wave simulation software offering unprecedented levels of user-friendliness, speed & memory efficiency. Its application range has been further greatly extended by incorporating the world's first EM ADI-FDTD solver.
-
Product
MOSFETs, MESFETs, and Schottky Diodes
Semiconductor Module
-
The Semiconductor Module allows for detailed analysis of semiconductor device operation at the fundamental physics level. The module is based on the drift-diffusion equations, using isothermal or nonisothermal transport models. It is useful for simulating a range of practical devices including bipolar, metal semiconductor field-effect transistors (MESFETs), metal-oxide-semiconductor field-effect transistors (MOSFETs), Schottky diodes, thyristors, and P-N junctions.
-
Product
Scanning Electron Microscopes
SEM
-
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
-
Product
Nanomechanical Instruments for SEM/TEM
-
As the world leader in nanomechanical testing systems, Bruker makes it easy for you to conduct in-situ mechanical experiments in your microscope with the Hysitron PI Series PicoIndenters. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale.
-
Product
PC Programmable, Suitable For Thermocouple Sensors
SEM206TC
-
The SEM206/TC is our entry level PC programmable temperature transmitter
-
Product
Vehicle Electromagnetic Field Exposure Test System
SEM-400
-
Beijing KeHuan Century EMC Technology Co,.LTD
Vehicles are our daily public transportation. Electromagnetic pollution in vehicles has attracted more and more public attention. The newly revised compulsory standard GB27630-201X "Passenger Car Air Quality Evaluation Standard" intends to require the electromagnetic field in the car as one of the indicators, according to GB/T37130-2018 "Measurement method of vehicle electromagnetic field relative to human exposure" The measurement method is to measure the intensity of the magnetic field in the car. In the frequency range of 10Hz-400kHz, the electromagnetic field measurement result should meet the public limit requirements of GB8702-2014 for electromagnetic exposure.
-
Product
Multi-Channel Ozone Delivery System With In-rack Chiller
SEMOZON® AX8575
-
The SEMOZON® AX8575 is a fully integrated, high output ozone gas delivery system that can be configured as a multi-channel system delivering ozone for up to 4 channels supporting multiple chambers or multiple tools. It has an optional in-rack chiller for ultra-high concentrations.
-
Product
PC Programmable, Suitable For Pt100 Sensors
SEM206P
-
The SEM206/P is our entry level PC programmable temperature transmitter. It accepts Pt100 temperature sensors and converts the sensor output to a standard industrial (4 to 20) mA transmission signal.
-
Product
Dual Relay Trip Amplifier
SEM1630
-
The SEM1630 is a DIN rail mounted trip amplifier which accepts RTD, Thermocouple, mV and passive current signals and provides a dual trip output
-
Product
Suitable For Frequency And Pulse Sensors
SEM1600F
-
The SEM1600F is a cost effective “smart” powered conditioner that accepts all common process pulse signals with a frequency range between (0.01 to 65000) Hz in standard configuration and (DC to 1000) Hz in counter mode. Typical applications would be to measure flow or batch counting.
-
-
Product
In-Head RTD Temperature Transmitter
SEM203/P
-
The RTD in-head mounted temperature transmitter connects to any standard pt100 resistance sensor and converts the linearised temperature to a (4 to 20) mA signal.
