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Line Scan Moisture Imager
Bodkin Design & Engineering, llc
Line scan camera built for measuring product on a moving conveyor. Infrared spectral filtering permits moisture and hydrocarbon imaging for process control.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Flash Vs. Scan
A LiDAR system can observe the complete field of view (FOV) at once, called Flash systems. Flash typically works well for short to mid-range (0-100m), and by capturing the complete scene at once also objects with high relative speeds can be detected properly. Another implementation is to focus on a subset of the FOV, consequentially look at the next subsets, until the complete FOV is covered, called Scanning. Scanning can focus the light on the subset instead of the full FOV, and therefore can do object detection at a longer range compared to Flash.
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Thermal Testing
A view of multiple testing stations for use in conducting Thermal Analysis on various materials. This is one of several areas assigned to various thermal tests. Differential Scanning Calorimetry (DSC), Thermogravimetric Analysis (TGA), Thermomechanical Analysis (TMA), and Dynamic Mechanical Analysis (DMA)
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Line Scan Camera
Linea Lite
Linea Lite makes line scan more accessible than ever. Designed with performance in mind, this camera offers superior color fidelity with 2k to 4k resolution and line rates from 12.5 to 50 kHz, with a GigE Vision® interface.
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Side Scan Sonar for Gavia AUV
Several brands of Side Scan Sonars (SSS) can be installed on the Gavia in the control and communication module. Available frequencies range from 600 kHz to 1.8 MHz in both single and dual frequencies The SSS accumulates data at a rate of up to 40 megabytes per 1000 meters. A 16-gigabyte flash disk is provided standard for storage of SSS data, with larger disks available optionally.
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DSP Sensors
Now available with an optional blue laser, LaserGauge® DSP Sensors are totally self-contained and allow single stripe, Cross-Hatch or Cross-Vector scans with unmatched speed and flexibility. DSP Sensors are capable of scanning a wide variety of surface types including solid metal, paint, plastic/rubber, headlamps, tail lamps, window glass, composite, chrome surfaces.
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Scanning Electrochemical Systems
The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements. Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base. Different auxiliary pieces are mounted to the positioning system. These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments. VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Master-Slave Distributed Motion & I/O Master Controller
PCIe-7856
The PCIe-7856 is a PCI Express interface card providing two ports for Motionnet and HSL systems for distributed motion and I/O in machine automation applications. HSL technology allows thousands of I/O points to be scanned at the millisecond-level in real time by using a master-slave architecture.
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Test systems
MG Products can supply a variety of test systems. These include the Extended Boundary Scan Test from JTAG Technologies, the functional test equipment integrated into a table or high configuration from Unites systems or the Cabinet Modular Test solution (CMT). We offer the right solution for every test setup.
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Supported Test Systems
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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3D Scanner
Artec Eva Lite
Eva Lite is the budget version of the bestselling white light Artec Eva 3D scanner. It features the same accuracy specs, but with reduced functionality: Eva Lite has geometry only tracking and capture. As a result, this affordable 3D scanner can be used for making high quality textureless 3D scans when scanning geometrically rich objects, such as the human body.
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Eddy Current Test System
CIRCOGRAPH® Product Family
Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Flexible AFM
SA-AFM
The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
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LAN Tester RJ45
CZ20250
This easy to operate LAN tester enables you to test your wiring and connections at installation or after maintenance, and is a great Cat 5, Cat 6 and Cat 7 cable tester, making it one of the most convenient tools on the market. With the press of a single button you can automatically run a barrage of tests, including tests for Continuity, Opens, Shorts, Crosses and Splits. You can also identify which pairs require correction; The unit will scan all combinations without you having to do anything other than initiate the test. Even cable shield is tested for continuity! And it tests for all these at lightning speed, saving you as much time as possible.
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Scanning Droplet Cell
VS-SDC
Scanning Droplet System (SDC) uses a compact peristaltic pump to force electrolyte through a small diameter tube and into a specifically designed head. This PTFE-based SDC head is machined to allow electrolyte to flow past an installed Reference Electrode and then to a port at the base of the head.
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UCC Flexible Controllers
UCC flexible controllers provide advanced touch-trigger and scanning algorithms, which allow fast, accurate, adaptive part measurement.
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Timing Lights
A stroboscope used to dynamically set the ignition timing of an Otto cycle or similar internal combustion engine equipped with a distributor. Modern electronically controlled passenger vehicle engines require use of a scan tool to display ignition timing.
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Monitor and Test Video Quality
Torque Electronic Couch Potato (ECP)
The ECP is designed to monitor and test video quality of experience. This affordable, compact, palm-sized monitoring probe monitors true customer viewing experience by providing measurements from the end users’ point of view, after the STB. Scanning through available channels or navigating through interactive content menus via an external IR blaster, the ECP provides a single dashboard highlighting service quality across all channels.
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Line-scan Camera
The Avaatech XRF Core Scan can also be equipped with a high-resolution line-scan camera that allows to obtain detailed pictures of the sample material, including color data. The current generation camera is the JAI LT-400 CL-F Color Line Scan Camera.
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Manufacturing Test Only System
MTO
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Keysight 40/80 Channel Reed Multiplexer for 34980A
34923A
The Keysight 34923A module for the 34980A Multifunction Switch/Measure Unit is a high speed-multiplexer for general purpose scanning. It uses reed relays to achieve scan rates up to 500 channels-per-second. Use this module for high-throughput automated test applications as well as high-speed data logging and monitoring tasks.
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Pocket HD
The NEXIQ Pocket Heavy Duty handheld scan tool provides immediate access to critical diagnostic information. Pocket HD comes loaded with both Heavy Duty Standard (HDS) and Light and Medium Truck 2016 (LMT). The ability to run special tests not included.
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Hyperspectral Imaging Sensors
HYPERSPEC® sensors are line-scanning instruments (sometimes called pushbroom) that collect reflected light through an image slit. One row of spatial pixels is collected per frame as motion occurs, with each pixel containing full spectral data. Motion can be accomplished in two ways: either as an airborne deployment (UAV, aircraft, or satellite) or stationary (where motion is accomplished beneath the sensor, such as a food inspection line). A third option is also available where pan-and-tilt or rotary stages allow a fixed-location sensor to scan a stationary object (such as a piece of artwork, or a mine face for geological applications).
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RF Safety Monitoring
MVG EME Guard XS 6GHz
The EME Guard XS is an RF measuring device to alert workers near RF emitters for protection of climbers and other RF-exposed workers. It continuously scans for electromagnetic waves and, via its built-in alarm and visual system, alerts users whenever the acceptable pre-selected limits have been exceeded. This RF Safety PPE is extremely easy to use and supports a safer working environment in the areas of installation and maintenance.
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Battery Cell Surge Tester
Chroma 19311
Chroma Systems Solutions, Inc.
The 19311-10 has 10 channels, which can test up to 9 battery cells via scanning test, with a single unit. It can support up to 25 channels for testing up to 24 cells in a sequence by connecting with an external scanner (A190362). The test speed of the multicell scanning test by 19311-10 is extremely efficient, saving test time, and decreasing labor costs. It also increases the production capacity of the production line.
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Silicon Test & Yield Analysis Solutions
Tessent®
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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COMPUTERIZED LCRTZ TEST SYSTEM (Automatic Transformer Test System)
CVCT-S20
Ideal for fast and fool proof testing of COILS AND SMALL TRANSFORMERS like SMPS transformers, Telecom transformers (HYBRID, POT CORE, RM-CORE), Pulse transformers etc. The systems scans at one stroke, all the windings of a transformer and tests as per definition of test procedure. The test procedure can be pre-programmed and stored under User friendly menu driven software . Any semi-skilled and unskilled person can be engaged for actual testing purpose. Can Select test frequency, pin number, parameters, test conditions, limits for each test. Test any pin to any other pin any defined parameter.Test Parameters :-> Inductance-> Capacitance-> AC Resistance, -> DC Resistance, -> Impedance, -> Leakage Inductance,-> Transformation Ratio & Winding PolaritySPECIFICATIONS :Measurement Frequencies : 50 Hz, 100 Hz, 500 Hz, 800 Hz; 1 KHz, 2 KHz, 5 KHz, 10 KHz. Measurement Voltage: 0.1 V – 1.0 V RMS adjustable under program control.
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Frame Grabbers
Grablink Series
The Grablink frame grabber controls the camera scanning rate based on the signals received from a motion encoder. When the parts move faster, the acquisition line rate of the camera increases. When the parts move slower, the acquisition line rate of the camera decreases.
