Test Management Solution
See Also: Test Management, Test Management Software, Test Management Applications, Test Management Suite, Test Management Tools
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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TMS Test Management Software
LX TMS
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To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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Bus Management Test System
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Solution to test redundant Architecture of BMUComprehensive test system performing tests of > 3000 I/O's Special test circuits using hybrid / ceramic components to operate in Thermovac chamber Tests various subsystem functionalities like, AOCS, Sensor Electronics, Telemetry, Tele-command with Self test and application test software
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Parametric Test Solutions
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Reduce your cost-of-test up to 20% with our ultra-fast CPU Overcome your process test challenges Boost measurement throughput and lower costs with our synchronous/asynchronous parallel test capability Better low-level measurement performance Create customized waveforms Reduce transition costs
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Calibration and Test Equipment Management
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Is every value precise? The comparability of measurement results has never been more important than in the present era of globalization. The ability to reduce variables to basic units is the fundamental prerequisite to objectively guarantee, increase, and optimize quality. Our calibration service guarantees full correlation to national standards for test equipment of all physical variables – either at our laboratory or on your premises (for measuring tools).
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Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Automated Data Management and Capacity Monitoring Solution
SafeCapacity
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SafeCapacity, an automated data management and capacity monitoring solution, addresses the difficulties inherent to exponential data growth, 24 by 7 operational requirements, and optimization of data across varying levels of storage resources.
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MEMS And Sensor Test Solutions
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Modular design based on standard handlers, high parallelism, ambient to automotive tri-temp handling.
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Parallel Memory Test Solution
Magnum2
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Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Test Solution Offering BER Testing
Eye-BERT Micro LR
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The Eye-BERT Micro LR is a low cost, easy to use test solution offering BER testing at any rate between 6.312 and 125Mbps on either optical or electrical interfaces. Features include: continuously variable bit rate, user programmable pulse generator, internal CDR with retimer mode, bit rate measurement, and recovered clock output. The Unit is supplied with anti-skid bumpers for bench use, and is small enough to be integrated into larger systems for dedicated link verification.
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Lansmont Testing Solutions
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Lansmont develops state-of-the-art package testing equipment and instruments that enable engineers to evaluate, simulate and optimize product durability and packaging design.
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NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Automated Data Testing Solution
QuerySurge
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Real-Time Technology Solutions, Inc.
QuerySurge is RTTS’ smart Data Testing solution for Big Data that finds bad data & provides a holistic view of your data’s health. QuerySurge helps your team coordinate your data testing initiatives while speeding up your development & testing cycles and finding your bad data.
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Product
Web-based Test Management for QA
ApTest Manager
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Applied Testing and Technology, Inc.
ApTest Manager solves these challenges by recording and tracking the tests used in your software and hardware testing projects and the results of running them. Testing information becomes instantly available to everyone - always accurate, always current.
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Product
Test Management App
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Test Management goes mobile with the new Kualitee App. Now, simply use your Kualitee mobile app to manage your testing activities by viewing multiple projects, creating defects, approve or reject test cases and view your Kualitee Dashboard to get the latest status reports on the defects being reported.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Strategic Test Management
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Large programmes and projects require a strong test management function to oversee the delivery of the testing phases. Where in-house systems and external vendor's elements of delivery meet, communication and a strong test approach are key. Our test management consultants are the best in the business. With our years of experience, we will drive your test process to succeed.
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Test Automation Software for Laboratory Management
STARS ENTERPRISE
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STARS ENTERPRISE is a completely new generation of software from HORIBA, consisting of innovative web and mobile apps in a cloud-based platform. It enables you to seamlessly and completely integrate all your measurement systems, test beds and specimens, as well as on-board systems in the laboratory or in mobile road tests. The numerous apps in the STARS Enterprise system offer you a universal, flexible and scalable software solution for accomplishing your entire test automation activities, today and into the future.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Simulation Software and Test Solutions
Simcenter Software
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Siemens Digital Industries Software
The Simcenter portfolio uniquely combines 1D simulation, 3D CAE and test to help you predict performance across all critical attributes earlier and throughout the entire product lifecycle. By combining physics-based simulations with insights gained from data analytics, Simcenter helps you optimize design and deliver innovations faster and with greater confidence.
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Product
Test Solution
Novus, Novus-M, & Novus-R 100/25GE Load Modules
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Keysight Network Applications and Security
Novus, Novus-M, and Novus-R are Ixia’s next-generation architecture and test solutions that satisfy the test needs of both high-density, multi-rate switch/router makers and the organizations implementing the network equipment. Supporting eight native QSFP28 100GE ports and up to 32-ports for 25GE per load module, Novus load modules enable interoperability and functional testing, as well as high-port count performance testing.
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Phi6 Drivers
Digital Management Software
Phi6 is the software environment to manage, control and program 6TL modules and systems.
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Display Test & Characterization Solutions
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The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
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Wafer Test Solutions
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Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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Rack Based Test Solutions
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Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.
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BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Complete Testing Solutions
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System includes a lamp and monochromator for a tunable light source, which is coupled to a high sensitivity source meter with measurement software. This user-friendly system is the most powerful Spectral Response system currently on the market, but its true power is the ease of upgrading from the base PTS-1 to the more powerful PTS-2-QE (Quantum Efficiency) or PTS-3-CPM (Constant Photocurrent Method). Designed for researchers who have limited budgets but want to start work immediately, this allows the ability to do baseline studies until additional funding for the full QE or CPM system becomes available.
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Unified Performance Management Solution
UPM
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Colasoft Unified Performance Management (UPM) platform is a business-oriented network performance management solution. It is capable of monitoring service quality of all respects of a business network and quickly detecting and pinpointing problems affecting performance and stability of key business.
