Test Management Suite
See Also: Test Management, Test Management Software, Test Management Applications, Test Management Solution, Test Management Tools
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Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Research & Electronic Test Products
he CAL-AV Research & Electronic Test Product line includes Explosive Test Site Range Instrumentation, Illuminated Laser Warning Signs and Special Projects.. Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Strategic Test Management
Large programmes and projects require a strong test management function to oversee the delivery of the testing phases. Where in-house systems and external vendor's elements of delivery meet, communication and a strong test approach are key. Our test management consultants are the best in the business. With our years of experience, we will drive your test process to succeed.
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Test Automation Management
In many organizations, testing is split: Automation testing is still disconnected from manual testing, and results are reported separately. This makes holistic decision-making, based on the overall testing, close to impossible. Running and managing both your manual and automated tests in PractiTest ensures the coverage of your entire process and gives you a holistic view of your entire QA operation. PractiTest is a centralized solution that helps you make data-driven decisions, focus your team’s efforts and improve your process.
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Software Suite for Automated Test
UTP Automated Test
Increasing product complexity, centralized test data management and different hardware platforms from different manufacturers – these are typical challenges of test software developers for which we offer specific solutions.Our test software solution is based on certified development environments such as NI TestStand, NI LabVIEW and .NET. Thanks to our expertise based on more than 30 years of experience, we have managed to create a hardware abstraction layer that serves hardware and software developers alike and improves their collaboration. At the same time, it also covers all the needs of maintenance engineers and operators.The UTP Suite for Automated Testing includes a wide range of tools for configuring, developing, analyzing, debugging, and executing test sequences. It helps you speed up your developments while maintaining a consistently high quality standard.
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Test Data Management Services
TDM Service has been designed to help you with data creation, management, and protection to keep your business compliant with all legal regulations without sacrificing expediency or quality.
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Test Management App
Test Management goes mobile with the new Kualitee App. Now, simply use your Kualitee mobile app to manage your testing activities by viewing multiple projects, creating defects, approve or reject test cases and view your Kualitee Dashboard to get the latest status reports on the defects being reported.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Test Data Management
With increasing test data volumes, diverse data types, complex relationships, and data sensitivity, most enterprises face significant challenges with test data management. Having good quality data is key to testing enterprise functionality correctly and efficiently in the test environment. Copying production data to be used for the test can expose the company to numerous privacy and compliance risks. In the absence of a strong test data management strategy, you may end up jeopardizing your testing cycles and pile up huge infrastructure costs.
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LEAK TEST MANAGER SOFTWARE
Leak Test Manager is a software application for PC compatible with Windows XP, 7, 8 and 10 that allows interfacing ForTest equipment to a computer via an RS232 connection (or Ethernet if optional is available on the instrument)
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Automated Test Execution Suite
Custom templates provide starting points for different projects including 1-up and Multi-up process models. Several operator interfaces that execute National Instruments TestStand sequences out-of-the box. A collection of reusable templates that make creating and managing your test sequences easier.
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Power Manager Analyzer Suite for 802.3at, 802.3bt, & Hybrid PSE's
Tests 802.3 at/bt PSE’s with Any Combination of 2-Pair and 4-Pair PSE ports up to 90W per port. Automatically assess PSE PM Stability and Capacity Management. Tests PSE’s that grant power with Multi-Event, LLDP, or Both Multi-Event and LLDP. Automatically Adapts to PSE maximum assigned class (MAC) and power demotions on 2-Pair and 4-Pair ports. Tests PSE’s with up to 96 PoE Ports. Emulated PD’s are 802.3 specification compliant including built-in support for multi-event classification, power demotion, and 802.3at/802.3bt LLDP. Highly Informative Reports cover dozens of parameters using Colorful Graphics.
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Test Management Tools
Manage, Execute & conclude from your tests with speed! Host on cloud or host yourself. A web-based, fastest & simplest test case management system.
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Bus Management Test System
Solution to test redundant Architecture of BMUComprehensive test system performing tests of > 3000 I/O's Special test circuits using hybrid / ceramic components to operate in Thermovac chamber Tests various subsystem functionalities like, AOCS, Sensor Electronics, Telemetry, Tele-command with Self test and application test software
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TEST MANAGEMENT JIRA
QARAJ
QARA – Test Management for JIRA (QARAJ) is an add-on that is used with JIRA to enhance its test management capabilities. It can also be used with QARA Enterprise to track projects and bugs on the same platform, without the need to switch to JIRA. The add-on is available for download on the Atlassian Marketplace.
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Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Test Automation Software for Laboratory Management
STARS ENTERPRISE
STARS ENTERPRISE is a completely new generation of software from HORIBA, consisting of innovative web and mobile apps in a cloud-based platform. It enables you to seamlessly and completely integrate all your measurement systems, test beds and specimens, as well as on-board systems in the laboratory or in mobile road tests. The numerous apps in the STARS Enterprise system offer you a universal, flexible and scalable software solution for accomplishing your entire test automation activities, today and into the future.
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Test Data Management Software
WATS
WATS is an off-the-shelf Quality and Test Management solution, chosen by customers who want real-time test and repair data for monitoring and improving product quality and manufacturing processes. WATS collects and structures Data worldwide, enabling real-time data acquisition, analysis, reporting and management of manufacturing quality.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
